Accurate photonic waveguide characterization using an arrayed waveguide structure
Abstract
Measurement uncertainties in the techniques used to characterize loss in photonic waveguides becomes a significant issue as waveguide loss is reduced through improved fabrication technology. Typical loss measurement techniques involve environmentally unknown parameters such as facet reflectivity or varying coupling efficiencies, which directly contribute to the uncertainty of the measurement. We present a loss measurement technique, which takes advantage of the differential loss between multiple paths in an arrayed waveguide structure, in which we are able to gather statistics on propagation loss from several waveguides in a single measurement. This arrayed waveguide structure is characterized using a swept-wavelength interferometer, enabling the analysis of the arrayed waveguide transmission as a function of group delay between waveguides. Loss extraction is only dependent on the differential path length between arrayed waveguides and is therefore extracted independently from on and off-chip coupling efficiencies, which proves to be an accurate and reliable method of loss characterization. In conclusion, this method is applied to characterize the loss of the silicon photonic platform at Sandia Labs with an uncertainty of less than 0.06 dB/cm.
- Authors:
- Publication Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1457501
- Alternate Identifier(s):
- OSTI ID: 1459924
- Report Number(s):
- SAND-2018-6836J
Journal ID: ISSN 1094-4087; OPEXFF
- Grant/Contract Number:
- AC04-94AL85000
- Resource Type:
- Published Article
- Journal Name:
- Optics Express
- Additional Journal Information:
- Journal Name: Optics Express Journal Volume: 26 Journal Issue: 14; Journal ID: ISSN 1094-4087
- Publisher:
- Optical Society of America
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; interferometry; integrated optics devices; subsystem integration and techniques
Citation Formats
Gehl, Michael, Boynton, Nicholas, Dallo, Christina, Pomerene, Andrew, Starbuck, Andrew, Hood, Dana, Trotter, Douglas C., Lentine, Anthony, and DeRose, Christopher T. Accurate photonic waveguide characterization using an arrayed waveguide structure. United States: N. p., 2018.
Web. doi:10.1364/OE.26.018082.
Gehl, Michael, Boynton, Nicholas, Dallo, Christina, Pomerene, Andrew, Starbuck, Andrew, Hood, Dana, Trotter, Douglas C., Lentine, Anthony, & DeRose, Christopher T. Accurate photonic waveguide characterization using an arrayed waveguide structure. United States. doi:10.1364/OE.26.018082.
Gehl, Michael, Boynton, Nicholas, Dallo, Christina, Pomerene, Andrew, Starbuck, Andrew, Hood, Dana, Trotter, Douglas C., Lentine, Anthony, and DeRose, Christopher T. Wed .
"Accurate photonic waveguide characterization using an arrayed waveguide structure". United States. doi:10.1364/OE.26.018082.
@article{osti_1457501,
title = {Accurate photonic waveguide characterization using an arrayed waveguide structure},
author = {Gehl, Michael and Boynton, Nicholas and Dallo, Christina and Pomerene, Andrew and Starbuck, Andrew and Hood, Dana and Trotter, Douglas C. and Lentine, Anthony and DeRose, Christopher T.},
abstractNote = {Measurement uncertainties in the techniques used to characterize loss in photonic waveguides becomes a significant issue as waveguide loss is reduced through improved fabrication technology. Typical loss measurement techniques involve environmentally unknown parameters such as facet reflectivity or varying coupling efficiencies, which directly contribute to the uncertainty of the measurement. We present a loss measurement technique, which takes advantage of the differential loss between multiple paths in an arrayed waveguide structure, in which we are able to gather statistics on propagation loss from several waveguides in a single measurement. This arrayed waveguide structure is characterized using a swept-wavelength interferometer, enabling the analysis of the arrayed waveguide transmission as a function of group delay between waveguides. Loss extraction is only dependent on the differential path length between arrayed waveguides and is therefore extracted independently from on and off-chip coupling efficiencies, which proves to be an accurate and reliable method of loss characterization. In conclusion, this method is applied to characterize the loss of the silicon photonic platform at Sandia Labs with an uncertainty of less than 0.06 dB/cm.},
doi = {10.1364/OE.26.018082},
journal = {Optics Express},
number = 14,
volume = 26,
place = {United States},
year = {2018},
month = {6}
}
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DOI: 10.1364/OE.26.018082
DOI: 10.1364/OE.26.018082
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