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Title: Yielding of tantalum at strain rates up to 10 9 s –1

Here, we have used a 45 μJ laser pulse to accelerate the free surface of fine-grained tantalum films up to peak velocities of ~1.2 km s –1. The films had thicknesses of ~1–2 μm and in-plane grain widths of ~75–150 nm. Using ultrafast interferometry, we have measured the time history of the velocity of the surface at different spatial positions across the accelerated region. The initial part of the histories (assumed to correspond to the “elastic precursor” observed previously) exhibited measured strain rates of ~0.6 to ~3.2 × 10 9 s –1 and stresses of ~4 to ~22 GPa.
Authors:
 [1] ;  [1] ;  [1] ; ORCiD logo [1] ;  [1] ;  [1]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Publication Date:
Report Number(s):
LLNL-JRNL-690544
Journal ID: ISSN 0003-6951
Grant/Contract Number:
AC52-07NA27344; 12ERD042
Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 109; Journal Issue: 9; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Research Org:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
OSTI Identifier:
1438742
Alternate Identifier(s):
OSTI ID: 1420659

Crowhurst, Jonathan C., Armstrong, Michael R., Gates, Sean D., Zaug, Joseph M., Radousky, Harry B., and Teslich, Nick E.. Yielding of tantalum at strain rates up to 109 s–1. United States: N. p., Web. doi:10.1063/1.4960796.
Crowhurst, Jonathan C., Armstrong, Michael R., Gates, Sean D., Zaug, Joseph M., Radousky, Harry B., & Teslich, Nick E.. Yielding of tantalum at strain rates up to 109 s–1. United States. doi:10.1063/1.4960796.
Crowhurst, Jonathan C., Armstrong, Michael R., Gates, Sean D., Zaug, Joseph M., Radousky, Harry B., and Teslich, Nick E.. 2016. "Yielding of tantalum at strain rates up to 109 s–1". United States. doi:10.1063/1.4960796. https://www.osti.gov/servlets/purl/1438742.
@article{osti_1438742,
title = {Yielding of tantalum at strain rates up to 109 s–1},
author = {Crowhurst, Jonathan C. and Armstrong, Michael R. and Gates, Sean D. and Zaug, Joseph M. and Radousky, Harry B. and Teslich, Nick E.},
abstractNote = {Here, we have used a 45 μJ laser pulse to accelerate the free surface of fine-grained tantalum films up to peak velocities of ~1.2 km s–1. The films had thicknesses of ~1–2 μm and in-plane grain widths of ~75–150 nm. Using ultrafast interferometry, we have measured the time history of the velocity of the surface at different spatial positions across the accelerated region. The initial part of the histories (assumed to correspond to the “elastic precursor” observed previously) exhibited measured strain rates of ~0.6 to ~3.2 × 109 s–1 and stresses of ~4 to ~22 GPa.},
doi = {10.1063/1.4960796},
journal = {Applied Physics Letters},
number = 9,
volume = 109,
place = {United States},
year = {2016},
month = {8}
}

Works referenced in this record:

Analysis of shockless dynamic compression data on solids to multi-megabar pressures: Application to tantalum
journal, November 2014
  • Davis, Jean-Paul; Brown, Justin L.; Knudson, Marcus D.
  • Journal of Applied Physics, Vol. 116, Issue 20, Article No. 204903
  • DOI: 10.1063/1.4902863

Single-shot spectral interferometry with chirped pulses
journal, January 2001
  • Geindre, J.-P.; Audebert, P.; Rebibo, S.
  • Optics Letters, Vol. 26, Issue 20, p. 1612-1614
  • DOI: 10.1364/OL.26.001612