Bright x-rays reveal shifting deformation states and effects of the microstructure on the plastic deformation of crystalline materials

Beaudoin, A. J.; Shade, P. A.; Schuren, J. C.; Turner, T. J.; Woodward, C.; Bernier, J. V.; Li, S. F.; Dimiduk, D. M.; Kenesei, P.; Park, J. -S.

doi:10.1103/PhysRevB.96.174116

Title: Bright x-rays reveal shifting deformation states and effects of the microstructure on the plastic deformation of crystalline materials

Authors:

Beaudoin, A. J. ^[1]; Shade, P. A. ^[2]; Schuren, J. C. ^[2]; Turner, T. J. ^[2]; Woodward, C. ^[2]; Bernier, J. V. ^[3]; Li, S. F. ^[3]; Dimiduk, D. M. ^[4]; Kenesei, P. ^[5]; Park, J. -S. ^[5]

Cornell Univ., Ithaca, NY (United States). Cornell High Energy Synchrotron Source (CHESS)
Air Force Research Lab. (AFRL), Wright-Patterson AFB, OH (United States)
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
The Ohio State Univ., Columbus, OH (United States); BlueQuartz Software, Springboro, OH (United States)
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)

Publication Date:: 2017-11-30

Research Org.:: Argonne National Lab. (ANL), Argonne, IL (United States); Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

Sponsoring Org.:: USDOE Office of Science (SC); US Air Force Office of Scientific Research (AFOSR)

OSTI Identifier:: 1434933

Alternate Identifier(s):: OSTI ID: 1410730; OSTI ID: 1497287

Report Number(s):: LLNL-JRNL-749399
Journal ID: ISSN 2469-9950; PRBMDO; 133946; TRN: US1802823

Grant/Contract Number:: AC02-06CH11357; AC52-07NA27344

Resource Type:: Accepted Manuscript

Journal Name:: Physical Review B

Additional Journal Information:: Journal Volume: 96; Journal Issue: 17; Journal ID: ISSN 2469-9950

Publisher:: American Physical Society (APS)

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE; 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

Citation Formats


                    Beaudoin, A. J., Shade, P. A., Schuren, J. C., Turner, T. J., Woodward, C., Bernier, J. V., Li, S. F., Dimiduk, D. M., Kenesei, P., and Park, J. -S. Bright x-rays reveal shifting deformation states and effects of the microstructure on the plastic deformation of crystalline materials.  United States: N. p., 2017. 
Web.  doi:10.1103/PhysRevB.96.174116.

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                    Beaudoin, A. J., Shade, P. A., Schuren, J. C., Turner, T. J., Woodward, C., Bernier, J. V., Li, S. F., Dimiduk, D. M., Kenesei, P., & Park, J. -S. Bright x-rays reveal shifting deformation states and effects of the microstructure on the plastic deformation of crystalline materials.  United States.  https://doi.org/10.1103/PhysRevB.96.174116

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                    Beaudoin, A. J., Shade, P. A., Schuren, J. C., Turner, T. J., Woodward, C., Bernier, J. V., Li, S. F., Dimiduk, D. M., Kenesei, P., and Park, J. -S. Thu .  
"Bright x-rays reveal shifting deformation states and effects of the microstructure on the plastic deformation of crystalline materials".  United States.  https://doi.org/10.1103/PhysRevB.96.174116.  https://www.osti.gov/servlets/purl/1434933.

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@article{osti_1434933,

  title        = {Bright x-rays reveal shifting deformation states and effects of the microstructure on the plastic deformation of crystalline materials},

  author       = {Beaudoin, A. J. and Shade, P. A. and Schuren, J. C. and Turner, T. J. and Woodward, C. and Bernier, J. V. and Li, S. F. and Dimiduk, D. M. and Kenesei, P. and Park, J. -S.},

  abstractNote = {},

  doi          = {10.1103/PhysRevB.96.174116},

  journal      = {Physical Review B},

  number       = 17,

  volume       = 96,

  place        = {United States},

  year         = {2017},

  month        = {11}

}

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https://doi.org/10.1103/PhysRevB.96.174116

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Automated Grain Yield Behavior Classification
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Title: Bright x-rays reveal shifting deformation states and effects of the microstructure on the plastic deformation of crystalline materials

Citation Formats

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Dislocation Avalanches, Strain Bursts, and the Problem of Plastic Forming at the Micrometer Scale
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