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This content will become publicly available on January 22, 2019

Title: A sub-sampled approach to extremely low-dose STEM

The inpainting of deliberately and randomly sub-sampled images offers a potential means to image specimens at a high resolution and under extremely low-dose conditions (≤1 e -2) using a scanning transmission electron microscope. We show that deliberate sub-sampling acquires images at least an order of magnitude faster than conventional low-dose methods for an equivalent electron dose. More importantly, when adaptive sub-sampling is implemented to acquire the images, there is a significant increase in the resolution and sensitivity which accompanies the increase in imaging speed. Lastly, we demonstrate the potential of this method for beam sensitive materials and in-situ observations by experimentally imaging the node distribution in a metal-organic framework.
Authors:
 [1] ;  [2] ;  [3] ;  [4] ;  [5] ;  [4] ;  [6] ;  [5]
  1. OptimalSensing, Southlake, TX (United States); Duke Univ., Durham, NC (United States)
  2. Rice Univ., Houston, TX (United States)
  3. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  4. Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
  5. Pacific Northwest National Lab. (PNNL), Richland, WA (United States); Univ. of Liverpool (United Kingdom)
  6. Duke Univ., Durham, NC (United States)
Publication Date:
Report Number(s):
PNNL-SA-126577
Journal ID: ISSN 0003-6951
Grant/Contract Number:
AC05-76RL01830
Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 112; Journal Issue: 4; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Research Org:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION
OSTI Identifier:
1433504