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Title: Radiation-driven rotational motion of nanoparticles

Focused synchrotron beams can influence a studied sample via heating, or radiation pressure effects due to intensity gradients. The high angular sensitivity of rotational X-ray tracking (RXT) of crystalline particles via their Bragg reflections can detect extremely small forces such as those caused by field gradients. By tracking the rotational motion of single crystal nanoparticles embedded in a viscous or viscoelastic medium, we observed the effects of heating in a uniform gradient beam and radiation pressure in a Gaussian profile beam. Heating of a few degrees Celsius was measured for 42μm crystals in glycerol and angular velocities of 10 -6rad/s due to torques of 10 - 24N∙m were measured for 340nm crystals in a colloidal gel matrix. These results show the ability to quantify small forces using rotation motion of tracer particles.
 [1] ;  [2] ; ORCiD logo [3]
  1. SLAC National Accelerator Lab., Menlo Park, CA (United States). Linac Coherent Light Source (LCLS)
  2. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
  3. Univ. College, London (United Kingdom). Centre for Nanotechnology
Publication Date:
Report Number(s):
Journal ID: ISSN 1600-5775
Grant/Contract Number:
SC0012704; AC02-06CH11357; SC00112704
Published Article
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 25; Journal Issue: 3; Journal ID: ISSN 1600-5775
International Union of Crystallography
Research Org:
Brookhaven National Laboratory (BNL), Upton, NY (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); National Science Foundation (NSF)
Country of Publication:
United States
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; rotational X-ray tracking; radiation pressure; rotational dynamics; rotational x-ray tracking
OSTI Identifier:
Alternate Identifier(s):
OSTI ID: 1433986; OSTI ID: 1466355