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Title: Thermal transitions in semi-crystalline polymer thin films studied via spectral reflectance

Herein we report the finding that spectral reflectance (SR) can be used to identify thermal transitions in semi-crystalline polymer thin films. By studying film thickness as a function of temperature, we found that semi-crystalline polymers exhibit characteristic expansion and contraction profiles during the melting (T m) and crystallization (T c) transitions, respectively. Prior to this discovery, studies on the crystalline T m in thin films have involved more expensive and complex techniques such as atomic force microscopy (AFM), ellipsometry, and grazing-incidence wide-angle X-ray scattering (GIWAXS). We correlate T m and T c as measured by SR with differential scanning calorimetry (DSC) in the bulk and temperature-controlled GIWAXS or AFM in thin films. We show that SR is accurate for measuring changes in films with thicknesses of 500 nm down to 21 nm and for detecting melting point depression due to thin film confinement. Furthermore, we demonstrate that SR is a powerful tool for measuring thermal transitions in semi-crystalline polymer films with single-degree resolution.
Authors:
ORCiD logo [1] ;  [2] ;  [3] ;  [3] ; ORCiD logo [1]
  1. Tulane Univ., New Orleans, LA (United States)
  2. Filmetrics Applications Lab., Fairport, NY (United States)
  3. Argonne National Lab. (ANL), Argonne, IL (United States)
Publication Date:
Grant/Contract Number:
AC02-06CH11357
Type:
Accepted Manuscript
Journal Name:
Polymer
Additional Journal Information:
Journal Volume: 143; Journal Issue: C; Journal ID: ISSN 0032-3861
Publisher:
Elsevier
Research Org:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org:
National Science Foundation (NSF); USDOE Office of Science (SC)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; Crystallization; Melting temperature; Spectral reflectance
OSTI Identifier:
1460091

Kelly, Giovanni M., Elman, James F., Jiang, Zhang, Strzalka, Joseph, and Albert, Julie N. L.. Thermal transitions in semi-crystalline polymer thin films studied via spectral reflectance. United States: N. p., Web. doi:10.1016/j.polymer.2018.04.017.
Kelly, Giovanni M., Elman, James F., Jiang, Zhang, Strzalka, Joseph, & Albert, Julie N. L.. Thermal transitions in semi-crystalline polymer thin films studied via spectral reflectance. United States. doi:10.1016/j.polymer.2018.04.017.
Kelly, Giovanni M., Elman, James F., Jiang, Zhang, Strzalka, Joseph, and Albert, Julie N. L.. 2018. "Thermal transitions in semi-crystalline polymer thin films studied via spectral reflectance". United States. doi:10.1016/j.polymer.2018.04.017. https://www.osti.gov/servlets/purl/1460091.
@article{osti_1460091,
title = {Thermal transitions in semi-crystalline polymer thin films studied via spectral reflectance},
author = {Kelly, Giovanni M. and Elman, James F. and Jiang, Zhang and Strzalka, Joseph and Albert, Julie N. L.},
abstractNote = {Herein we report the finding that spectral reflectance (SR) can be used to identify thermal transitions in semi-crystalline polymer thin films. By studying film thickness as a function of temperature, we found that semi-crystalline polymers exhibit characteristic expansion and contraction profiles during the melting (Tm) and crystallization (Tc) transitions, respectively. Prior to this discovery, studies on the crystalline Tm in thin films have involved more expensive and complex techniques such as atomic force microscopy (AFM), ellipsometry, and grazing-incidence wide-angle X-ray scattering (GIWAXS). We correlate Tm and Tc as measured by SR with differential scanning calorimetry (DSC) in the bulk and temperature-controlled GIWAXS or AFM in thin films. We show that SR is accurate for measuring changes in films with thicknesses of 500 nm down to 21 nm and for detecting melting point depression due to thin film confinement. Furthermore, we demonstrate that SR is a powerful tool for measuring thermal transitions in semi-crystalline polymer films with single-degree resolution.},
doi = {10.1016/j.polymer.2018.04.017},
journal = {Polymer},
number = C,
volume = 143,
place = {United States},
year = {2018},
month = {4}
}