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Title: Site-selective spectroscopy with depth resolution using resonant x-ray reflectometry

Abstract

Combining dissimilar transition metal oxides (TMOs) into artificial heterostructures enables to create electronic interface systems with new electronic properties that do not exist in bulk. A detailed understanding of how such interfaces can be used to tailor physical properties requires characterization techniques capable to yield interface sensitive spectroscopic information with monolayer resolution. In this regard resonant x-ray reflectivity (RXR) provides a unique experimental tool to achieve exactly this. It yields the element specific electronic depth profiles in a non-destructive manner. Here, using a YBa2Cu3O7-δ (YBCO) thin film, we demonstrate that RXR is further capable to deliver site selectivity. By applying a new analysis scheme to RXR, which takes the atomic structure of the material into account, together with information of the local charge anisotropy of the resonant ions, we obtained spectroscopic information from the different Cu sites (e.g., chain and plane) throughout the film profile. As a result, while most of the film behaves bulk-like, we observe that the Cu-chains at the surface show characteristics of electron doping, whereas the Cu-planes closest to the surface exhibit an orbital reconstruction similar to that observed at La1-xCaxMnO3/YBCO interfaces.

Authors:
ORCiD logo [1];  [2];  [3];  [4];  [5];  [1];  [1];  [1];  [1];  [6];  [7];  [4];  [8]
  1. Leibniz Institute for Solid State and Materials Research, Dresden (Germany)
  2. Univ. of British Columbia, Vancouver, BC (Canada); Max Planck Institute for Solid State Research, Stuttgart (Germany)
  3. Univ. of Arkansas, Fayetteville, AR (United States)
  4. Rutgers Univ., Piscataway, NJ (United States)
  5. Helmholtz-Zentrum Berlin fur Materialien und Energie, Berlin (Germany)
  6. Leibniz Institute for Solid State and Materials Research, Dresden (Germany); TU Dresden, Dresden (Germany)
  7. Argonne National Lab. (ANL), Argonne, IL (United States)
  8. TU Dresden, Dresden (Germany)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
German Research Foundation (DFG); USDOE
OSTI Identifier:
1460088
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Scientific Reports
Additional Journal Information:
Journal Volume: 7; Journal Issue: 1; Journal ID: ISSN 2045-2322
Publisher:
Nature Publishing Group
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Hamann-Borrero, J. E., Macke, S., Gray, B., Kareev, M., Schierle, E., Partzsch, S., Zwiebler, M., Treske, U., Koitzsch, A., Buchner, B., Freeland, J. W., Chakhalian, J., and Geck, J. Site-selective spectroscopy with depth resolution using resonant x-ray reflectometry. United States: N. p., 2017. Web. doi:10.1038/s41598-017-12642-7.
Hamann-Borrero, J. E., Macke, S., Gray, B., Kareev, M., Schierle, E., Partzsch, S., Zwiebler, M., Treske, U., Koitzsch, A., Buchner, B., Freeland, J. W., Chakhalian, J., & Geck, J. Site-selective spectroscopy with depth resolution using resonant x-ray reflectometry. United States. doi:10.1038/s41598-017-12642-7.
Hamann-Borrero, J. E., Macke, S., Gray, B., Kareev, M., Schierle, E., Partzsch, S., Zwiebler, M., Treske, U., Koitzsch, A., Buchner, B., Freeland, J. W., Chakhalian, J., and Geck, J. Mon . "Site-selective spectroscopy with depth resolution using resonant x-ray reflectometry". United States. doi:10.1038/s41598-017-12642-7. https://www.osti.gov/servlets/purl/1460088.
@article{osti_1460088,
title = {Site-selective spectroscopy with depth resolution using resonant x-ray reflectometry},
author = {Hamann-Borrero, J. E. and Macke, S. and Gray, B. and Kareev, M. and Schierle, E. and Partzsch, S. and Zwiebler, M. and Treske, U. and Koitzsch, A. and Buchner, B. and Freeland, J. W. and Chakhalian, J. and Geck, J.},
abstractNote = {Combining dissimilar transition metal oxides (TMOs) into artificial heterostructures enables to create electronic interface systems with new electronic properties that do not exist in bulk. A detailed understanding of how such interfaces can be used to tailor physical properties requires characterization techniques capable to yield interface sensitive spectroscopic information with monolayer resolution. In this regard resonant x-ray reflectivity (RXR) provides a unique experimental tool to achieve exactly this. It yields the element specific electronic depth profiles in a non-destructive manner. Here, using a YBa2Cu3O7-δ (YBCO) thin film, we demonstrate that RXR is further capable to deliver site selectivity. By applying a new analysis scheme to RXR, which takes the atomic structure of the material into account, together with information of the local charge anisotropy of the resonant ions, we obtained spectroscopic information from the different Cu sites (e.g., chain and plane) throughout the film profile. As a result, while most of the film behaves bulk-like, we observe that the Cu-chains at the surface show characteristics of electron doping, whereas the Cu-planes closest to the surface exhibit an orbital reconstruction similar to that observed at La1-xCaxMnO3/YBCO interfaces.},
doi = {10.1038/s41598-017-12642-7},
journal = {Scientific Reports},
number = 1,
volume = 7,
place = {United States},
year = {2017},
month = {10}
}

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    Works referencing / citing this record:

    Soft X-ray characterization of ion beam sputtered magnesium oxide (MgO) thin film
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