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This content will become publicly available on June 6, 2019

Title: Hierarchical Domain Structure and Extremely Large Wall Current in Epitaxial BiFeO 3 Thin Films

Authors:
 [1] ;  [2] ;  [1] ;  [1] ;  [2] ;  [3] ;  [4] ; ORCiD logo [1]
  1. State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai 200433 China
  2. Department of Materials Science and Engineering, The Pennsylvania State University, University Park PA 16802 USA
  3. Department of Chemistry, St. Andrews University, KY16 9ST St. Andrews UK, Department of Physics, St. Andrews University, KY16 9ST St. Andrews UK
  4. Department of Materials Science and Engineering, Seoul National University, Seoul 151-744 Korea, Inter-University Semiconductor Research Center, Seoul National University, Seoul 151-744 Korea
Publication Date:
Grant/Contract Number:
FG02-07ER46417
Type:
Publisher's Accepted Manuscript
Journal Name:
Advanced Functional Materials
Additional Journal Information:
Journal Name: Advanced Functional Materials Journal Volume: 28 Journal Issue: 31; Journal ID: ISSN 1616-301X
Publisher:
Wiley Blackwell (John Wiley & Sons)
Sponsoring Org:
USDOE
Country of Publication:
Germany
Language:
English
OSTI Identifier:
1440787