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This content will become publicly available on November 15, 2018

Title: High resolution tip-tilt positioning system for a next generation MLL-based x-ray microscope

Multilayer Laue lenses (MLLs) are x-ray focusing optics with the potential to focus hard x-rays down to a single nanometer level. In order to achieve point focus, an MLL microscope needs to have the capability to perform tip-tilt motion of MLL optics and to hold the angular position for an extended period of time. Here, we present a 2D tip-tilt system that can achieve an angular resolution of over 100 microdegree with a working range of 4°, by utilizing a combination of laser interferometer and mini retroreflector. The linear dimensions of the developed system are about 30 mm in all directions, and the thermal dissipation of the system during operation is negligible. Compact design and high angular resolution make the developed system suitable for MLL optics alignment in the next generation of MLL-based x-ray microscopes.
Authors:
 [1] ;  [2] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States); Indiana Univ., Bloomington, IN (United States). Dept. of Physics
Publication Date:
Report Number(s):
BNL-203466-2018-JAAM
Journal ID: ISSN 0957-0233
Grant/Contract Number:
SC0012704
Type:
Accepted Manuscript
Journal Name:
Measurement Science and Technology
Additional Journal Information:
Journal Volume: 28; Journal Issue: 12; Journal ID: ISSN 0957-0233
Publisher:
IOP Publishing
Research Org:
Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY
OSTI Identifier:
1433950