skip to main content

DOE PAGESDOE PAGES

This content will become publicly available on April 1, 2019

Title: Quantitative measurements of nanoscale permittivity and conductivity using tuning-fork-based microwave impedance microscopy

Here, we report quantitative measurements of nanoscale permittivity and conductivity using tuning-fork (TF) based microwave impedance microscopy (MIM). The system is operated under the driving amplitude modulation mode, which ensures satisfactory feedback stability on samples with rough surfaces. The demodulated MIM signals on a series of bulk dielectrics are in good agreement with results simulated by finite-element analysis. Using the TF-MIM, we have visualized the evolution of nanoscale conductance on back-gated MoS 2 field effect transistors, and the results are consistent with the transport data. Our work suggests that quantitative analysis of mesoscopic electrical properties can be achieved by near-field microwave imaging with small distance modulation.
Authors:
ORCiD logo [1] ;  [2] ; ORCiD logo [1] ;  [1] ; ORCiD logo [1] ;  [1] ;  [3] ; ORCiD logo [1]
  1. Univ. of Texas, Austin, TX (United States). Dept. of Physics
  2. Tsinghua Univ., Bejing (China). State Key Lab. of Low Dimensional Quantum Physics and Dept. of Physics
  3. Tsinghua Univ., Bejing (China). State Key Lab. of Low Dimensional Quantum Physics and Dept. of Physics; Collaborative Innovation Center of Quantum Matter (CICQM), Beijing (China)
Publication Date:
Grant/Contract Number:
SC0010308
Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 89; Journal Issue: 4; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Research Org:
Univ. of Texas, Austin, TX (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; permittivity; conductivity; tuning fork; microwave impedance microscopy; materials; dielectrics; metals; condensed matter properties; radiowave and microwave technology; electrical properties; metalloids; metallurgy; chemical analysis
OSTI Identifier:
1431207
Alternate Identifier(s):
OSTI ID: 1431389