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Title: Simplified model of pinhole imaging for quantifying systematic errors in image shape

Abstract

In this paper, we examine systematic errors in x-ray imaging by pinhole optics for quantifying uncertainties in the measurement of convergence and asymmetry in inertial confinement fusion implosions. We present a quantitative model for the total resolution of a pinhole optic with an imaging detector that more effectively describes the effect of diffraction than models that treat geometry and diffraction as independent. This model can be used to predict loss of shape detail due to imaging across the transition from geometric to diffractive optics. We find that fractional error in observable shapes is proportional to the total resolution element we present and inversely proportional to the length scale of the asymmetry being observed. Finally, we have experimentally validated our results by imaging a single object with differently sized pinholes and with different magnifications.

Authors:
 [1];  [1];  [1];  [2];  [1];  [1];  [1];  [1]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  2. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1438629
Alternate Identifier(s):
OSTI ID: 1405057
Report Number(s):
LLNL-JRNL-731989
Journal ID: ISSN 1559-128X
Grant/Contract Number:  
AC52-07NA27344
Resource Type:
Accepted Manuscript
Journal Name:
Applied Optics
Additional Journal Information:
Journal Volume: 56; Journal Issue: 31; Journal ID: ISSN 1559-128X
Publisher:
Optical Society of America
Country of Publication:
United States
Language:
English
Subject:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY; imaging ultrafast phenomena; image analysis; plasmas; picosecond phenomena; x-ray imaging

Citation Formats

Benedetti, Laura Robin, Izumi, N., Khan, S. F., Kyrala, G. A., Landen, O. L., Ma, T., Nagel, S. R., and Pak, A. Simplified model of pinhole imaging for quantifying systematic errors in image shape. United States: N. p., 2017. Web. doi:10.1364/AO.56.008719.
Benedetti, Laura Robin, Izumi, N., Khan, S. F., Kyrala, G. A., Landen, O. L., Ma, T., Nagel, S. R., & Pak, A. Simplified model of pinhole imaging for quantifying systematic errors in image shape. United States. doi:10.1364/AO.56.008719.
Benedetti, Laura Robin, Izumi, N., Khan, S. F., Kyrala, G. A., Landen, O. L., Ma, T., Nagel, S. R., and Pak, A. Mon . "Simplified model of pinhole imaging for quantifying systematic errors in image shape". United States. doi:10.1364/AO.56.008719. https://www.osti.gov/servlets/purl/1438629.
@article{osti_1438629,
title = {Simplified model of pinhole imaging for quantifying systematic errors in image shape},
author = {Benedetti, Laura Robin and Izumi, N. and Khan, S. F. and Kyrala, G. A. and Landen, O. L. and Ma, T. and Nagel, S. R. and Pak, A.},
abstractNote = {In this paper, we examine systematic errors in x-ray imaging by pinhole optics for quantifying uncertainties in the measurement of convergence and asymmetry in inertial confinement fusion implosions. We present a quantitative model for the total resolution of a pinhole optic with an imaging detector that more effectively describes the effect of diffraction than models that treat geometry and diffraction as independent. This model can be used to predict loss of shape detail due to imaging across the transition from geometric to diffractive optics. We find that fractional error in observable shapes is proportional to the total resolution element we present and inversely proportional to the length scale of the asymmetry being observed. Finally, we have experimentally validated our results by imaging a single object with differently sized pinholes and with different magnifications.},
doi = {10.1364/AO.56.008719},
journal = {Applied Optics},
number = 31,
volume = 56,
place = {United States},
year = {2017},
month = {10}
}

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