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Title: Atomic-Scale Insights into the Oxidation of Aluminum

Here, the surface oxidation of aluminum is still poorly understood despite its vital role as an insulator in electronics, in aluminum–air batteries, and in protecting the metal against corrosion. Here we use atomic resolution imaging in an environmental transmission electron microscope (TEM) to investigate the mechanism of aluminum oxide formation. Harnessing electron beam sputtering we prepare a pristine, oxide-free metal surface in the TEM. This allows us to study, as a function of crystallographic orientation and oxygen gas pressure, the full oxide growth regime from the first oxide nucleation to a complete anometers-thick surface film.
Authors:
 [1] ;  [1] ; ORCiD logo [2] ; ORCiD logo [3] ; ORCiD logo [1] ;  [4] ;  [1] ; ORCiD logo [1] ;  [1]
  1. Univ. of Manchester, Manchester (United Kingdom)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States)
  3. Brookhaven National Lab. (BNL), Upton, NY (United States); Univ. of Pennsylvania, Philadelphia, PA (United States)
  4. RWTH Aachen Univ., Aachen (Germany)
Publication Date:
Report Number(s):
BNL-203567-2018-JAAM
Journal ID: ISSN 1944-8244
Grant/Contract Number:
SC0012704
Type:
Accepted Manuscript
Journal Name:
ACS Applied Materials and Interfaces
Additional Journal Information:
Journal Volume: 10; Journal Issue: 3; Journal ID: ISSN 1944-8244
Publisher:
American Chemical Society (ACS)
Research Org:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; aluminum; electron energy loss spectroscopy; environmental transmission electron microscopy; high resolution transmission electron microscopy; nucleation; oxide; transmission electron microscopy
OSTI Identifier:
1434776