Advances in X-ray optics: From metrology characterization to wavefront sensing-based optimization of active optics

Cocco, Daniele; Idir, Mourad; Morton, Daniel; Raimondi, Lorenzo; Zangrando, Marco

doi:10.1016/j.nima.2018.03.026

Title: Advances in X-ray optics: From metrology characterization to wavefront sensing-based optimization of active optics

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Abstract

Experiments using high brightness X-rays are on the forefront of science due to the vast variety of knowledge they can provide. New Synchrotron Radiation (SR) and Free Electron Laser (FEL) light sources provide unique tools for advanced studies using X-rays. Top-level scientists from around the world are attracted to these beamlines to perform unprecedented experiments. High brightness, low emittance light sources allow beamline scientists the possibility to dream up cutting-edge experimental stations. X-ray optics play a key role in bringing the beam from the source to the experimental stations. This paper explores the recent developments in X-ray optics. It touches on simulations, diagnostics, metrology and adaptive optics, giving an overview of the role X-ray optics have played in the recent past. It will also touch on future developments for one of the most active field in the X-ray science.

Authors:

Cocco, Daniele ^[1]; Idir, Mourad ^[2]; Morton, Daniel ^[1]; Raimondi, Lorenzo ^[3]; Zangrando, Marco ^[4]

SLAC National Accelerator Lab., Menlo Park, CA (United States)
Brookhaven National Lab. (BNL), Upton, NY (United States)
Elettra-Sincrotrone Trieste SCpa, Trieste (Italy)
Elettra-Sincrotrone Trieste SCpa, Trieste (Italy); IOM-CNR, Trieste (Italy)

Publication Date:: Tue Mar 20 00:00:00 EDT 2018

Research Org.:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

OSTI Identifier:: 1438324

Alternate Identifier(s):: OSTI ID: 1691724

Report Number(s):: BNL-205685-2018-JAAM
Journal ID: ISSN 0168-9002; TRN: US1900417

Grant/Contract Number:: SC0012704; AC02-76SF00515

Resource Type:: Accepted Manuscript

Journal Name:: Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment

Additional Journal Information:: Journal Volume: 907; Journal ID: ISSN 0168-9002

Publisher:: Elsevier

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE; X-ray optics; Optical metrology; Active optics; Synchrotron optics; FEL optics; Wavefront propagation

Citation Formats


                    Cocco, Daniele, Idir, Mourad, Morton, Daniel, Raimondi, Lorenzo, and Zangrando, Marco. Advances in X-ray optics: From metrology characterization to wavefront sensing-based optimization of active optics.  United States: N. p., 2018. 
Web.  doi:10.1016/j.nima.2018.03.026.

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                    Cocco, Daniele, Idir, Mourad, Morton, Daniel, Raimondi, Lorenzo, & Zangrando, Marco. Advances in X-ray optics: From metrology characterization to wavefront sensing-based optimization of active optics.  United States.  https://doi.org/10.1016/j.nima.2018.03.026

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                    Cocco, Daniele, Idir, Mourad, Morton, Daniel, Raimondi, Lorenzo, and Zangrando, Marco. Tue .  
"Advances in X-ray optics: From metrology characterization to wavefront sensing-based optimization of active optics".  United States.  https://doi.org/10.1016/j.nima.2018.03.026.  https://www.osti.gov/servlets/purl/1438324.

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@article{osti_1438324,

  title        = {Advances in X-ray optics: From metrology characterization to wavefront sensing-based optimization of active optics},

  author       = {Cocco, Daniele and Idir, Mourad and Morton, Daniel and Raimondi, Lorenzo and Zangrando, Marco},

  abstractNote = {Experiments using high brightness X-rays are on the forefront of science due to the vast variety of knowledge they can provide. New Synchrotron Radiation (SR) and Free Electron Laser (FEL) light sources provide unique tools for advanced studies using X-rays. Top-level scientists from around the world are attracted to these beamlines to perform unprecedented experiments. High brightness, low emittance light sources allow beamline scientists the possibility to dream up cutting-edge experimental stations. X-ray optics play a key role in bringing the beam from the source to the experimental stations. This paper explores the recent developments in X-ray optics. It touches on simulations, diagnostics, metrology and adaptive optics, giving an overview of the role X-ray optics have played in the recent past. It will also touch on future developments for one of the most active field in the X-ray science.},

  doi          = {10.1016/j.nima.2018.03.026},

  journal      = {Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment},

  number       = ,

  volume       = 907,

  place        = {United States},

  year         = {Tue Mar 20 00:00:00 EDT 2018},

  month        = {Tue Mar 20 00:00:00 EDT 2018}

}

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