Noise propagation issues in Belle II pixel detector power cable

Iglesias, M.; Arteche, F.; Echeverria, I.; Pradas, A.; Rivetta, C.; Moser, H. -G.; Kiesling, C.; Rummel, S.; Arcega, F. J.

doi:10.1088/1748-0221/13/04/p04021

Title: Noise propagation issues in Belle II pixel detector power cable

Full Record
Other Related Research

Abstract

The vertex detector used in the upgrade of High-Energy physics experiment Belle II includes DEPFET pixel detector (PXD) technology. In this complex topology the power supply units and the front-end electronics are connected through a PXD power cable bundle which may propagate the output noise from the power supplies to the vertex area. This article presents a study of the propagation of noise caused by power converters in the PXD cable bundle based on Multi-conductor Transmission Line (MTL) theory. The work exposes the effect of the complex cable topology and shield connections on the noise propagation, which has an impact on the requirements of the power supplies. This analysis is part of the electromagnetic compatibility based design focused on functional safety to define the shield connections and power supply specifications required to ensure the successful integration of the detector and, specifically, to achieve the designed performance of the front-end electronics.

Authors:

Iglesias, M. ^[1]; Arteche, F. ^[1]; Echeverria, I. ^[1]; Pradas, A. ^[1]; Rivetta, C. ^[2]; Moser, H. -G. ^[3]; Kiesling, C. ^[3]; Rummel, S. ^[4]; Arcega, F. J. ^[5]

Technological Inst. of Aragon (ITAINNOVA), Zaragoza (Spain)
SLAC National Accelerator Lab., Menlo Park, CA (United States). Grid Intergration, Systems, and Mobility (GISMo) and Applied Energy Division
Max Planck Inst. for Physics, Munich (Germany)
Ludwig Maximilian Univ., Munich (Germany)
Univ. of Zaragoza (Spain). Dept. of Electric Engineering

Publication Date:: 2018-04-26

Research Org.:: SLAC National Accelerator Lab., Menlo Park, CA (United States)

Sponsoring Org.:: USDOE; Ministry of Economy, Industry and Competitiveness (Spain); DEPFET PXD Collaboration

OSTI Identifier:: 1438572

Grant/Contract Number:: AC02-76SF00515; AC02-76CH03000; FPA2014-55295- C3-3-R

Resource Type:: Accepted Manuscript

Journal Name:: Journal of Instrumentation

Additional Journal Information:: Journal Volume: 13; Journal Issue: 04; Journal ID: ISSN 1748-0221

Publisher:: Institute of Physics (IOP)

Country of Publication:: United States

Language:: English

Subject:: 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 42 ENGINEERING; Simulation methods and programs; Detector grounding; Performance of High Energy Physics Detectors; Front-end electronics for detector readout

Citation Formats


                    Iglesias, M., Arteche, F., Echeverria, I., Pradas, A., Rivetta, C., Moser, H. -G., Kiesling, C., Rummel, S., and Arcega, F. J. Noise propagation issues in Belle II pixel detector power cable.  United States: N. p., 2018. 
Web.  doi:10.1088/1748-0221/13/04/p04021.

Copy to clipboard


                    Iglesias, M., Arteche, F., Echeverria, I., Pradas, A., Rivetta, C., Moser, H. -G., Kiesling, C., Rummel, S., & Arcega, F. J. Noise propagation issues in Belle II pixel detector power cable.  United States.  https://doi.org/10.1088/1748-0221/13/04/p04021

Copy to clipboard


                    Iglesias, M., Arteche, F., Echeverria, I., Pradas, A., Rivetta, C., Moser, H. -G., Kiesling, C., Rummel, S., and Arcega, F. J. Thu .  
"Noise propagation issues in Belle II pixel detector power cable".  United States.  https://doi.org/10.1088/1748-0221/13/04/p04021.  https://www.osti.gov/servlets/purl/1438572.

Copy to clipboard


                    
@article{osti_1438572,

  title        = {Noise propagation issues in Belle II pixel detector power cable},

  author       = {Iglesias, M. and Arteche, F. and Echeverria, I. and Pradas, A. and Rivetta, C. and Moser, H. -G. and Kiesling, C. and Rummel, S. and Arcega, F. J.},

  abstractNote = {The vertex detector used in the upgrade of High-Energy physics experiment Belle II includes DEPFET pixel detector (PXD) technology. In this complex topology the power supply units and the front-end electronics are connected through a PXD power cable bundle which may propagate the output noise from the power supplies to the vertex area. This article presents a study of the propagation of noise caused by power converters in the PXD cable bundle based on Multi-conductor Transmission Line (MTL) theory. The work exposes the effect of the complex cable topology and shield connections on the noise propagation, which has an impact on the requirements of the power supplies. This analysis is part of the electromagnetic compatibility based design focused on functional safety to define the shield connections and power supply specifications required to ensure the successful integration of the detector and, specifically, to achieve the designed performance of the front-end electronics.},

  doi          = {10.1088/1748-0221/13/04/p04021},

  journal      = {Journal of Instrumentation},

  number       = 04,

  volume       = 13,

  place        = {United States},

  year         = {2018},

  month        = {4}

}

Copy to clipboard

Journal Article:

Free Publicly Available Full Text

Accepted Manuscript (DOE)

Publisher's Version of Record

https://doi.org/10.1088/1748-0221/13/04/p04021

Other availability

Search WorldCat to find libraries that may hold this journal

Save / Share:

Export Metadata

Save to My Library

Similar Records in DOE PAGES and OSTI.GOV collections:

The overvoltage protection module for the power supply system for the pixel detector at Belle II experiment at KEK

Conference Kapusta, P. ; Kisielewski, B.

In this paper the overvoltage protection modules (OVP) for the power supply (PS) system of the Belle II pixel detector (PXD) are described. The aim of the OVP is to protect the detector and associated electronics against overvoltage conditions. Most critical in the system are voltages supplying the front-end ASICs. The PXD detector consists of the DEPFET sensor modules with integrated chips like the Drain Current Digitizer, the Switcher and the Data Handling Processor. These chips, implemented in modern sub-micron technologies, are quite vulnerable to variations in the supply voltages. The PXD will be placed in the Belle II experimentmore »« less
A simulation model of front-end electronics for high-precision timing measurements with low-gain avalanche detectors

Journal Article Peña, C. ; Deptuch, G. ; Xie, S. ; ... - Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment

Here, we report simulation results of a study aiming to optimize parameters of a detector that uses low-gain avalanche detectors (LGAD) for high-precision timing measurements. The detector is assumed to be composed of a 50μm LGAD sensor coupled to front-end readout electronics which is used to measure the time of arrival of minimum ionizing particles. The simulation includes modeling of signal fluctuations in the LGAD sensor, variations of the analog bandwidth and signal-to-noise ratio (SNR) of the front-end electronics, time bin quantization, and radiation damage of the LGAD sensors. Two approaches to measure the timestamp are considered: leading edge andmore »« less
https://doi.org/10.1016/j.nima.2019.06.010

Full Text Available
High resolution DEPFET active pixel sensors for the Belle II experiment

Conference Kodys, P

The new Belle II experiment at the SuperKEKB collider at KEK was launched in 2009 as a general upgrade of the previous successful Belle experiment. Important improvements in the Belle II detector are additional two pixel layers forming the innermost part of the vertex detector. This paper gives a short overview of the expected impact of the two inner pixel layers on the performance of Belle II based on simulations and current experimental knowledge of the DEPFET pixel detectors. The focus is on the expected performance of the thinned DEPFET pixel sensors in Belle II in terms of spatial resolution.more »« less
https://doi.org/10.1109/ANIMMA.2011.6172845
Noise propagation effects in power supply distribution systems for high-energy physics experiments

Journal Article Arteche, F. ; Rivetta, C. ; Iglesias, M. ; ... - Journal of Instrumentation

High-energy physics experiments are supplied by thousands of power supply units placed in distant areas from the front-end electronics. The power supply units and the front-end electronics are connected through long power cables that propagate the output noise from the power supplies to the detector. Here, this paper addresses the effect of long cables on the noise propagation and the impact that those cables have on the conducted emission levels required for the power supplies and the selection of EMI filters for the front-end electronic low-voltage input. Lastly, this analysis is part of the electromagnetic compatibility based design focused onmore »« less
https://doi.org/10.1088/1748-0221/12/12/p12004

Full Text Available
Beam test results of a 16 ps timing system based on ultra-fast silicon detectors

Journal Article Cartiglia, N. ; Staiano, A. ; Sola, V. ; ... - Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment

In this paper we report on the timing resolution obtained in a beam test with pions of 180 GeV/c momentum at CERN for the first production of 45 μm thick Ultra-Fast Silicon Detectors (UFSD). UFSD are based on the Low- Gain Avalanche Detector (LGAD) design, employing n-on-p silicon sensors with internal charge multiplication due to the presence of a thin, low-resistivity diffusion layer below the junction. The UFSD used in this test had a pad area of 1.7 mm². The gain was measured to vary between 5 and 70 depending on the sensor bias voltage. The experimental setup included threemore »« less
Cited by 19
https://doi.org/10.1016/j.nima.2017.01.021

Similar Records