Non-spectroscopic composition measurements of SrTiO3-La0.7Sr0.3MnO3 multilayers using scanning convergent beam electron diffraction

Ophus, Colin; Ercius, Peter; Huijben, Mark; Ciston, Jim

doi:10.1063/1.4975932

Title: Non-spectroscopic composition measurements of SrTiO₃-La_0.7Sr_0.3MnO₃ multilayers using scanning convergent beam electron diffraction

Abstract

The local atomic structure of a crystalline sample aligned along a zone axis can be probed with a focused electron probe, which produces a convergent beam electron diffraction pattern. The introduction of high speed direct electron detectors has allowed for experiments that can record a full diffraction pattern image at thousands of probe positions on a sample. By incoherently summing these patterns over crystalline unit cells, we demonstrate in this paper that in addition to crystal structure and thickness, we can also estimate the local composition of a perovskite superlattice sample. This is achieved by matching the summed patterns to a library of simulated diffraction patterns. Finally, this technique allows for atomic-scale chemical measurements without requiring a spectrometer or hardware aberration correction.

Authors:

^[1];

^[1]; Huijben, Mark ^[2]; Ciston, Jim ^[1]

Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). National Center for Electron Microscopy. Molecular Foundry
Univ. of Twente, Enschede (Netherlands). Faculty of Science and Technology

Publication Date:: 2017-02-08

Research Org.:: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

OSTI Identifier:: 1435077

Alternate Identifier(s):: OSTI ID: 1361776

Grant/Contract Number:: AC02-05CH11231

Resource Type:: Accepted Manuscript

Journal Name:: Applied Physics Letters

Additional Journal Information:: Journal Volume: 110; Journal Issue: 6; Journal ID: ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)

Country of Publication:: United States

Language:: English

Subject:: 74 ATOMIC AND MOLECULAR PHYSICS; multilayers; polarization; superlattices; optical aberrations; position sensitive detectors; electron energy loss spectroscopy; crystal structure; image sensors; convergent beam electron diffraction; dielectric oxides

Citation Formats


                    Ophus, Colin, Ercius, Peter, Huijben, Mark, and Ciston, Jim. Non-spectroscopic composition measurements of SrTiO3-La0.7Sr0.3MnO3 multilayers using scanning convergent beam electron diffraction.  United States: N. p., 2017. 
Web.  doi:10.1063/1.4975932.

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                    Ophus, Colin, Ercius, Peter, Huijben, Mark, & Ciston, Jim. Non-spectroscopic composition measurements of SrTiO3-La0.7Sr0.3MnO3 multilayers using scanning convergent beam electron diffraction.  United States.  https://doi.org/10.1063/1.4975932

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                    Ophus, Colin, Ercius, Peter, Huijben, Mark, and Ciston, Jim. Wed .  
"Non-spectroscopic composition measurements of SrTiO3-La0.7Sr0.3MnO3 multilayers using scanning convergent beam electron diffraction".  United States.  https://doi.org/10.1063/1.4975932.  https://www.osti.gov/servlets/purl/1435077.

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@article{osti_1435077,

  title        = {Non-spectroscopic composition measurements of SrTiO3-La0.7Sr0.3MnO3 multilayers using scanning convergent beam electron diffraction},

  author       = {Ophus, Colin and Ercius, Peter and Huijben, Mark and Ciston, Jim},

  abstractNote = {The local atomic structure of a crystalline sample aligned along a zone axis can be probed with a focused electron probe, which produces a convergent beam electron diffraction pattern. The introduction of high speed direct electron detectors has allowed for experiments that can record a full diffraction pattern image at thousands of probe positions on a sample. By incoherently summing these patterns over crystalline unit cells, we demonstrate in this paper that in addition to crystal structure and thickness, we can also estimate the local composition of a perovskite superlattice sample. This is achieved by matching the summed patterns to a library of simulated diffraction patterns. Finally, this technique allows for atomic-scale chemical measurements without requiring a spectrometer or hardware aberration correction.},

  doi          = {10.1063/1.4975932},

  journal      = {Applied Physics Letters},

  number       = 6,

  volume       = 110,

  place        = {United States},

  year         = {2017},

  month        = {2}

}

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Title: Non-spectroscopic composition measurements of SrTiO3-La0.7Sr0.3MnO3 multilayers using scanning convergent beam electron diffraction

Abstract

Citation Formats

Spontaneous Vortex Nanodomain Arrays at Ferroelectric Heterointerfaces journal, February 2011

Ferroelectric control of a Mott insulator journal, October 2013

A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imaging journal, February 2017

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Title: Non-spectroscopic composition measurements of SrTiO₃-La_0.7Sr_0.3MnO₃ multilayers using scanning convergent beam electron diffraction

Spontaneous Vortex Nanodomain Arrays at Ferroelectric Heterointerfaces
journal, February 2011

Ferroelectric control of a Mott insulator
journal, October 2013

A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imaging
journal, February 2017

On the accurate measurement of structure-factor amplitudes and phases by electron diffraction
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CBED and CBIM from semiconductors and superconductors
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Evolution of magnetic phases and orbital occupation in ${({SrMnO}_{3})}_{n} / {({LaMnO}_{3})}_{2 n}$ superlattices
journal, October 2009

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journal, November 2004

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Enhanced phase contrast transfer using ptychography combined with a pre-specimen phase plate in a scanning transmission electron microscope
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