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Title: Xi-cam: a versatile interface for data visualization and analysis

Xi-cam is an extensible platform for data management, analysis and visualization.Xi-camaims to provide a flexible and extensible approach to synchrotron data treatment as a solution to rising demands for high-volume/high-throughput processing pipelines. The core ofXi-camis an extensible plugin-based graphical user interface platform which provides users with an interactive interface to processing algorithms. Plugins are available for SAXS/WAXS/GISAXS/GIWAXS, tomography and NEXAFS data. WithXi-cam's `advanced' mode, data processing steps are designed as a graph-based workflow, which can be executed live, locally or remotely. Remote execution utilizes high-performance computing or de-localized resources, allowing for the effective reduction of high-throughput data.Xi-cam's plugin-based architecture targets cross-facility and cross-technique collaborative development, in support of multi-modal analysis.Xi-camis open-source and cross-platform, and available for download on GitHub.
Authors:
ORCiD logo [1] ;  [2] ;  [1] ;  [1] ;  [2] ;  [2] ;  [1] ;  [3] ;  [1] ;  [4] ;  [1] ;  [2] ;  [5] ;  [3] ;  [1] ;  [1] ;  [6] ;  [2] ;  [6] ;  [1] more »;  [4] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [4] ;  [1] ;  [3] ;  [6] ;  [1] ;  [1] ; ORCiD logo [7] ;  [8] ;  [1] ;  [1] ; ORCiD logo [1] « less
  1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
  3. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
  4. SLAC National Accelerator Lab., Menlo Park, CA (United States). Stanford Synchrotron Radiation Lightsource (SSRL)
  5. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS); Northwestern Univ., Evanston, IL (United States). Dept. of Electrical Engineering and Computer Science
  6. National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)
  7. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  8. Brookhaven National Lab. (BNL), Upton, NY (United States). Center for Functional Nanomaterials (CFN)
Publication Date:
Report Number(s):
BNL-207812-2018-JAAM
Journal ID: ISSN 1600-5775; JSYRES; ark:/13030/qt4p50k8j7
Grant/Contract Number:
AC02-05CH11231; AC02-76SF00515; SC0012704; AC02-06CH11357; AC05-00OR22725
Type:
Accepted Manuscript
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 25; Journal Issue: 4; Journal ID: ISSN 1600-5775
Publisher:
International Union of Crystallography
Research Org:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Brookhaven National Lab. (BNL), Upton, NY (United States); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org:
USDOE Office of Science (SC), Advanced Scientific Computing Research (ASCR) (SC-21)
Country of Publication:
United States
Language:
English
Subject:
96 KNOWLEDGE MANAGEMENT AND PRESERVATION; 97 MATHEMATICS AND COMPUTING; scattering; tomography; NEXAFS; XAS; spectroscopy; SAXS; GISAXS; WAXS; GIWAXS; software
OSTI Identifier:
1440965
Alternate Identifier(s):
OSTI ID: 1460691; OSTI ID: 1474570

Pandolfi, Ronald J., Allan, Daniel B., Arenholz, Elke, Barroso-Luque, Luis, Campbell, Stuart I., Caswell, Thomas A., Blair, Austin, De Carlo, Francesco, Fackler, Sean, Fournier, Amanda P., Freychet, Guillaume, Fukuto, Masafumi, Gursoy, Doga, Jiang, Zhang, Krishnan, Harinarayan, Kumar, Dinesh, Kline, R. Joseph, Li, Ruipeng, Liman, Christopher, Marchesini, Stefano, Mehta, Apurva, N'Diaye, Alpha T., Parkinson, Dilworth Y., Parks, Holden, Pellouchoud, Lenson A., Perciano, Talita, Ren, Fang, Sahoo, Shreya, Strzalka, Joseph, Sunday, Daniel, Tassone, Christopher J., Ushizima, Daniela, Venkatakrishnan, Singanallur, Yager, Kevin G., Zwart, Peter, Sethian, James A., and Hexemer, Alexander. Xi-cam: a versatile interface for data visualization and analysis. United States: N. p., Web. doi:10.1107/S1600577518005787.
Pandolfi, Ronald J., Allan, Daniel B., Arenholz, Elke, Barroso-Luque, Luis, Campbell, Stuart I., Caswell, Thomas A., Blair, Austin, De Carlo, Francesco, Fackler, Sean, Fournier, Amanda P., Freychet, Guillaume, Fukuto, Masafumi, Gursoy, Doga, Jiang, Zhang, Krishnan, Harinarayan, Kumar, Dinesh, Kline, R. Joseph, Li, Ruipeng, Liman, Christopher, Marchesini, Stefano, Mehta, Apurva, N'Diaye, Alpha T., Parkinson, Dilworth Y., Parks, Holden, Pellouchoud, Lenson A., Perciano, Talita, Ren, Fang, Sahoo, Shreya, Strzalka, Joseph, Sunday, Daniel, Tassone, Christopher J., Ushizima, Daniela, Venkatakrishnan, Singanallur, Yager, Kevin G., Zwart, Peter, Sethian, James A., & Hexemer, Alexander. Xi-cam: a versatile interface for data visualization and analysis. United States. doi:10.1107/S1600577518005787.
Pandolfi, Ronald J., Allan, Daniel B., Arenholz, Elke, Barroso-Luque, Luis, Campbell, Stuart I., Caswell, Thomas A., Blair, Austin, De Carlo, Francesco, Fackler, Sean, Fournier, Amanda P., Freychet, Guillaume, Fukuto, Masafumi, Gursoy, Doga, Jiang, Zhang, Krishnan, Harinarayan, Kumar, Dinesh, Kline, R. Joseph, Li, Ruipeng, Liman, Christopher, Marchesini, Stefano, Mehta, Apurva, N'Diaye, Alpha T., Parkinson, Dilworth Y., Parks, Holden, Pellouchoud, Lenson A., Perciano, Talita, Ren, Fang, Sahoo, Shreya, Strzalka, Joseph, Sunday, Daniel, Tassone, Christopher J., Ushizima, Daniela, Venkatakrishnan, Singanallur, Yager, Kevin G., Zwart, Peter, Sethian, James A., and Hexemer, Alexander. 2018. "Xi-cam: a versatile interface for data visualization and analysis". United States. doi:10.1107/S1600577518005787.
@article{osti_1440965,
title = {Xi-cam: a versatile interface for data visualization and analysis},
author = {Pandolfi, Ronald J. and Allan, Daniel B. and Arenholz, Elke and Barroso-Luque, Luis and Campbell, Stuart I. and Caswell, Thomas A. and Blair, Austin and De Carlo, Francesco and Fackler, Sean and Fournier, Amanda P. and Freychet, Guillaume and Fukuto, Masafumi and Gursoy, Doga and Jiang, Zhang and Krishnan, Harinarayan and Kumar, Dinesh and Kline, R. Joseph and Li, Ruipeng and Liman, Christopher and Marchesini, Stefano and Mehta, Apurva and N'Diaye, Alpha T. and Parkinson, Dilworth Y. and Parks, Holden and Pellouchoud, Lenson A. and Perciano, Talita and Ren, Fang and Sahoo, Shreya and Strzalka, Joseph and Sunday, Daniel and Tassone, Christopher J. and Ushizima, Daniela and Venkatakrishnan, Singanallur and Yager, Kevin G. and Zwart, Peter and Sethian, James A. and Hexemer, Alexander},
abstractNote = {Xi-cam is an extensible platform for data management, analysis and visualization.Xi-camaims to provide a flexible and extensible approach to synchrotron data treatment as a solution to rising demands for high-volume/high-throughput processing pipelines. The core ofXi-camis an extensible plugin-based graphical user interface platform which provides users with an interactive interface to processing algorithms. Plugins are available for SAXS/WAXS/GISAXS/GIWAXS, tomography and NEXAFS data. WithXi-cam's `advanced' mode, data processing steps are designed as a graph-based workflow, which can be executed live, locally or remotely. Remote execution utilizes high-performance computing or de-localized resources, allowing for the effective reduction of high-throughput data.Xi-cam's plugin-based architecture targets cross-facility and cross-technique collaborative development, in support of multi-modal analysis.Xi-camis open-source and cross-platform, and available for download on GitHub.},
doi = {10.1107/S1600577518005787},
journal = {Journal of Synchrotron Radiation (Online)},
number = 4,
volume = 25,
place = {United States},
year = {2018},
month = {5}
}