Accurate photonic waveguide characterization using an arrayed waveguide structure
Abstract
Measurement uncertainties in the techniques used to characterize loss in photonic waveguides becomes a significant issue as waveguide loss is reduced through improved fabrication technology. Typical loss measurement techniques involve environmentally unknown parameters such as facet reflectivity or varying coupling efficiencies, which directly contribute to the uncertainty of the measurement. We present a loss measurement technique, which takes advantage of the differential loss between multiple paths in an arrayed waveguide structure, in which we are able to gather statistics on propagation loss from several waveguides in a single measurement. This arrayed waveguide structure is characterized using a swept-wavelength interferometer, enabling the analysis of the arrayed waveguide transmission as a function of group delay between waveguides. Loss extraction is only dependent on the differential path length between arrayed waveguides and is therefore extracted independently from on and off-chip coupling efficiencies, which proves to be an accurate and reliable method of loss characterization. In conclusion, this method is applied to characterize the loss of the silicon photonic platform at Sandia Labs with an uncertainty of less than 0.06 dB/cm.
- Authors:
- Publication Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1457501
- Alternate Identifier(s):
- OSTI ID: 1459924
- Report Number(s):
- SAND-2018-6836J
Journal ID: ISSN 1094-4087; OPEXFF
- Grant/Contract Number:
- AC04-94AL85000
- Resource Type:
- Published Article
- Journal Name:
- Optics Express
- Additional Journal Information:
- Journal Name: Optics Express Journal Volume: 26 Journal Issue: 14; Journal ID: ISSN 1094-4087
- Publisher:
- Optical Society of America
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; interferometry; integrated optics devices; subsystem integration and techniques
Citation Formats
Gehl, Michael, Boynton, Nicholas, Dallo, Christina, Pomerene, Andrew, Starbuck, Andrew, Hood, Dana, Trotter, Douglas C., Lentine, Anthony, and DeRose, Christopher T. Accurate photonic waveguide characterization using an arrayed waveguide structure. United States: N. p., 2018.
Web. doi:10.1364/OE.26.018082.
Gehl, Michael, Boynton, Nicholas, Dallo, Christina, Pomerene, Andrew, Starbuck, Andrew, Hood, Dana, Trotter, Douglas C., Lentine, Anthony, & DeRose, Christopher T. Accurate photonic waveguide characterization using an arrayed waveguide structure. United States. doi:10.1364/OE.26.018082.
Gehl, Michael, Boynton, Nicholas, Dallo, Christina, Pomerene, Andrew, Starbuck, Andrew, Hood, Dana, Trotter, Douglas C., Lentine, Anthony, and DeRose, Christopher T. Wed .
"Accurate photonic waveguide characterization using an arrayed waveguide structure". United States. doi:10.1364/OE.26.018082.
@article{osti_1457501,
title = {Accurate photonic waveguide characterization using an arrayed waveguide structure},
author = {Gehl, Michael and Boynton, Nicholas and Dallo, Christina and Pomerene, Andrew and Starbuck, Andrew and Hood, Dana and Trotter, Douglas C. and Lentine, Anthony and DeRose, Christopher T.},
abstractNote = {Measurement uncertainties in the techniques used to characterize loss in photonic waveguides becomes a significant issue as waveguide loss is reduced through improved fabrication technology. Typical loss measurement techniques involve environmentally unknown parameters such as facet reflectivity or varying coupling efficiencies, which directly contribute to the uncertainty of the measurement. We present a loss measurement technique, which takes advantage of the differential loss between multiple paths in an arrayed waveguide structure, in which we are able to gather statistics on propagation loss from several waveguides in a single measurement. This arrayed waveguide structure is characterized using a swept-wavelength interferometer, enabling the analysis of the arrayed waveguide transmission as a function of group delay between waveguides. Loss extraction is only dependent on the differential path length between arrayed waveguides and is therefore extracted independently from on and off-chip coupling efficiencies, which proves to be an accurate and reliable method of loss characterization. In conclusion, this method is applied to characterize the loss of the silicon photonic platform at Sandia Labs with an uncertainty of less than 0.06 dB/cm.},
doi = {10.1364/OE.26.018082},
journal = {Optics Express},
number = 14,
volume = 26,
place = {United States},
year = {2018},
month = {6}
}
DOI: 10.1364/OE.26.018082
Works referenced in this record:
Active phase correction of high resolution silicon photonic arrayed waveguide gratings
journal, January 2017
- Gehl, M.; Trotter, D.; Starbuck, A.
- Optics Express, Vol. 25, Issue 6
Modified Fabry-Perot interferometric method for waveguide loss measurement
journal, January 2008
- Taebi, Sareh; Khorasaninejad, Mohammadreza; Saini, Simarjeet Singh
- Applied Optics, Vol. 47, Issue 35
A theoretical analysis of scattering loss from planar optical waveguides
journal, October 1994
- Payne, F. P.; Lacey, J. P. R.
- Optical and Quantum Electronics, Vol. 26, Issue 10
Spectral Response of Low-Loss Optical Waveguides
journal, January 1972
- Keck, D. B.; Tynes, A. R.
- Applied Optics, Vol. 11, Issue 7
Process variation in silicon photonic devices
journal, January 2013
- Chen, Xi; Mohamed, Moustafa; Li, Zheng
- Applied Optics, Vol. 52, Issue 31
Coupling of modes analysis of resonant channel add-drop filters
journal, January 1999
- Manolatou, C.; Khan, M. J.; Fan, S.
- IEEE Journal of Quantum Electronics, Vol. 35, Issue 9
Effect of size and roughness on light transmission in a Si/SiO2 waveguide: Experiments and model
journal, September 2000
- Lee, Kevin K.; Lim, Desmond R.; Luan, Hsin-Chiao
- Applied Physics Letters, Vol. 77, Issue 11
Loss in low-finesse Ti:LiNbO3 optical waveguide resonators
journal, March 1985
- Regener, R.; Sohler, W.
- Applied Physics B Photophysics and Laser Chemistry, Vol. 36, Issue 3
Measuring mode propagation losses of integrated optical waveguides: a simple method
journal, January 1983
- Okamura, Yasuyuki; Yoshinaka, Shinji; Yamamoto, Sadahiko
- Applied Optics, Vol. 22, Issue 23
Exploiting CMOS Manufacturing to Reduce Tuning Requirements for Resonant Optical Devices
journal, June 2011
- Krishnamoorthy, Ashok V.
- IEEE Photonics Journal, Vol. 3, Issue 3
Modal coupling in traveling-wave resonators
journal, January 2002
- Kippenberg, T. J.; Spillane, S. M.; Vahala, K. J.
- Optics Letters, Vol. 27, Issue 19
A Robust Method for Characterization of Optical Waveguides and Couplers
journal, July 2016
- Tran, Minh A.; Komljenovic, Tin; Hulme, Jared C.
- IEEE Photonics Technology Letters, Vol. 28, Issue 14
Simple and accurate loss measurement technique for semiconductor optical waveguides
journal, January 1985
- Walker, R. G.
- Electronics Letters, Vol. 21, Issue 13
Electrooptical effects in silicon
journal, January 1987
- Soref, R.; Bennett, B.
- IEEE Journal of Quantum Electronics, Vol. 23, Issue 1
Measurement of very low‐loss silica on silicon waveguides with a ring resonator
journal, February 1991
- Adar, R.; Shani, Y.; Henry, C. H.
- Applied Physics Letters, Vol. 58, Issue 5
Method for characterization of Si waveguide propagation loss
journal, January 2013
- Moresco, Michele; Romagnoli, Marco; Boscolo, Stefano
- Optics Express, Vol. 21, Issue 5
Germanium-on-silicon waveguides operating at mid-infrared wavelengths up to 85 μm
journal, January 2017
- Nedeljkovic, Milos; Penades, Jordi Soler; Mittal, Vinita
- Optics Express, Vol. 25, Issue 22
Silicon photonics manufacturing
journal, January 2010
- Zortman, William A.; Trotter, Douglas C.; Watts, Michael R.
- Optics Express, Vol. 18, Issue 23