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Title: Modeling emission lag after photoexcitation

Abstract

A theoretical model of delayed emission following photoexcitation from metals and semiconductors is given. Its numerical implementation is designed for beam optics codes used to model photocathodes in rf photoinjectors. The model extends the Moments approach for predicting photocurrent and mean transverse energy as moments of an emitted electron distribution by incorporating time of flight and scattering events that result in emission delay on a sub-picosecond level. The model accounts for a dynamic surface extraction field and changes in the energy distribution and time of emission as a consequence of the laser penetration depth and multiple scattering events during transport. Usage in the Particle-in-Cell code MICHELLE to predict the bunch shape and duration with or without laser jitter is given. The consequences of delayed emission effects for ultra-short pulses are discussed.

Authors:
ORCiD logo [1];  [2];  [2];  [3];  [4];  [1]
+ Show Author Affiliations
  1. Naval Research Lab. (NRL), Washington, DC (United States)
  2. Leidos, Billerica, MA (United States)
  3. Gnosys Systems, Inc., Providence, RI (United States)
  4. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Publication Date:
Research Org.:
Gnosys Systems, Inc., Providence, RI (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1436566
Alternate Identifier(s):
OSTI ID: 1402113
Grant/Contract Number:  
SC0013246
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 122; Journal Issue: 16; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Jensen, Kevin L., Petillo, John J., Ovtchinnikov, Serguei, Panagos, Dimitrios N., Moody, Nathan A., and Lambrakos, Samuel G.. Modeling emission lag after photoexcitation. United States: N. p., 2017. Web. doi:10.1063/1.5008366.
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Jensen, Kevin L., Petillo, John J., Ovtchinnikov, Serguei, Panagos, Dimitrios N., Moody, Nathan A., & Lambrakos, Samuel G.. Modeling emission lag after photoexcitation. United States. https://doi.org/10.1063/1.5008366
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Jensen, Kevin L., Petillo, John J., Ovtchinnikov, Serguei, Panagos, Dimitrios N., Moody, Nathan A., and Lambrakos, Samuel G.. Sat . "Modeling emission lag after photoexcitation". United States. https://doi.org/10.1063/1.5008366. https://www.osti.gov/servlets/purl/1436566.
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@article{osti_1436566,
title = {Modeling emission lag after photoexcitation},
author = {Jensen, Kevin L. and Petillo, John J. and Ovtchinnikov, Serguei and Panagos, Dimitrios N. and Moody, Nathan A. and Lambrakos, Samuel G.},
abstractNote = {A theoretical model of delayed emission following photoexcitation from metals and semiconductors is given. Its numerical implementation is designed for beam optics codes used to model photocathodes in rf photoinjectors. The model extends the Moments approach for predicting photocurrent and mean transverse energy as moments of an emitted electron distribution by incorporating time of flight and scattering events that result in emission delay on a sub-picosecond level. The model accounts for a dynamic surface extraction field and changes in the energy distribution and time of emission as a consequence of the laser penetration depth and multiple scattering events during transport. Usage in the Particle-in-Cell code MICHELLE to predict the bunch shape and duration with or without laser jitter is given. The consequences of delayed emission effects for ultra-short pulses are discussed.},
doi = {10.1063/1.5008366},
journal = {Journal of Applied Physics},
number = 16,
volume = 122,
place = {United States},
year = {2017},
month = {10}
}
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https://doi.org/10.1063/1.5008366
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Cited by: 12 works
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Works referenced in this record:

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    Works referencing / citing this record:

    A photoemission moments model using density functional and transfer matrix methods applied to coating layers on surfaces: Theory
    journal, January 2018

    • Jensen, Kevin L.; Finkenstadt, Daniel; Shabaev, Andrew
    • Journal of Applied Physics, Vol. 123, Issue 4
    • DOI: 10.1063/1.5008600

    Analytical models of transmission probabilities for electron sources
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    • Jensen, Kevin L.; Finkenstadt, Daniel; Shiffler, Donald A.
    • Journal of Applied Physics, Vol. 123, Issue 6
    • DOI: 10.1063/1.5018602

    Monte Carlo simulation of III-nitride photocathodes
    journal, March 2018

    • Marini, Jonathan; Bell, L. D.; Shahedipour-Sandvik, F.
    • Journal of Applied Physics, Vol. 123, Issue 12
    • DOI: 10.1063/1.5022200

    Analytic Wigner distribution function for tunneling and trajectory models
    journal, March 2019

    • Jensen, K. L.; Shiffler, D. A.; Lebowitz, J. L.
    • Journal of Applied Physics, Vol. 125, Issue 11
    • DOI: 10.1063/1.5086434

    Thermal-field and photoemission from meso- and micro-scale features: Effects of screening and roughness on characterization and simulation
    journal, June 2019

    • Jensen, Kevin L.; McDonald, Michael; Chubenko, Oksana
    • Journal of Applied Physics, Vol. 125, Issue 23
    • DOI: 10.1063/1.5097149

    Analytic Wigner distribution function for a split potential well
    journal, October 2019

    • Jensen, K. L.; Shiffler, D. A.; Riga, J. M.
    • Journal of Applied Physics, Vol. 126, Issue 14
    • DOI: 10.1063/1.5110406
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