Intensity-Modulated Scanning Kelvin Probe Microscopy for Probing Recombination in Organic Photovoltaics
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journal
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September 2014 |
Direct Imaging of Charged Impurity Density in Common Graphene Substrates
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journal
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July 2013 |
Kelvin Probe Force Microscopy by Dissipative Electrostatic Force Modulation
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journal
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November 2015 |
Time-Resolved Electric Force Microscopy of Charge Trapping in Polycrystalline Pentacene
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journal
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July 2007 |
Measuring the lifetime of silicon nanocrystal solar cell photo-carriers by using Kelvin probe force microscopy and x-ray photoelectron spectroscopy
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journal
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June 2014 |
Obtaining Detailed Structural Information about Supramolecular Systems on Surfaces by Combining High-Resolution Force Microscopy with ab Initio Calculations
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journal
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September 2013 |
Imaging the charge distribution within a single molecule
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journal
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February 2012 |
Long-lived charge traps in functionalized pentacene and anthradithiophene studied by time-resolved electric force microscopy
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journal
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January 2009 |
Kelvin Probe Force Microscopy
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book
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January 2012 |
Tracking speed bumps in organic field-effect transistors via pump-probe Kelvin-probe force microscopy
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journal
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December 2015 |
Obtaining Detailed Structural Information about Supramolecular Systems on Surfaces by Combining High-Resolution Force Microscopy with ab Initio Calculations
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journal
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September 2013 |
A microscopic view of charge transport in polymer transistors
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journal
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November 2004 |
Probing ion transport at the nanoscale: Time-domain electrostatic force spectroscopy on glassy electrolytes
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text
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January 2004 |
Intensity-Modulated Scanning Kelvin Probe Microscopy for Probing Recombination in Organic Photovoltaics
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journal
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September 2014 |
The lower limit for time resolution in frequency modulation atomic force microscopy
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text
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January 2016 |
Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy
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journal
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June 2009 |
Pump-probe Kelvin-probe force microscopy: Principle of operation and resolution limits
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journal
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October 2015 |
Spectroscopic Characterization of Charged Defects in Polycrystalline Pentacene by Time- and Wavelength-Resolved Electric Force Microscopy
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journal
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December 2010 |
Time-Resolved Electric Force Microscopy of Charge Trapping in Polycrystalline Pentacene
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journal
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July 2007 |
Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation
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text
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January 2017 |
Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation
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text
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January 2017 |
Imaging the charge distribution within a single molecule
|
journal
|
February 2012 |
Direct Imaging of Charged Impurity Density in Common Graphene Substrates
|
journal
|
July 2013 |
Tracking speed bumps in organic field-effect transistors via pump-probe Kelvin-probe force microscopy
|
journal
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December 2015 |
The elimination of the ‘artifact’ in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope
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journal
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March 2002 |
Kelvin probe force microscopy
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journal
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June 1991 |
Time-resolved electrostatic force microscopy of polymer solar cells
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journal
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August 2006 |
The impact of ultra-thin titania interlayers on open circuit voltage and carrier lifetime in thin film solar cells
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journal
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March 2016 |
Photo-Carrier Multi-Dynamical Imaging at the Nanometer Scale in Organic and Inorganic Solar Cells
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journal
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November 2016 |
Imaging Charge Transfer State Excitations in Polymer/Fullerene Solar Cells with Time-Resolved Electrostatic Force Microscopy
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journal
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July 2015 |
The limit of time resolution in frequency modulation atomic force microscopy by a pump-probe approach
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journal
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January 2017 |
Kelvin probe force microscopy on III–V semiconductors: the effect of surface defects on the local work function
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journal
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September 2003 |
New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of Semiconductors
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journal
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December 2009 |
Measuring the lifetime of silicon nanocrystal solar cell photo-carriers by using Kelvin probe force microscopy and x-ray photoelectron spectroscopy
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journal
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June 2014 |
Minority carrier lifetime in polycrystalline silicon solar cells studied by photoassisted Kelvin probe force microscopy
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journal
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July 2008 |
Numerical simulations for a quantitative analysis of AFM electrostatic nanopatterning on PMMA by Kelvin force microscopy
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journal
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May 2010 |
The elimination of the ‘artifact’ in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope
|
journal
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March 2002 |
Kelvin Probe Force Microscopy by Dissipative Electrostatic Force Modulation
|
journal
|
November 2015 |
Long-lived charge traps in functionalized pentacene and anthradithiophene studied by time-resolved electric force microscopy
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journal
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January 2009 |
Kelvin probe force microscopy
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journal
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June 1991 |
Nanoscale Investigation of Carrier Lifetime on the Cross Section of Epitaxial Silicon Solar Cells Using Kelvin Probe Force Microscopy
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journal
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November 2016 |
Nanoscale Investigation of Carrier Lifetime on the Cross Section of Epitaxial Silicon Solar Cells Using Kelvin Probe Force Microscopy
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journal
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November 2016 |
A microscopic view of charge transport in polymer transistors
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journal
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November 2004 |
High-resolution work function imaging of single grains of semiconductor surfaces
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journal
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April 2002 |
Photo-Carrier Multi-Dynamical Imaging at the Nanometer Scale in Organic and Inorganic Solar Cells
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journal
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November 2016 |
Pump-probe Kelvin-probe force microscopy: Principle of operation and resolution limits
|
journal
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October 2015 |
Kelvin Probe Force Microscopy
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book
|
January 2012 |
Comparing the kinetics of bias stress in organic field-effect transistors with different dielectric interfaces
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journal
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October 2006 |
New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of Semiconductors
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journal
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December 2009 |
Kelvin Probe Force Microscopy
|
book
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March 2018 |
Minority carrier lifetime in polycrystalline silicon solar cells studied by photoassisted Kelvin probe force microscopy
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journal
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July 2008 |
CuGaSe2 solar cell cross section studied by Kelvin probe force microscopy in ultrahigh vacuum
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journal
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September 2002 |
Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation
|
journal
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April 2017 |
The impact of ultra-thin titania interlayers on open circuit voltage and carrier lifetime in thin film solar cells
|
journal
|
March 2016 |
Kelvin probe force microscopy on III–V semiconductors: the effect of surface defects on the local work function
|
journal
|
September 2003 |
Imaging Charge Transfer State Excitations in Polymer/Fullerene Solar Cells with Time-Resolved Electrostatic Force Microscopy
|
journal
|
July 2015 |
Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy
|
journal
|
June 2009 |
High-resolution work function imaging of single grains of semiconductor surfaces
|
journal
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April 2002 |
New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of Semiconductors
|
journal
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December 2009 |
Numerical simulations for a quantitative analysis of AFM electrostatic nanopatterning on PMMA by Kelvin force microscopy
|
journal
|
May 2010 |
Probing ion transport at the nanoscale: Time-domain electrostatic force spectroscopy on glassy electrolytes
|
journal
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September 2004 |
Time-resolved electrostatic force microscopy of polymer solar cells
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journal
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August 2006 |