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This content will become publicly available on October 30, 2018

Title: Simplified model of pinhole imaging for quantifying systematic errors in image shape

In this paper, we examine systematic errors in x-ray imaging by pinhole optics for quantifying uncertainties in the measurement of convergence and asymmetry in inertial confinement fusion implosions. We present a quantitative model for the total resolution of a pinhole optic with an imaging detector that more effectively describes the effect of diffraction than models that treat geometry and diffraction as independent. This model can be used to predict loss of shape detail due to imaging across the transition from geometric to diffractive optics. We find that fractional error in observable shapes is proportional to the total resolution element we present and inversely proportional to the length scale of the asymmetry being observed. Finally, we have experimentally validated our results by imaging a single object with differently sized pinholes and with different magnifications.
 [1] ;  [1] ;  [1] ;  [2] ;  [1] ;  [1] ;  [1] ;  [1]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  2. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Publication Date:
Report Number(s):
Journal ID: ISSN 1559-128X
Grant/Contract Number:
Accepted Manuscript
Journal Name:
Applied Optics
Additional Journal Information:
Journal Volume: 56; Journal Issue: 31; Journal ID: ISSN 1559-128X
Optical Society of America
Research Org:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org:
Country of Publication:
United States
70 PLASMA PHYSICS AND FUSION TECHNOLOGY; imaging ultrafast phenomena; image analysis; plasmas; picosecond phenomena; x-ray imaging
OSTI Identifier:
Alternate Identifier(s):
OSTI ID: 1405057