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Title: X-Ray Sum Frequency Diffraction for Direct Imaging of Ultrafast Electron Dynamics

Authors:
; ; ;
Publication Date:
Grant/Contract Number:
FG02-04ER15571
Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Name: Physical Review Letters Journal Volume: 120 Journal Issue: 24; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
OSTI Identifier:
1441256

Rouxel, Jérémy R., Kowalewski, Markus, Bennett, Kochise, and Mukamel, Shaul. X-Ray Sum Frequency Diffraction for Direct Imaging of Ultrafast Electron Dynamics. United States: N. p., Web. doi:10.1103/PhysRevLett.120.243902.
Rouxel, Jérémy R., Kowalewski, Markus, Bennett, Kochise, & Mukamel, Shaul. X-Ray Sum Frequency Diffraction for Direct Imaging of Ultrafast Electron Dynamics. United States. doi:10.1103/PhysRevLett.120.243902.
Rouxel, Jérémy R., Kowalewski, Markus, Bennett, Kochise, and Mukamel, Shaul. 2018. "X-Ray Sum Frequency Diffraction for Direct Imaging of Ultrafast Electron Dynamics". United States. doi:10.1103/PhysRevLett.120.243902.
@article{osti_1441256,
title = {X-Ray Sum Frequency Diffraction for Direct Imaging of Ultrafast Electron Dynamics},
author = {Rouxel, Jérémy R. and Kowalewski, Markus and Bennett, Kochise and Mukamel, Shaul},
abstractNote = {},
doi = {10.1103/PhysRevLett.120.243902},
journal = {Physical Review Letters},
number = 24,
volume = 120,
place = {United States},
year = {2018},
month = {6}
}

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Two-dimensional stimulated resonance Raman spectroscopy of molecules with broadband x-ray pulses
journal, May 2012
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