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Title: High resolution tip-tilt positioning system for a next generation MLL-based x-ray microscope

Abstract

Multilayer Laue lenses (MLLs) are x-ray focusing optics with the potential to focus hard x-rays down to a single nanometer level. In order to achieve point focus, an MLL microscope needs to have the capability to perform tip-tilt motion of MLL optics and to hold the angular position for an extended period of time. Here, we present a 2D tip-tilt system that can achieve an angular resolution of over 100 microdegree with a working range of 4°, by utilizing a combination of laser interferometer and mini retroreflector. The linear dimensions of the developed system are about 30 mm in all directions, and the thermal dissipation of the system during operation is negligible. Compact design and high angular resolution make the developed system suitable for MLL optics alignment in the next generation of MLL-based x-ray microscopes.

Authors:
 [1];  [2];  [1];  [1];  [1];  [1];  [1]
+ Show Author Affiliations
  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States); Indiana Univ., Bloomington, IN (United States). Dept. of Physics
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1433950
Report Number(s):
BNL-203466-2018-JAAM
Journal ID: ISSN 0957-0233
Grant/Contract Number:  
SC0012704
Resource Type:
Accepted Manuscript
Journal Name:
Measurement Science and Technology
Additional Journal Information:
Journal Volume: 28; Journal Issue: 12; Journal ID: ISSN 0957-0233
Publisher:
IOP Publishing
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY

Citation Formats

Xu, Weihe, Schlossberger, Noah, Xu, Wei, Yan, Hanfei, Huang, Xiaojing, Chu, Yong S., and Nazaretski, E. High resolution tip-tilt positioning system for a next generation MLL-based x-ray microscope. United States: N. p., 2017. Web. doi:10.1088/1361-6501/aa8916.
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Xu, Weihe, Schlossberger, Noah, Xu, Wei, Yan, Hanfei, Huang, Xiaojing, Chu, Yong S., & Nazaretski, E. High resolution tip-tilt positioning system for a next generation MLL-based x-ray microscope. United States. https://doi.org/10.1088/1361-6501/aa8916
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Xu, Weihe, Schlossberger, Noah, Xu, Wei, Yan, Hanfei, Huang, Xiaojing, Chu, Yong S., and Nazaretski, E. Wed . "High resolution tip-tilt positioning system for a next generation MLL-based x-ray microscope". United States. https://doi.org/10.1088/1361-6501/aa8916. https://www.osti.gov/servlets/purl/1433950.
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@article{osti_1433950,
title = {High resolution tip-tilt positioning system for a next generation MLL-based x-ray microscope},
author = {Xu, Weihe and Schlossberger, Noah and Xu, Wei and Yan, Hanfei and Huang, Xiaojing and Chu, Yong S. and Nazaretski, E.},
abstractNote = {Multilayer Laue lenses (MLLs) are x-ray focusing optics with the potential to focus hard x-rays down to a single nanometer level. In order to achieve point focus, an MLL microscope needs to have the capability to perform tip-tilt motion of MLL optics and to hold the angular position for an extended period of time. Here, we present a 2D tip-tilt system that can achieve an angular resolution of over 100 microdegree with a working range of 4°, by utilizing a combination of laser interferometer and mini retroreflector. The linear dimensions of the developed system are about 30 mm in all directions, and the thermal dissipation of the system during operation is negligible. Compact design and high angular resolution make the developed system suitable for MLL optics alignment in the next generation of MLL-based x-ray microscopes.},
doi = {10.1088/1361-6501/aa8916},
journal = {Measurement Science and Technology},
number = 12,
volume = 28,
place = {United States},
year = {Wed Nov 15 00:00:00 EST 2017},
month = {Wed Nov 15 00:00:00 EST 2017}
}
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Journal Article:
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Publisher's Version of Record
https://doi.org/10.1088/1361-6501/aa8916
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    Works referencing / citing this record:

    Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions
    journal, September 2018

    Multimodal X-ray imaging of grain-level properties and performance in a polycrystalline solar cell
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    • Deutsches Elektronen-Synchrotron, DESY, Hamburg
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    Multimodal X-ray imaging of grain-level properties and performance in a polycrystalline solar cell
    journal, May 2019

    • Ulvestad, A.; Hruszkewycz, S. O.; Holt, M. V.
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    • DOI: 10.1107/s1600577519003606
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