Simultaneous 8.2 keV phase-contrast imaging and 24.6 keV X-ray diffraction from shock-compressed matter at the LCLS
- SLAC National Accelerator Lab., Menlo Park, CA (United States); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
- SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Univ. of Oxford, Oxford (United Kingdom)
- Diamond Light Source Ltd., Didcot (United Kingdom)
- Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
- European XFEL GmbH, Schenefeld (Germany)
- Sorbonne Univ., Paris (France)
- Osaka Univ., Osaka (Japan)
- Helmholtz-Zentrum Dresden-Rossendorf, Dresden (Germany); Technische Univ. Dresden, Dresden (Germany)
- Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
- STFC, Rutherford Appleton Lab., Didcot (United Kingdom)
- SLAC National Accelerator Lab., Menlo Park, CA (United States); European XFEL GmbH, Schenefeld (Germany)
In this paper, we demonstrate simultaneous phase-contrast imaging (PCI) and X-ray diffraction from shock compressed matter at the Matter in Extreme Conditions endstation, at the Linac Coherent Light Source (LCLS). We utilize the chromaticity from compound refractive X-ray lenses to focus the 24.6 keV 3rd order undulator harmonic of the LCLS to a spot size of 5 μm on target to perform X-ray diffraction. Simultaneous PCI from the 8.2 keV fundamental X-ray beam is used to visualize and measure the transient properties of the shock wave over a 500 μm field of view. Furthermore, we demonstrate the ability to extend the reciprocal space measurements by 5 Å–1, relative to the fundamental X-ray energy, by utilizing X-ray diffraction from the 3rd harmonic of the LCLS.
- Research Organization:
- SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Fusion Energy Sciences (FES)
- Grant/Contract Number:
- SF00515; 05K13OD2; 12-PDOC-0011; EP/J017256/1; AC02-76SF00515; FWP100182
- OSTI ID:
- 1458529
- Alternate ID(s):
- OSTI ID: 1439909
- Journal Information:
- Applied Physics Letters, Vol. 112, Issue 22; ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
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