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This content will become publicly available on January 25, 2019

Title: A compressed sensing X-ray camera with a multilayer architecture

Recent advances in compressed sensing theory and algorithms offer new possibilities for high-speed X-ray camera design. In many CMOS cameras, each pixel has an independent on-board circuit that includes an amplifier, noise rejection, signal shaper, an analog-to-digital converter (ADC), and optional in-pixel storage. When X-ray images are sparse, i.e., when one of the following cases is true: (a.) The number of pixels with true X-ray hits is much smaller than the total number of pixels; (b.) The X-ray information is redundant; or (c.) Some prior knowledge about the X-ray images exists, sparse sampling may be allowed. In this work, we first illustrate the feasibility of random on-board pixel sampling (ROPS) using an existing set of X-ray images, followed by a discussion about signal to noise as a function of pixel size. Next, we describe a possible circuit architecture to achieve random pixel access and in-pixel storage. The combination of a multilayer architecture, sparse on-chip sampling, and computational image techniques, is expected to facilitate the development and applications of high-speed X-ray camera technology.
Authors:
 [1] ;  [1] ;  [1] ;  [2] ;  [3] ;  [4] ;  [1] ;  [1] ;  [2] ;  [5]
  1. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
  2. Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States). Particle Physics Division
  3. Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
  4. Purdue Univ., West Lafayette, IN (United States)
  5. Univ. of Nevada, Las Vegas, NV (United States)
Publication Date:
Grant/Contract Number:
AC02-06CH11357; N00014-14-1-0628
Type:
Accepted Manuscript
Journal Name:
Journal of Instrumentation
Additional Journal Information:
Journal Volume: 13; Journal Issue: 01; Journal ID: ISSN 1748-0221
Publisher:
Institute of Physics (IOP)
Research Org:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS); Los Alamos National Lab. (LANL), Los Alamos, NM (United States); Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Sponsoring Org:
USDOE Office of Science (SC); US Department of the Navy, Office of Naval Research (ONR)
Country of Publication:
United States
Language:
English
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; 47 OTHER INSTRUMENTATION; Sparse signals; multilayer 2D detector architecture; Random pixel access, GaN Sensor
OSTI Identifier:
1439873