Noise propagation issues in Belle II pixel detector power cable

Journal Article · 26 April 2018 · Journal of Instrumentation

DOI: https://doi.org/10.1088/1748-0221/13/04/p04021 · OSTI ID:1438572

Iglesias, M. ^[1]; Arteche, F. ^[1]; Echeverria, I. ^[1]; Pradas, A. ^[1]; Rivetta, C. ^[2]; Moser, H. -G. ^[3]; Kiesling, C. ^[3]; Rummel, S. ^[4]; Arcega, F. J. ^[5]

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1. Technological Inst. of Aragon (ITAINNOVA), Zaragoza (Spain)
2. SLAC National Accelerator Lab., Menlo Park, CA (United States). Grid Intergration, Systems, and Mobility (GISMo) and Applied Energy Division
3. Max Planck Inst. for Physics, Munich (Germany)
4. Ludwig Maximilian Univ., Munich (Germany)
5. Univ. of Zaragoza (Spain). Dept. of Electric Engineering

The vertex detector used in the upgrade of High-Energy physics experiment Belle II includes DEPFET pixel detector (PXD) technology. In this complex topology the power supply units and the front-end electronics are connected through a PXD power cable bundle which may propagate the output noise from the power supplies to the vertex area. This article presents a study of the propagation of noise caused by power converters in the PXD cable bundle based on Multi-conductor Transmission Line (MTL) theory. The work exposes the effect of the complex cable topology and shield connections on the noise propagation, which has an impact on the requirements of the power supplies. This analysis is part of the electromagnetic compatibility based design focused on functional safety to define the shield connections and power supply specifications required to ensure the successful integration of the detector and, specifically, to achieve the designed performance of the front-end electronics.

• Research Organization: SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
• Sponsoring Organization: USDOE; Ministry of Economy, Industry and Competitiveness (Spain); DEPFET PXD Collaboration
• Grant/Contract Number: AC02-76SF00515; AC02-76CH03000; FPA2014-55295- C3-3-R
• OSTI ID: 1438572
• Journal Information: Journal of Instrumentation, Vol. 13, Issue 04; ISSN 1748-0221
• Publisher: Institute of Physics (IOP)Copyright Statement
• Country of Publication: United States
• Language: English