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Title: Imaging nanoscale spatial modulation of a relativistic electron beam with a MeV ultrafast electron microscope

Abstract

Here, an accelerator-based MeV ultrafast electron microscope (MUEM) has been proposed as a promising tool to the study structural dynamics at the nanometer spatial scale and the picosecond temporal scale. Here, we report experimental tests of a prototype MUEM where high quality images with nanoscale fine structures were recorded with a pulsed ~3 MeV picosecond electron beam. The temporal and spatial resolutions of the MUEM operating in the single-shot mode are about 4 ps (FWHM) and 100 nm (FWHM), corresponding to a temporal-spatial resolution of 4 × 10 –19 sm, about 2 orders of magnitude higher than that achieved with state-of-the-art single-shot keV UEM. Using this instrument, we offer the demonstration of visualizing the nanoscale periodic spatial modulation of an electron beam, which may be converted into longitudinal density modulation through emittance exchange to enable production of high-power coherent radiation at short wavelengths. Our results mark a great step towards single-shot nanometer-resolution MUEMs and compact intense x-ray sources that may have widespread applications in many areas of science.

Authors:
 [1];  [1]; ORCiD logo [1];  [1];  [1]; ORCiD logo [1];  [2];  [2];  [3];  [4]; ORCiD logo [5];  [6];  [1]
  1. Shanghai Jiao Tong Univ., Shanghai (China)
  2. Peking Univ., Beijing (China)
  3. Peking Univ., Beijing (China); Southern Univ. of Science and Technology, Shenzhen (China)
  4. ShanghaiTech Univ., Shanghai (China)
  5. Brookhaven National Lab. (BNL), Upton, NY (United States); Stony Brook Univ., Stony Brook, NY (United States)
  6. Shanghai Jiao Tong Univ., Shanghai (China); Tsung-Dao Lee Institute, Shanghai (China)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1439294
Report Number(s):
BNL-205702-2018-JAAM
Journal ID: ISSN 0003-6951; TRN: US1900595
Grant/Contract Number:  
SC0012704
Resource Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 112; Journal Issue: 11; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Lu, Chao, Jiang, Tao, Liu, Shengguang, Wang, Rui, Zhao, Lingrong, Zhu, Pengfei, Liu, Yaqi, Xu, Jun, Yu, Dapeng, Wan, Weishi, Zhu, Yimei, Xiang, Dao, and Zhang, Jie. Imaging nanoscale spatial modulation of a relativistic electron beam with a MeV ultrafast electron microscope. United States: N. p., 2018. Web. doi:10.1063/1.5023179.
Lu, Chao, Jiang, Tao, Liu, Shengguang, Wang, Rui, Zhao, Lingrong, Zhu, Pengfei, Liu, Yaqi, Xu, Jun, Yu, Dapeng, Wan, Weishi, Zhu, Yimei, Xiang, Dao, & Zhang, Jie. Imaging nanoscale spatial modulation of a relativistic electron beam with a MeV ultrafast electron microscope. United States. doi:10.1063/1.5023179.
Lu, Chao, Jiang, Tao, Liu, Shengguang, Wang, Rui, Zhao, Lingrong, Zhu, Pengfei, Liu, Yaqi, Xu, Jun, Yu, Dapeng, Wan, Weishi, Zhu, Yimei, Xiang, Dao, and Zhang, Jie. Mon . "Imaging nanoscale spatial modulation of a relativistic electron beam with a MeV ultrafast electron microscope". United States. doi:10.1063/1.5023179. https://www.osti.gov/servlets/purl/1439294.
@article{osti_1439294,
title = {Imaging nanoscale spatial modulation of a relativistic electron beam with a MeV ultrafast electron microscope},
author = {Lu, Chao and Jiang, Tao and Liu, Shengguang and Wang, Rui and Zhao, Lingrong and Zhu, Pengfei and Liu, Yaqi and Xu, Jun and Yu, Dapeng and Wan, Weishi and Zhu, Yimei and Xiang, Dao and Zhang, Jie},
abstractNote = {Here, an accelerator-based MeV ultrafast electron microscope (MUEM) has been proposed as a promising tool to the study structural dynamics at the nanometer spatial scale and the picosecond temporal scale. Here, we report experimental tests of a prototype MUEM where high quality images with nanoscale fine structures were recorded with a pulsed ~3 MeV picosecond electron beam. The temporal and spatial resolutions of the MUEM operating in the single-shot mode are about 4 ps (FWHM) and 100 nm (FWHM), corresponding to a temporal-spatial resolution of 4 × 10–19 sm, about 2 orders of magnitude higher than that achieved with state-of-the-art single-shot keV UEM. Using this instrument, we offer the demonstration of visualizing the nanoscale periodic spatial modulation of an electron beam, which may be converted into longitudinal density modulation through emittance exchange to enable production of high-power coherent radiation at short wavelengths. Our results mark a great step towards single-shot nanometer-resolution MUEMs and compact intense x-ray sources that may have widespread applications in many areas of science.},
doi = {10.1063/1.5023179},
journal = {Applied Physics Letters},
number = 11,
volume = 112,
place = {United States},
year = {2018},
month = {3}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Figures / Tables:

Figure 1 Figure 1: (a) Schematic of the prototype MeV UEM; (b) Magnetic field distribution of the solenoid lens (red line) and the representative rms transverse beam size evolution (blue line) from the electron source to the UEM detector. The elements identified in (a) and (b) are: (1) photocathode rf gun,(2) gunmore » solenoid lens, (3) collimator, (4) rf deflector, (5) UED detector,(6) electron energy spectrometer, (7) condenser lens, (8) sample, (9) objective aperture, (10) objective lens, (11) projection lens, (12) UEM detector. The inset (c) shows the beam size evolution and location of the sample and aperture in the objective lens.« less

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