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Title: Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis

Authors:
; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1434835
Grant/Contract Number:  
SC0016179
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review Applied
Additional Journal Information:
Journal Name: Physical Review Applied Journal Volume: 9 Journal Issue: 4; Journal ID: ISSN 2331-7019
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English

Citation Formats

Dagdeviren, Omur E., Zhou, Chao, Altman, Eric I., and Schwarz, Udo D. Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis. United States: N. p., 2018. Web. doi:10.1103/PhysRevApplied.9.044040.
Dagdeviren, Omur E., Zhou, Chao, Altman, Eric I., & Schwarz, Udo D. Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis. United States. doi:10.1103/PhysRevApplied.9.044040.
Dagdeviren, Omur E., Zhou, Chao, Altman, Eric I., and Schwarz, Udo D. Thu . "Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis". United States. doi:10.1103/PhysRevApplied.9.044040.
@article{osti_1434835,
title = {Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis},
author = {Dagdeviren, Omur E. and Zhou, Chao and Altman, Eric I. and Schwarz, Udo D.},
abstractNote = {},
doi = {10.1103/PhysRevApplied.9.044040},
journal = {Physical Review Applied},
number = 4,
volume = 9,
place = {United States},
year = {2018},
month = {4}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1103/PhysRevApplied.9.044040

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Cited by: 4 works
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Works referenced in this record:

Dynamic atomic force microscopy methods
journal, September 2002


Force reconstruction from tapping mode force microscopy experiments
journal, April 2015


Quantitative analysis of dynamic-force-spectroscopy data on graphite(0001) in the contact and noncontact regimes
journal, May 2000


Forces and frequency shifts in atomic-resolution dynamic-force microscopy
journal, December 1997


Basic properties of dynamic force spectroscopy with the scanning force microscope in experiment and simulation
journal, December 1996


Submolecular features of epitaxially grown PTCDA on Cu(111) analyzed by force field spectroscopy
journal, June 2009


Three-dimensional imaging of short-range chemical forces with picometre resolution
journal, April 2009

  • Albers, Boris J.; Schwendemann, Todd C.; Baykara, Mehmet Z.
  • Nature Nanotechnology, Vol. 4, Issue 5
  • DOI: 10.1038/nnano.2009.57

JKR-DMT transition in the presence of a liquid meniscus
journal, January 1994

  • Maugis, D.; Gauthier-Manuel, B.
  • Journal of Adhesion Science and Technology, Vol. 8, Issue 11
  • DOI: 10.1163/156856194X00627

Accurate formulas for interaction force and energy in frequency modulation force spectroscopy
journal, March 2004

  • Sader, John E.; Jarvis, Suzanne P.
  • Applied Physics Letters, Vol. 84, Issue 10
  • DOI: 10.1063/1.1667267

Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
journal, May 1987

  • Martin, Y.; Williams, C. C.; Wickramasinghe, H. K.
  • Journal of Applied Physics, Vol. 61, Issue 10
  • DOI: 10.1063/1.338807

Atomic force microscopy and spectroscopy
journal, December 2007


An alternative to the Maugis model of adhesion between elastic spheres
journal, November 1998


Theory of phase-modulation atomic force microscopy with constant-oscillation amplitude
journal, March 2008

  • Hölscher, Hendrik
  • Journal of Applied Physics, Vol. 103, Issue 6
  • DOI: 10.1063/1.2896450

Quantitative force versus distance measurements in amplitude modulation AFM: a novel force inversion technique
journal, April 2009


Quantitative analysis of the frictional properties of solid materials at low loads. I. Carbon compounds
journal, September 1997


Dynamic force spectroscopy using the frequency modulation technique with constant excitation
journal, October 2003


Advances in atomic force microscopy
journal, July 2003


Coupling of conservative and dissipative forces in frequency-modulation atomic force microscopy
journal, November 2006


Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy
journal, February 1999


Three-Dimensional Atomic Force Microscopy - Taking Surface Imaging to the Next Level
journal, April 2010

  • Baykara, Mehmet Z.; Schwendemann, Todd C.; Altman, Eric I.
  • Advanced Materials, Vol. 22, Issue 26-27
  • DOI: 10.1002/adma.200903909

Determination of Tip-Sample Interaction Potentials by Dynamic Force Spectroscopy
journal, December 1999


Interpretation of force curves in force microscopy
journal, April 1993


Relations between interaction force and frequency shift in large-amplitude dynamic force microscopy
journal, July 1999


Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy
journal, January 2016


General Theory of Amplitude-Modulation Atomic Force Microscopy
journal, July 2006


The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy
journal, August 2009


Atomically resolved mechanical response of individual metallofullerene molecules confined inside carbon nanotubes
journal, May 2008

  • Ashino, Makoto; Obergfell, Dirk; Haluška, Miro
  • Nature Nanotechnology, Vol. 3, Issue 6
  • DOI: 10.1038/nnano.2008.126

Q-controlled dynamic force spectroscopy
journal, September 2002


Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction
journal, January 2012

  • Baykara, Mehmet Z.; Dagdeviren, Omur E.; Schwendemann, Todd C.
  • Beilstein Journal of Nanotechnology, Vol. 3
  • DOI: 10.3762/bjnano.3.73

Theory of amplitude modulation atomic force microscopy with and without Q-Control
journal, May 2007


Interaction imaging with amplitude-dependence force spectroscopy
journal, January 2013

  • Platz, Daniel; Forchheimer, Daniel; Tholén, Erik A.
  • Nature Communications, Vol. 4, Issue 1
  • DOI: 10.1038/ncomms2365

Atomic resolution in scanning force microscopy: Concepts, requirements, contrast mechanisms, and image interpretation
journal, November 2000

  • Schwarz, Udo D.; Hölscher, Hendrik; Wiesendanger, Roland
  • Physical Review B, Vol. 62, Issue 19
  • DOI: 10.1103/PhysRevB.62.13089

Exploring site-specific chemical interactions at surfaces: a case study on highly ordered pyrolytic graphite
journal, November 2016


Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy
journal, March 2008

  • Albers, Boris J.; Liebmann, Marcus; Schwendemann, Todd C.
  • Review of Scientific Instruments, Vol. 79, Issue 3
  • DOI: 10.1063/1.2842631

Fast digital electronics for application in dynamic force microscopy using high-Q cantilevers
journal, March 1998

  • Loppacher, C.; Bammerlin, M.; Battiston, F.
  • Applied Physics A: Materials Science & Processing, Vol. 66, Issue 7
  • DOI: 10.1007/s003390051132

Frequency modulation detection using high‐ Q cantilevers for enhanced force microscope sensitivity
journal, January 1991

  • Albrecht, T. R.; Grütter, P.; Horne, D.
  • Journal of Applied Physics, Vol. 69, Issue 2
  • DOI: 10.1063/1.347347

Atomic Force Microscope
journal, March 1986


Determination of tip–sample interaction forces from measured dynamic force spectroscopy curves
journal, February 1999


High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork
journal, December 1998

  • Giessibl, Franz J.
  • Applied Physics Letters, Vol. 73, Issue 26
  • DOI: 10.1063/1.122948

Quantitative force measurements using frequency modulation atomic force microscopy?theoretical foundations
journal, January 2005


Reversal of atomic contrast in scanning probe microscopy on (111) metal surfaces
journal, February 2012


Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy
journal, June 2009


Calculation of the frequency shift in dynamic force microscopy
journal, February 1999


Forces and Currents in Carbon Nanostructures: Are We Imaging Atoms?
journal, April 2011


A generalized analytical model for the elastic deformation of an adhesive contact between a sphere and a flat surface
journal, May 2003


Interplay of the tip–sample junction stability and image contrast reversal on a Cu(111) surface revealed by the 3D force field
journal, January 2012


Analysis of the interaction mechanisms in dynamic mode SFM by means of experimental data and computer simulation
journal, March 1998

  • Anczykowski, B.; Cleveland, J. P.; Krüger, D.
  • Applied Physics A: Materials Science & Processing, Vol. 66, Issue 7
  • DOI: 10.1007/s003390051261

Numerical performance analysis of quartz tuning fork-based force sensors
journal, December 2016


Imaging physical phenomena with local probes: From electrons to photons
journal, September 2012