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Title: Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray diffraction: Application to chromia-forming metallic alloys

Abstract

In oxidizing environments, the protection of metals and alloys against further oxidation at high temperature is provided by the oxide film itself. This protection is efficient only if the formed film adheres well to the metal (substrate), i.e., without microcracks and spalls induced by thermomechanical stresses. In this study, the residual stresses at both macroscopic and microscopic scales in the oxide film adhering to the substrate and over the damaged areas have been rigorously determined on the same samples for both techniques. Ni-30Cr and Fe-47Cr alloys have been oxidized together at 900 and 1000 °C, respectively, to create films with a thickness of a few microns. A multi-scale approach was adopted: macroscopic stress was determined by conventional X-ray diffraction and Raman spectroscopy, while microscopic residual stress mappings were performed over different types of bucklings using Raman micro-spectroscopy and synchrotron micro-diffraction. A very good agreement is found at macro- and microscales between the residual stress values obtained with both techniques, giving confidence on the reliability of the measurements. In addition, relevant structural information at the interface between the metallic substrate and the oxide layer was collected by micro-diffraction, a non-destructive technique that allows mapping through the oxide layer, and both themore » grain size and the crystallographic orientation of the supporting polycrystalline metal located either under a buckling or not were measured.« less

Authors:
 [1];  [1];  [2];  [3]; ORCiD logo [4];  [4];  [5];  [6];  [7];  [8]
  1. Univ. de La Rochelle (France)
  2. Institut Jean Lamour, CNRS-Université de Lorraine, Nancy, France
  3. LASMIS, CNRS-Université Technologique de Troyes, Troyes, France
  4. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  5. European Synchrotron Radiation Facility (ESRF), Grenoble (France)
  6. Univ. Grenoble Alpes (France)
  7. Synchrotron SOLEIL, Gif sur Yvette (France)
  8. CNRS-Université de Poitiers-ENSMA, Poitiers (France)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1439223
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 122; Journal Issue: 19; Related Information: © 2017 Author(s).; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Guerain, Mathieu, Grosseau-Poussard, Jean-Luc, Geandier, Guillaume, Panicaud, Benoit, Tamura, Nobumichi, Kunz, Martin, Dejoie, Catherine, Micha, Jean-Sebastien, Thiaudiere, Dominique, and Goudeau, Philippe. Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray diffraction: Application to chromia-forming metallic alloys. United States: N. p., 2017. Web. doi:10.1063/1.4990146.
Guerain, Mathieu, Grosseau-Poussard, Jean-Luc, Geandier, Guillaume, Panicaud, Benoit, Tamura, Nobumichi, Kunz, Martin, Dejoie, Catherine, Micha, Jean-Sebastien, Thiaudiere, Dominique, & Goudeau, Philippe. Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray diffraction: Application to chromia-forming metallic alloys. United States. doi:10.1063/1.4990146.
Guerain, Mathieu, Grosseau-Poussard, Jean-Luc, Geandier, Guillaume, Panicaud, Benoit, Tamura, Nobumichi, Kunz, Martin, Dejoie, Catherine, Micha, Jean-Sebastien, Thiaudiere, Dominique, and Goudeau, Philippe. Tue . "Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray diffraction: Application to chromia-forming metallic alloys". United States. doi:10.1063/1.4990146. https://www.osti.gov/servlets/purl/1439223.
@article{osti_1439223,
title = {Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray diffraction: Application to chromia-forming metallic alloys},
author = {Guerain, Mathieu and Grosseau-Poussard, Jean-Luc and Geandier, Guillaume and Panicaud, Benoit and Tamura, Nobumichi and Kunz, Martin and Dejoie, Catherine and Micha, Jean-Sebastien and Thiaudiere, Dominique and Goudeau, Philippe},
abstractNote = {In oxidizing environments, the protection of metals and alloys against further oxidation at high temperature is provided by the oxide film itself. This protection is efficient only if the formed film adheres well to the metal (substrate), i.e., without microcracks and spalls induced by thermomechanical stresses. In this study, the residual stresses at both macroscopic and microscopic scales in the oxide film adhering to the substrate and over the damaged areas have been rigorously determined on the same samples for both techniques. Ni-30Cr and Fe-47Cr alloys have been oxidized together at 900 and 1000 °C, respectively, to create films with a thickness of a few microns. A multi-scale approach was adopted: macroscopic stress was determined by conventional X-ray diffraction and Raman spectroscopy, while microscopic residual stress mappings were performed over different types of bucklings using Raman micro-spectroscopy and synchrotron micro-diffraction. A very good agreement is found at macro- and microscales between the residual stress values obtained with both techniques, giving confidence on the reliability of the measurements. In addition, relevant structural information at the interface between the metallic substrate and the oxide layer was collected by micro-diffraction, a non-destructive technique that allows mapping through the oxide layer, and both the grain size and the crystallographic orientation of the supporting polycrystalline metal located either under a buckling or not were measured.},
doi = {10.1063/1.4990146},
journal = {Journal of Applied Physics},
number = 19,
volume = 122,
place = {United States},
year = {2017},
month = {11}
}

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Figures / Tables:

TABLE I TABLE I: Residual stresses in chromium oxide as determined by different authors between 1986 and 2012 years using Raman spectroscopy or XRD.

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