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Title: Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray diffraction: Application to chromia-forming metallic alloys

Abstract

In oxidizing environments, the protection of metals and alloys against further oxidation at high temperature is provided by the oxide film itself. This protection is efficient only if the formed film adheres well to the metal (substrate), i.e., without microcracks and spalls induced by thermomechanical stresses. In this study, the residual stresses at both macroscopic and microscopic scales in the oxide film adhering to the substrate and over the damaged areas have been rigorously determined on the same samples for both techniques. Ni-30Cr and Fe-47Cr alloys have been oxidized together at 900 and 1000 °C, respectively, to create films with a thickness of a few microns. A multi-scale approach was adopted: macroscopic stress was determined by conventional X-ray diffraction and Raman spectroscopy, while microscopic residual stress mappings were performed over different types of bucklings using Raman micro-spectroscopy and synchrotron micro-diffraction. A very good agreement is found at macro- and microscales between the residual stress values obtained with both techniques, giving confidence on the reliability of the measurements. In addition, relevant structural information at the interface between the metallic substrate and the oxide layer was collected by micro-diffraction, a non-destructive technique that allows mapping through the oxide layer, and both themore » grain size and the crystallographic orientation of the supporting polycrystalline metal located either under a buckling or not were measured.« less

Authors:
 [1];  [1];  [2];  [3]; ORCiD logo [4];  [4];  [5];  [6];  [7];  [8]
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  1. Univ. de La Rochelle (France)
  2. Institut Jean Lamour, CNRS-Université de Lorraine, Nancy, France
  3. LASMIS, CNRS-Université Technologique de Troyes, Troyes, France
  4. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  5. European Synchrotron Radiation Facility (ESRF), Grenoble (France)
  6. Univ. Grenoble Alpes (France)
  7. Synchrotron SOLEIL, Gif sur Yvette (France)
  8. CNRS-Université de Poitiers-ENSMA, Poitiers (France)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1439223
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 122; Journal Issue: 19; Related Information: © 2017 Author(s).; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Guerain, Mathieu, Grosseau-Poussard, Jean-Luc, Geandier, Guillaume, Panicaud, Benoit, Tamura, Nobumichi, Kunz, Martin, Dejoie, Catherine, Micha, Jean-Sebastien, Thiaudiere, Dominique, and Goudeau, Philippe. Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray diffraction: Application to chromia-forming metallic alloys. United States: N. p., 2017. Web. doi:10.1063/1.4990146.
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Guerain, Mathieu, Grosseau-Poussard, Jean-Luc, Geandier, Guillaume, Panicaud, Benoit, Tamura, Nobumichi, Kunz, Martin, Dejoie, Catherine, Micha, Jean-Sebastien, Thiaudiere, Dominique, & Goudeau, Philippe. Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray diffraction: Application to chromia-forming metallic alloys. United States. https://doi.org/10.1063/1.4990146
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Guerain, Mathieu, Grosseau-Poussard, Jean-Luc, Geandier, Guillaume, Panicaud, Benoit, Tamura, Nobumichi, Kunz, Martin, Dejoie, Catherine, Micha, Jean-Sebastien, Thiaudiere, Dominique, and Goudeau, Philippe. Tue . "Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray diffraction: Application to chromia-forming metallic alloys". United States. https://doi.org/10.1063/1.4990146. https://www.osti.gov/servlets/purl/1439223.
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@article{osti_1439223,
title = {Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray diffraction: Application to chromia-forming metallic alloys},
author = {Guerain, Mathieu and Grosseau-Poussard, Jean-Luc and Geandier, Guillaume and Panicaud, Benoit and Tamura, Nobumichi and Kunz, Martin and Dejoie, Catherine and Micha, Jean-Sebastien and Thiaudiere, Dominique and Goudeau, Philippe},
abstractNote = {In oxidizing environments, the protection of metals and alloys against further oxidation at high temperature is provided by the oxide film itself. This protection is efficient only if the formed film adheres well to the metal (substrate), i.e., without microcracks and spalls induced by thermomechanical stresses. In this study, the residual stresses at both macroscopic and microscopic scales in the oxide film adhering to the substrate and over the damaged areas have been rigorously determined on the same samples for both techniques. Ni-30Cr and Fe-47Cr alloys have been oxidized together at 900 and 1000 °C, respectively, to create films with a thickness of a few microns. A multi-scale approach was adopted: macroscopic stress was determined by conventional X-ray diffraction and Raman spectroscopy, while microscopic residual stress mappings were performed over different types of bucklings using Raman micro-spectroscopy and synchrotron micro-diffraction. A very good agreement is found at macro- and microscales between the residual stress values obtained with both techniques, giving confidence on the reliability of the measurements. In addition, relevant structural information at the interface between the metallic substrate and the oxide layer was collected by micro-diffraction, a non-destructive technique that allows mapping through the oxide layer, and both the grain size and the crystallographic orientation of the supporting polycrystalline metal located either under a buckling or not were measured.},
doi = {10.1063/1.4990146},
journal = {Journal of Applied Physics},
number = 19,
volume = 122,
place = {United States},
year = {Tue Nov 21 00:00:00 EST 2017},
month = {Tue Nov 21 00:00:00 EST 2017}
}
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Journal Article:
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Publisher's Version of Record
https://doi.org/10.1063/1.4990146
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Cited by: 7 works
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Figures / Tables:

TABLE I TABLE I: Residual stresses in chromium oxide as determined by different authors between 1986 and 2012 years using Raman spectroscopy or XRD.
All figures and tables (14 total)
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Works referenced in this record:

A superbend X-ray microdiffraction beamline at the advanced light source
journal, October 2009

Limitations and Advantages of Raman Spectroscopy for the Determination of Oxidation Stresses
journal, January 2011

Mesoscale x-ray diffraction measurement of stress relaxation associated with buckling in compressed thin films
journal, July 2003

  • Goudeau, Philippe; Villain, Pascale; Tamura, Nobumichi
  • Applied Physics Letters, Vol. 83, Issue 1
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The elastic constants and distance dependence of the magnetic interactions of Cr2O3
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High-pressure study of Cr2O3 obtained by high-temperature oxidation by X-ray diffraction and Raman spectroscopy
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An investigation of oxidation internal stresses in nicr alloy by X-ray diffraction
journal, July 1986

Oxide Scale Stress Determination by Raman Spectroscopy Application to the NiCr/Cr2O3 System and Influence of Yttrium
journal, May 1998

Raman microprobe spectroscopy measurements of residual stress distribution along blisters in Cr2O3 thin films
journal, February 2010

Room temperature strains in Cr2O3 scales formed at elevated temperatures on Ni-25wt%Cr and y- and Al-doped Ni-25wt%Cr
journal, May 1991

Local stress determination in chromia-former thanks to micro-Raman spectroscopy: A way to investigate spontaneous delamination processes
journal, February 2013

  • Guerain, M.; Goudeau, P.; Panicaud, B.
  • Journal of Applied Physics, Vol. 113, Issue 6
  • DOI: 10.1063/1.4790308

Stress release phenomena in chromia scales formed on NiCr-30 alloys: Influence of metallurgical parameters
journal, November 2011

  • Guerain, M.; Goudeau, P.; Grosseau-Poussard, J. L.
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A new white beam x-ray microdiffraction setup on the BM32 beamline at the European Synchrotron Radiation Facility
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  • Ulrich, O.; Biquard, X.; Bleuet, P.
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Evaluation of stresses in NiNiO and CrCr2O3 during high temperature oxidation by in situ X-ray diffraction
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High temperature oxidation of Ni70Cr30 alloy: Determination of oxidation kinetics and stress evolution in chromia layers by Raman spectroscopy
journal, November 2006

  • Kemdehoundja, M.; Dinhut, J. F.; Grosseau-Poussard, J. L.
  • Materials Science and Engineering: A, Vol. 435-436
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Ex situ and in situ determination of stress distributions in chromium oxide films by raman microscopy
journal, January 1992

Determination of Stress Gradients in a Thermally Grown Oxide Layer Using X-Ray Diffraction
journal, October 1997

Stress release in α-Cr2O3 oxide thin films formed on Ni30-Cr and Fe47-Cr alloys
journal, September 2017

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    Figures / Tables found in this record:

    TABLE I (p. 5)table
    TABLE II (p. 5)table
    FIG. 1 (p. 6)figure
    FIG. 2 (p. 6)figure
    FIG. 3 (p. 6)figure
    TABLE III (p. 7)table
    TABLE IV (p. 7)table
    FIG. 4 (p. 8)figure
    TABLE V (p. 8)table
    FIG. 5 (p. 9)figure
    FIG. 6 (p. 9)figure
    FIG. 7 (p. 9)figure
    FIG. 8 (p. 10)figure
    FIG. 9 (p. 10)figure
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