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Title: Multi-Modal Ptychography: Recent Developments and Applications

Authors:
 [1];  [2];  [1];  [3]
  1. Diamond Light Source Ltd., Didcot (United Kingdom)
  2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source
  3. Univ. College London (United Kingdom). London Centre for Nanotechnology; Brookhaven National Lab. (BNL), Upton, NY (United States). Dept. of Condensed Matter Physics and Materials Science
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States); Diamond Light Source Ltd., Didcot (United Kingdom); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Chemical Sciences, Geosciences, and Biosciences Division
OSTI Identifier:
1460693
Alternate Identifier(s):
OSTI ID: 1488749
Report Number(s):
BNL-207815-2018-JAAM
Journal ID: ISSN 2076-3417
Grant/Contract Number:  
SC0012704; FG02-11ER46831; AC02-05CH11231
Resource Type:
Accepted Manuscript
Journal Name:
Applied Sciences
Additional Journal Information:
Journal Volume: 8; Journal Issue: 7; Journal ID: ISSN 2076-3417
Publisher:
MDPI
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; X-ray diffraction; X-ray imaging; coherence; phase retrieval; X-ray ptychography

Citation Formats

Shi, Xiaowen, Burdet, Nicolas, Batey, Darren, and Robinson, Ian. Multi-Modal Ptychography: Recent Developments and Applications. United States: N. p., 2018. Web. doi:10.3390/app8071054.
Shi, Xiaowen, Burdet, Nicolas, Batey, Darren, & Robinson, Ian. Multi-Modal Ptychography: Recent Developments and Applications. United States. https://doi.org/10.3390/app8071054
Shi, Xiaowen, Burdet, Nicolas, Batey, Darren, and Robinson, Ian. Thu . "Multi-Modal Ptychography: Recent Developments and Applications". United States. https://doi.org/10.3390/app8071054. https://www.osti.gov/servlets/purl/1460693.
@article{osti_1460693,
title = {Multi-Modal Ptychography: Recent Developments and Applications},
author = {Shi, Xiaowen and Burdet, Nicolas and Batey, Darren and Robinson, Ian},
abstractNote = {},
doi = {10.3390/app8071054},
journal = {Applied Sciences},
number = 7,
volume = 8,
place = {United States},
year = {Thu Jun 28 00:00:00 EDT 2018},
month = {Thu Jun 28 00:00:00 EDT 2018}
}

Journal Article:
Free Publicly Available Full Text
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Cited by: 5 works
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Figures / Tables:

Figure 1. Figure 1.: The first three (n = 1, 2, 3) recovered probe modes for the cases of (a) a static sample; (b) a square wave with amplitudes 1 µm and (c) 1.5 µm; and (d) a sine wave with amplitudes 1 µm and (e) 1.5 µm. The bottom line alsomore » shows the square root of the summed intensity (rms, right column, linear scale) from five probe modes for the cases listed previously. The rms shows clearly how the probe forms can be manipulated using a vibrating sample. The scale bar is 1 µm. The vibration frequency is selected to be 1 Hz with exposure of 6 seconds per position.« less

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Works referencing / citing this record:

X-ray ptychography on low-dimensional hard-condensed matter materials
journal, March 2019

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Non-locally coded Fourier-transform ghost imaging
journal, January 2019


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