Maia Mapper: high definition XRF imaging in the lab

doi:10.1088/1748-0221/13/03/C03020

Title: Maia Mapper: high definition XRF imaging in the lab

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Abstract

Here, Maia Mapper is a laboratory μXRF mapping system for efficient elemental imaging of drill core sections serving minerals research and industrial applications. It targets intermediate spatial scales, with imaging of up to ~80 M pixels over a 500×150 mm² sample area. It brings together (i) the Maia detector and imaging system, with its large solid-angle, event-mode operation, millisecond pixel transit times in fly-scan mode and real-time spectral deconvolution and imaging, (ii) the high brightness MetalJet D2 liquid metal micro-focus X-ray source from Excillum, and (iii) an efficient XOS polycapillary lens with a flux gain ~15,900 at 21 keV into a ~32 μm focus, and (iv) a sample scanning stage engineered for standard drill-core sections. Count-rates up to ~3 M/s are observed on drill core samples with low dead-time up to ~1.5%. Automated scans are executed in sequence with display of deconvoluted element component images accumulated in real-time in the Maia detector. Application images on drill core and polished rock slabs illustrate Maia Mapper capabilities as part of the analytical workflow of the Advanced Resource Characterisation Facility, which spans spatial dimensions from ore deposit to atomic scales.

Authors:

Ryan, Chris G. ^[1]; Kirkham, R. ^[1]; Moorhead, G. F. ^[1]; Parry, D. ^[1]; Jensen, M. ^[1]; Faulks, A. ^[1]; Hogan, S. ^[1]; Dunn, P. A. ^[1]; Dodanwela, R. ^[1]; Fisher, L. A. ^[1]; Pearce, M. ^[1]; Siddons, David P. ^[2]; Kuczewski, A. ^[2]; Lundstrom, U. ^[3]; Trolliet, A. ^[3]; Gao, N. ^[4]

Commonwealth Scientific and Industrial Research Organisation, Clayton, VIC (Australia)
Brookhaven National Lab. (BNL), Upton, NY (United States)
Excillum AB, Kista (Sweden)
XOS, East Greenbush, NY (United States)

Publication Date:: 2018-03-13

Research Org.:: Brookhaven National Lab. (BNL), Upton, NY (United States)

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

OSTI Identifier:: 1438318

Report Number(s):: BNL-205677-2018-JAAM
Journal ID: ISSN 1748-0221

Grant/Contract Number:: SC0012704

Resource Type:: Accepted Manuscript

Journal Name:: Journal of Instrumentation

Additional Journal Information:: Journal Volume: 13; Journal Issue: 03; Journal ID: ISSN 1748-0221

Publisher:: Institute of Physics (IOP)

Country of Publication:: United States

Language:: English

Subject:: 47 OTHER INSTRUMENTATION; X-ray fluorescence (XRF) systems; X-ray detectors

Citation Formats


                    Ryan, Chris G., Kirkham, R., Moorhead, G. F., Parry, D., Jensen, M., Faulks, A., Hogan, S., Dunn, P. A., Dodanwela, R., Fisher, L. A., Pearce, M., Siddons, David P., Kuczewski, A., Lundstrom, U., Trolliet, A., and Gao, N. Maia Mapper: high definition XRF imaging in the lab.  United States: N. p., 2018. 
        Web.  doi:10.1088/1748-0221/13/03/C03020.

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                    Ryan, Chris G., Kirkham, R., Moorhead, G. F., Parry, D., Jensen, M., Faulks, A., Hogan, S., Dunn, P. A., Dodanwela, R., Fisher, L. A., Pearce, M., Siddons, David P., Kuczewski, A., Lundstrom, U., Trolliet, A., & Gao, N. Maia Mapper: high definition XRF imaging in the lab.  United States.  doi:10.1088/1748-0221/13/03/C03020.

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                    Ryan, Chris G., Kirkham, R., Moorhead, G. F., Parry, D., Jensen, M., Faulks, A., Hogan, S., Dunn, P. A., Dodanwela, R., Fisher, L. A., Pearce, M., Siddons, David P., Kuczewski, A., Lundstrom, U., Trolliet, A., and Gao, N. Tue .  
        "Maia Mapper: high definition XRF imaging in the lab".  United States.  doi:10.1088/1748-0221/13/03/C03020.  https://www.osti.gov/servlets/purl/1438318.

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@article{osti_1438318,

  title        = {Maia Mapper: high definition XRF imaging in the lab},

  author       = {Ryan, Chris G. and Kirkham, R. and Moorhead, G. F. and Parry, D. and Jensen, M. and Faulks, A. and Hogan, S. and Dunn, P. A. and Dodanwela, R. and Fisher, L. A. and Pearce, M. and Siddons, David P. and Kuczewski, A. and Lundstrom, U. and Trolliet, A. and Gao, N.},

  abstractNote = {Here, Maia Mapper is a laboratory μXRF mapping system for efficient elemental imaging of drill core sections serving minerals research and industrial applications. It targets intermediate spatial scales, with imaging of up to ~80 M pixels over a 500×150 mm2 sample area. It brings together (i) the Maia detector and imaging system, with its large solid-angle, event-mode operation, millisecond pixel transit times in fly-scan mode and real-time spectral deconvolution and imaging, (ii) the high brightness MetalJet D2 liquid metal micro-focus X-ray source from Excillum, and (iii) an efficient XOS polycapillary lens with a flux gain ~15,900 at 21 keV into a ~32 μm focus, and (iv) a sample scanning stage engineered for standard drill-core sections. Count-rates up to ~3 M/s are observed on drill core samples with low dead-time up to ~1.5%. Automated scans are executed in sequence with display of deconvoluted element component images accumulated in real-time in the Maia detector. Application images on drill core and polished rock slabs illustrate Maia Mapper capabilities as part of the analytical workflow of the Advanced Resource Characterisation Facility, which spans spatial dimensions from ore deposit to atomic scales.},

  doi          = {10.1088/1748-0221/13/03/C03020},

  journal      = {Journal of Instrumentation},

  number       = 03,

  volume       = 13,

  place        = {United States},

  year         = {2018},

  month        = {3}

}

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DOI: 10.1088/1748-0221/13/03/C03020

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