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Title: Random anion distribution in MSxSe2-x(M = Mo, W) crystals and nanosheets

Abstract

The group VIb dichalcogenides (MX2, M = Mo, W; X= S, Se) have a layered molybdenite structure in which M atoms are coordinated by a trigonal prism of X atoms. Ternary solid solutions of MSxSe2–x were synthesized, microcrystals were grown by chemical vapor transport, and their morphologies and structures were characterized by using synchrotron X-ray diffraction, Rietveld refinement, DIFFaX simulation of structural disorder, scanning electron microscopy, and energy dispersive X-ray spectroscopy. Double aberration corrected scanning transmission electron microscopy was used to determine the anion distributions in single-layer nanosheets exfoliated from the microcrystals. These experiments indicate that the size difference between S and Se atoms does not result in phase separation, consistent with earlier studies of MX2 monolayer sheets grown by chemical vapor deposition. However, stacking faults occur in microcrystals along the layering axis, particularly in sulfur-rich compositions of MSxSe2–x solid solutions.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]; ORCiD logo [1]
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  1. Pennsylvania State Univ., University Park, PA (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
US Army Research Office (ARO); National Science Foundation (NSF); Japan Society for the Promotion of Science (JSPS); Murata Science Foundation
OSTI Identifier:
1436786
Grant/Contract Number:  
W911NF-11-1-0362; DMR-1420620; 16H06793
Resource Type:
Accepted Manuscript
Journal Name:
RSC Advances
Additional Journal Information:
Journal Volume: 8; Journal Issue: 18; Journal ID: ISSN 2046-2069
Publisher:
Royal Society of Chemistry
Country of Publication:
United States
Language:
ENGLISH
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

Citation Formats

Nguyen, Minh An T., Gupta, Arnab Sen, Shevrin, Jacob, Akamatsu, Hirofumi, Xu, Pengtao, Lin, Zhong, Wang, Ke, Zhu, Jun, Gopalan, Venkatraman, Terrones, Mauricio, and Mallouk, Thomas E. Random anion distribution in MSxSe2-x(M = Mo, W) crystals and nanosheets. United States: N. p., 2018. Web. doi:10.1039/C8RA01497C.
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Nguyen, Minh An T., Gupta, Arnab Sen, Shevrin, Jacob, Akamatsu, Hirofumi, Xu, Pengtao, Lin, Zhong, Wang, Ke, Zhu, Jun, Gopalan, Venkatraman, Terrones, Mauricio, & Mallouk, Thomas E. Random anion distribution in MSxSe2-x(M = Mo, W) crystals and nanosheets. United States. https://doi.org/10.1039/C8RA01497C
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Nguyen, Minh An T., Gupta, Arnab Sen, Shevrin, Jacob, Akamatsu, Hirofumi, Xu, Pengtao, Lin, Zhong, Wang, Ke, Zhu, Jun, Gopalan, Venkatraman, Terrones, Mauricio, and Mallouk, Thomas E. Fri . "Random anion distribution in MSxSe2-x(M = Mo, W) crystals and nanosheets". United States. https://doi.org/10.1039/C8RA01497C. https://www.osti.gov/servlets/purl/1436786.
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@article{osti_1436786,
title = {Random anion distribution in MSxSe2-x(M = Mo, W) crystals and nanosheets},
author = {Nguyen, Minh An T. and Gupta, Arnab Sen and Shevrin, Jacob and Akamatsu, Hirofumi and Xu, Pengtao and Lin, Zhong and Wang, Ke and Zhu, Jun and Gopalan, Venkatraman and Terrones, Mauricio and Mallouk, Thomas E.},
abstractNote = {The group VIb dichalcogenides (MX2, M = Mo, W; X= S, Se) have a layered molybdenite structure in which M atoms are coordinated by a trigonal prism of X atoms. Ternary solid solutions of MSxSe2–x were synthesized, microcrystals were grown by chemical vapor transport, and their morphologies and structures were characterized by using synchrotron X-ray diffraction, Rietveld refinement, DIFFaX simulation of structural disorder, scanning electron microscopy, and energy dispersive X-ray spectroscopy. Double aberration corrected scanning transmission electron microscopy was used to determine the anion distributions in single-layer nanosheets exfoliated from the microcrystals. These experiments indicate that the size difference between S and Se atoms does not result in phase separation, consistent with earlier studies of MX2 monolayer sheets grown by chemical vapor deposition. However, stacking faults occur in microcrystals along the layering axis, particularly in sulfur-rich compositions of MSxSe2–x solid solutions.},
doi = {10.1039/C8RA01497C},
journal = {RSC Advances},
number = 18,
volume = 8,
place = {United States},
year = {Fri Mar 09 00:00:00 EST 2018},
month = {Fri Mar 09 00:00:00 EST 2018}
}
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https://doi.org/10.1039/C8RA01497C
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