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Title: Non-spectroscopic composition measurements of SrTiO3-La0.7Sr0.3MnO3 multilayers using scanning convergent beam electron diffraction

Abstract

The local atomic structure of a crystalline sample aligned along a zone axis can be probed with a focused electron probe, which produces a convergent beam electron diffraction pattern. The introduction of high speed direct electron detectors has allowed for experiments that can record a full diffraction pattern image at thousands of probe positions on a sample. By incoherently summing these patterns over crystalline unit cells, we demonstrate in this paper that in addition to crystal structure and thickness, we can also estimate the local composition of a perovskite superlattice sample. This is achieved by matching the summed patterns to a library of simulated diffraction patterns. Finally, this technique allows for atomic-scale chemical measurements without requiring a spectrometer or hardware aberration correction.

Authors:
ORCiD logo [1]; ORCiD logo [1];  [2];  [1]
  1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). National Center for Electron Microscopy. Molecular Foundry
  2. Univ. of Twente, Enschede (Netherlands). Faculty of Science and Technology
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1435077
Alternate Identifier(s):
OSTI ID: 1361776
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 110; Journal Issue: 6; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
74 ATOMIC AND MOLECULAR PHYSICS; multilayers; polarization; superlattices; optical aberrations; position sensitive detectors; electron energy loss spectroscopy; crystal structure; image sensors; convergent beam electron diffraction; dielectric oxides

Citation Formats

Ophus, Colin, Ercius, Peter, Huijben, Mark, and Ciston, Jim. Non-spectroscopic composition measurements of SrTiO3-La0.7Sr0.3MnO3 multilayers using scanning convergent beam electron diffraction. United States: N. p., 2017. Web. doi:10.1063/1.4975932.
Ophus, Colin, Ercius, Peter, Huijben, Mark, & Ciston, Jim. Non-spectroscopic composition measurements of SrTiO3-La0.7Sr0.3MnO3 multilayers using scanning convergent beam electron diffraction. United States. doi:10.1063/1.4975932.
Ophus, Colin, Ercius, Peter, Huijben, Mark, and Ciston, Jim. Wed . "Non-spectroscopic composition measurements of SrTiO3-La0.7Sr0.3MnO3 multilayers using scanning convergent beam electron diffraction". United States. doi:10.1063/1.4975932. https://www.osti.gov/servlets/purl/1435077.
@article{osti_1435077,
title = {Non-spectroscopic composition measurements of SrTiO3-La0.7Sr0.3MnO3 multilayers using scanning convergent beam electron diffraction},
author = {Ophus, Colin and Ercius, Peter and Huijben, Mark and Ciston, Jim},
abstractNote = {The local atomic structure of a crystalline sample aligned along a zone axis can be probed with a focused electron probe, which produces a convergent beam electron diffraction pattern. The introduction of high speed direct electron detectors has allowed for experiments that can record a full diffraction pattern image at thousands of probe positions on a sample. By incoherently summing these patterns over crystalline unit cells, we demonstrate in this paper that in addition to crystal structure and thickness, we can also estimate the local composition of a perovskite superlattice sample. This is achieved by matching the summed patterns to a library of simulated diffraction patterns. Finally, this technique allows for atomic-scale chemical measurements without requiring a spectrometer or hardware aberration correction.},
doi = {10.1063/1.4975932},
journal = {Applied Physics Letters},
number = 6,
volume = 110,
place = {United States},
year = {2017},
month = {2}
}

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