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Title: X-Ray Sum Frequency Diffraction for Direct Imaging of Ultrafast Electron Dynamics

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Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
Grant/Contract Number:  
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Name: Physical Review Letters Journal Volume: 120 Journal Issue: 24; Journal ID: ISSN 0031-9007
American Physical Society
Country of Publication:
United States

Citation Formats

Rouxel, Jérémy R., Kowalewski, Markus, Bennett, Kochise, and Mukamel, Shaul. X-Ray Sum Frequency Diffraction for Direct Imaging of Ultrafast Electron Dynamics. United States: N. p., 2018. Web. doi:10.1103/PhysRevLett.120.243902.
Rouxel, Jérémy R., Kowalewski, Markus, Bennett, Kochise, & Mukamel, Shaul. X-Ray Sum Frequency Diffraction for Direct Imaging of Ultrafast Electron Dynamics. United States. doi:10.1103/PhysRevLett.120.243902.
Rouxel, Jérémy R., Kowalewski, Markus, Bennett, Kochise, and Mukamel, Shaul. Tue . "X-Ray Sum Frequency Diffraction for Direct Imaging of Ultrafast Electron Dynamics". United States. doi:10.1103/PhysRevLett.120.243902.
title = {X-Ray Sum Frequency Diffraction for Direct Imaging of Ultrafast Electron Dynamics},
author = {Rouxel, Jérémy R. and Kowalewski, Markus and Bennett, Kochise and Mukamel, Shaul},
abstractNote = {},
doi = {10.1103/PhysRevLett.120.243902},
journal = {Physical Review Letters},
number = 24,
volume = 120,
place = {United States},
year = {2018},
month = {6}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1103/PhysRevLett.120.243902

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Cited by: 6 works
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