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Title: Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3

Abstract

Comprehensive crystal structural study is performed for BiFeO3 (BFO) film grown on KTaO3 (KTO) substrate using transmission electron microscopy (TEM) and x-ray diffraction (XRD). Nano beam electron diffraction (NBED) combined with structure factor calculation and high resolution TEM images clearly reveal that the crystal structure within BFO thin film is rhombohedral BFO, i.e., bulk BFO phase. Epitaxial relationship found by NBED indicates the BFO film grows in a manner that minimizes lattice mismatch with KTO. It further suggests BFO film is under slight biaxial tensile stress (~0.35%) along in-plane direction. XRD reveals BFO lattice is under compressive stress (~1.6%), along out-of-plane direction as a result of the biaxial tensile stress applied along in-plane direction. This leads to Poisson’s ratio of ~0.68. In addition, we demonstrate (1) why hexagonal notation rather than pseudocubic one is required for accurate BFO phase evaluation and (2) a new XRD method that shows how rhombohedral BFO can readily be identified among other phases by measuring a rhombohedral specific Bragg’s peak.

Authors:
 [1];  [2];  [3];  [3]; ORCiD logo [4];  [5]
  1. State Univ. of New York (SUNY), Binghamton, NY (United States). Small Scale Systems Integration and Packaging Center
  2. Tohoku Univ., Sendai (Japan). Dept. of Applied Physics, Graduate School of Engineering
  3. Brookhaven National Lab. (BNL), Upton, NY (United States). Condensed Matter Physics and Materials Science
  4. Tokyo Inst. of Technology (Japan). Research Lab. for Materials and Structures
  5. Tohoku Univ., Sendai (Japan). Dept. of Applied Physics, Graduate School of Engineering; Univ. Paris-Sud, Orsay (France); Univ. Paris-Saclay, Palaiseau (France). Unite Mixte de Physique
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1433997
Report Number(s):
BNL-203547-2018-JAAM
Journal ID: ISSN 2045-2322
Grant/Contract Number:  
SC0012704
Resource Type:
Accepted Manuscript
Journal Name:
Scientific Reports
Additional Journal Information:
Journal Volume: 8; Journal Issue: 1; Journal ID: ISSN 2045-2322
Publisher:
Nature Publishing Group
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Bae, In-Tae, Ichinose, Tomohiro, Han, Myung-Geun, Zhu, Yimei, Yasui, Shintaro, and Naganuma, Hiroshi. Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3. United States: N. p., 2018. Web. doi:10.1038/s41598-018-19487-8.
Bae, In-Tae, Ichinose, Tomohiro, Han, Myung-Geun, Zhu, Yimei, Yasui, Shintaro, & Naganuma, Hiroshi. Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3. United States. doi:10.1038/s41598-018-19487-8.
Bae, In-Tae, Ichinose, Tomohiro, Han, Myung-Geun, Zhu, Yimei, Yasui, Shintaro, and Naganuma, Hiroshi. Wed . "Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3". United States. doi:10.1038/s41598-018-19487-8. https://www.osti.gov/servlets/purl/1433997.
@article{osti_1433997,
title = {Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3},
author = {Bae, In-Tae and Ichinose, Tomohiro and Han, Myung-Geun and Zhu, Yimei and Yasui, Shintaro and Naganuma, Hiroshi},
abstractNote = {Comprehensive crystal structural study is performed for BiFeO3 (BFO) film grown on KTaO3 (KTO) substrate using transmission electron microscopy (TEM) and x-ray diffraction (XRD). Nano beam electron diffraction (NBED) combined with structure factor calculation and high resolution TEM images clearly reveal that the crystal structure within BFO thin film is rhombohedral BFO, i.e., bulk BFO phase. Epitaxial relationship found by NBED indicates the BFO film grows in a manner that minimizes lattice mismatch with KTO. It further suggests BFO film is under slight biaxial tensile stress (~0.35%) along in-plane direction. XRD reveals BFO lattice is under compressive stress (~1.6%), along out-of-plane direction as a result of the biaxial tensile stress applied along in-plane direction. This leads to Poisson’s ratio of ~0.68. In addition, we demonstrate (1) why hexagonal notation rather than pseudocubic one is required for accurate BFO phase evaluation and (2) a new XRD method that shows how rhombohedral BFO can readily be identified among other phases by measuring a rhombohedral specific Bragg’s peak.},
doi = {10.1038/s41598-018-19487-8},
journal = {Scientific Reports},
number = 1,
volume = 8,
place = {United States},
year = {2018},
month = {1}
}

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