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This content will become publicly available on April 24, 2019

Title: Si Oxidation and H 2 Gassing During Aqueous Slurry Preparation for Li-Ion Battery Anodes

Si has the possibility to greatly increase the energy density of Li-ion battery anodes, though it is not without its problems. One issue often overlooked is the decomposition of Si during large scale slurry formulation and battery fabrication. Here, we investigate the mechanism of H 2 production to understand the role of different slurry components and their impact on the Si oxidation and surface chemistry. Mass spectrometry and in situ pressure monitoring identifies that carbon black plays a major role in promoting the oxidation of Si and generation of H 2. Si oxidation also occurs through atmospheric O 2 consumption. Both pathways, along with solvent choice, impact the surface silanol chemistry, as analyzed by 1H– 29Si cross-polarization magic angle spinning nuclear magnetic resonance (MAS NMR) and attenuated total reflectance Fourier transform infrared spectroscopy (ATR FTIR). An understanding of the oxidation of Si, during slurry processing, provides a pathway toward improving the manufacturing of Si based anodes by maximizing its capacity and minimizing safety hazards.
ORCiD logo [1] ;  [2] ; ORCiD logo [1] ; ORCiD logo [1] ; ORCiD logo [3]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Energy and Transportation Science Division
  2. Argonne National Lab. (ANL), Argonne, IL (United States). Chemical Sciences and Engineering Division
  3. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Materials Science & Technology Division
Publication Date:
Grant/Contract Number:
Accepted Manuscript
Journal Name:
Journal of Physical Chemistry. C
Additional Journal Information:
Journal Volume: 122; Journal Issue: 18; Journal ID: ISSN 1932-7447
American Chemical Society
Research Org:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Vehicle Technologies Office (EE-3V)
Country of Publication:
United States
OSTI Identifier: