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Title: Demonstration of transmission high energy electron microscopy

Abstract

High energy electrons have been used to investigate an extension of transmission electron microscopy. This technique, transmission high energy electron microscopy (THEEM), provides two additional capabilities to electron microscopy. First, high energy electrons are more penetrating than low energy electrons, and thus, they are able to image through thicker samples. Second, the accelerating mode of a radio-frequency linear accelerator provides fast exposures, down to 1 ps, which are ideal for flash radiography, making THEEM well suited to study the evolution of fast material processes under dynamic conditions. Lastly, initial investigations with static objects and during material processing have been performed to investigate the capabilities of this technique.

Authors:
ORCiD logo [1]; ORCiD logo [1];  [1];  [1]; ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [1];  [1]; ORCiD logo [1]; ORCiD logo [1];  [1];  [2];  [2];  [2];  [3];  [4]; ORCiD logo [5]
  1. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
  2. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  3. Argonne National Lab. (ANL), Argonne, IL (United States)
  4. Colorado School of Mines, Golden, CO (United States)
  5. IMDEA Materials Inst., Madrid (Spain)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States); Los Alamos National Lab. (LANL), Los Alamos, NM (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22) Materials Science & Engineering Division; USDOE Laboratory Directed Research and Development (LDRD) Program
OSTI Identifier:
1436077
Alternate Identifier(s):
OSTI ID: 1432091; OSTI ID: 1461398
Report Number(s):
LA-UR-17-29536
Journal ID: ISSN 0003-6951; TRN: US1900123
Grant/Contract Number:  
AC02-76SF00515; AC52-06NA25396; SC0016061
Resource Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 112; Journal Issue: 14; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; materials processing; photochemistry; transition metals; electron microscopy; radiography; medical imaging; optical devices; electromagnetic radiation; linear accelerators

Citation Formats

Merrill, Frank Edward, Goett, III, John Jerome, Gibbs, J. W., Imhoff, S. D., Mariam, Fesseha Gebre, Morris, C. L., Neukirch, Levi Patrick, Perry, John Oliver, Poulson, Daniel Cris, Simpson, Raspberry, Volegov, Petr Lvovich, Walstrom, Peter Lowell, Wilde, Carl Huerstel, Hast, C., Jobe, K., Smith, T., Wienands, U., Clarke, A. J., and Tourret, D. Demonstration of transmission high energy electron microscopy. United States: N. p., 2018. Web. doi:10.1063/1.5011198.
Merrill, Frank Edward, Goett, III, John Jerome, Gibbs, J. W., Imhoff, S. D., Mariam, Fesseha Gebre, Morris, C. L., Neukirch, Levi Patrick, Perry, John Oliver, Poulson, Daniel Cris, Simpson, Raspberry, Volegov, Petr Lvovich, Walstrom, Peter Lowell, Wilde, Carl Huerstel, Hast, C., Jobe, K., Smith, T., Wienands, U., Clarke, A. J., & Tourret, D. Demonstration of transmission high energy electron microscopy. United States. doi:10.1063/1.5011198.
Merrill, Frank Edward, Goett, III, John Jerome, Gibbs, J. W., Imhoff, S. D., Mariam, Fesseha Gebre, Morris, C. L., Neukirch, Levi Patrick, Perry, John Oliver, Poulson, Daniel Cris, Simpson, Raspberry, Volegov, Petr Lvovich, Walstrom, Peter Lowell, Wilde, Carl Huerstel, Hast, C., Jobe, K., Smith, T., Wienands, U., Clarke, A. J., and Tourret, D. Fri . "Demonstration of transmission high energy electron microscopy". United States. doi:10.1063/1.5011198. https://www.osti.gov/servlets/purl/1436077.
@article{osti_1436077,
title = {Demonstration of transmission high energy electron microscopy},
author = {Merrill, Frank Edward and Goett, III, John Jerome and Gibbs, J. W. and Imhoff, S. D. and Mariam, Fesseha Gebre and Morris, C. L. and Neukirch, Levi Patrick and Perry, John Oliver and Poulson, Daniel Cris and Simpson, Raspberry and Volegov, Petr Lvovich and Walstrom, Peter Lowell and Wilde, Carl Huerstel and Hast, C. and Jobe, K. and Smith, T. and Wienands, U. and Clarke, A. J. and Tourret, D.},
abstractNote = {High energy electrons have been used to investigate an extension of transmission electron microscopy. This technique, transmission high energy electron microscopy (THEEM), provides two additional capabilities to electron microscopy. First, high energy electrons are more penetrating than low energy electrons, and thus, they are able to image through thicker samples. Second, the accelerating mode of a radio-frequency linear accelerator provides fast exposures, down to 1 ps, which are ideal for flash radiography, making THEEM well suited to study the evolution of fast material processes under dynamic conditions. Lastly, initial investigations with static objects and during material processing have been performed to investigate the capabilities of this technique.},
doi = {10.1063/1.5011198},
journal = {Applied Physics Letters},
number = 14,
volume = 112,
place = {United States},
year = {2018},
month = {4}
}

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Figures / Tables:

FIG. 1 FIG. 1: Schematic layout of the electron radiography magnifier that was fielded for these measurements.

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