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  • Accepted Manuscript: Maia Mapper: high definition XRF imaging in the lab

Title: Maia Mapper: high definition XRF imaging in the lab

Here, Maia Mapper is a laboratory μXRF mapping system for efficient elemental imaging of drill core sections serving minerals research and industrial applications. It targets intermediate spatial scales, with imaging of up to ~80 M pixels over a 500×150 mm 2 sample area. It brings together (i) the Maia detector and imaging system, with its large solid-angle, event-mode operation, millisecond pixel transit times in fly-scan mode and real-time spectral deconvolution and imaging, (ii) the high brightness MetalJet D2 liquid metal micro-focus X-ray source from Excillum, and (iii) an efficient XOS polycapillary lens with a flux gain ~15,900 at 21 keV into a ~32 μm focus, and (iv) a sample scanning stage engineered for standard drill-core sections. Count-rates up to ~3 M/s are observed on drill core samples with low dead-time up to ~1.5%. Automated scans are executed in sequence with display of deconvoluted element component images accumulated in real-time in the Maia detector. Application images on drill core and polished rock slabs illustrate Maia Mapper capabilities as part of the analytical workflow of the Advanced Resource Characterisation Facility, which spans spatial dimensions from ore deposit to atomic scales.
Authors:
 [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [2] ;  [2] ;  [3] ;  [3] ;  [4]
+ Show Author Affiliations
  1. Commonwealth Scientific and Industrial Research Organisation, Clayton, VIC (Australia)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States)
  3. Excillum AB, Kista (Sweden)
  4. XOS, East Greenbush, NY (United States)
Publication Date:
Report Number(s):
BNL-205677-2018-JAAM
Journal ID: ISSN 1748-0221
Grant/Contract Number:
SC0012704
Type:
Accepted Manuscript
Journal Name:
Journal of Instrumentation
Additional Journal Information:
Journal Volume: 13; Journal Issue: 03; Journal ID: ISSN 1748-0221
Publisher:
Institute of Physics (IOP)
Research Org:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; X-ray fluorescence (XRF) systems; X-ray detectors
OSTI Identifier:
1438318