skip to main content
DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Quantitative measurements of nanoscale permittivity and conductivity using tuning-fork-based microwave impedance microscopy

Abstract

Here, we report quantitative measurements of nanoscale permittivity and conductivity using tuning-fork (TF) based microwave impedance microscopy (MIM). The system is operated under the driving amplitude modulation mode, which ensures satisfactory feedback stability on samples with rough surfaces. The demodulated MIM signals on a series of bulk dielectrics are in good agreement with results simulated by finite-element analysis. Using the TF-MIM, we have visualized the evolution of nanoscale conductance on back-gated MoS 2 field effect transistors, and the results are consistent with the transport data. Our work suggests that quantitative analysis of mesoscopic electrical properties can be achieved by near-field microwave imaging with small distance modulation.

Authors:
ORCiD logo [1];  [2]; ORCiD logo [1];  [1]; ORCiD logo [1];  [1];  [3]; ORCiD logo [1]
  1. Univ. of Texas, Austin, TX (United States). Dept. of Physics
  2. Tsinghua Univ., Bejing (China). State Key Lab. of Low Dimensional Quantum Physics and Dept. of Physics
  3. Tsinghua Univ., Bejing (China). State Key Lab. of Low Dimensional Quantum Physics and Dept. of Physics; Collaborative Innovation Center of Quantum Matter (CICQM), Beijing (China)
Publication Date:
Research Org.:
Univ. of Texas, Austin, TX (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1431207
Alternate Identifier(s):
OSTI ID: 1431389
Grant/Contract Number:  
SC0010308
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 89; Journal Issue: 4; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; permittivity; conductivity; tuning fork; microwave impedance microscopy; materials; dielectrics; metals; condensed matter properties; radiowave and microwave technology; electrical properties; metalloids; metallurgy; chemical analysis

Citation Formats

Wu, Xiaoyu, Hao, Zhenqi, Wu, Di, Zheng, Lu, Jiang, Zhanzhi, Ganesan, Vishal, Wang, Yayu, and Lai, Keji. Quantitative measurements of nanoscale permittivity and conductivity using tuning-fork-based microwave impedance microscopy. United States: N. p., 2018. Web. doi:10.1063/1.5022997.
Wu, Xiaoyu, Hao, Zhenqi, Wu, Di, Zheng, Lu, Jiang, Zhanzhi, Ganesan, Vishal, Wang, Yayu, & Lai, Keji. Quantitative measurements of nanoscale permittivity and conductivity using tuning-fork-based microwave impedance microscopy. United States. doi:10.1063/1.5022997.
Wu, Xiaoyu, Hao, Zhenqi, Wu, Di, Zheng, Lu, Jiang, Zhanzhi, Ganesan, Vishal, Wang, Yayu, and Lai, Keji. Sun . "Quantitative measurements of nanoscale permittivity and conductivity using tuning-fork-based microwave impedance microscopy". United States. doi:10.1063/1.5022997. https://www.osti.gov/servlets/purl/1431207.
@article{osti_1431207,
title = {Quantitative measurements of nanoscale permittivity and conductivity using tuning-fork-based microwave impedance microscopy},
author = {Wu, Xiaoyu and Hao, Zhenqi and Wu, Di and Zheng, Lu and Jiang, Zhanzhi and Ganesan, Vishal and Wang, Yayu and Lai, Keji},
abstractNote = {Here, we report quantitative measurements of nanoscale permittivity and conductivity using tuning-fork (TF) based microwave impedance microscopy (MIM). The system is operated under the driving amplitude modulation mode, which ensures satisfactory feedback stability on samples with rough surfaces. The demodulated MIM signals on a series of bulk dielectrics are in good agreement with results simulated by finite-element analysis. Using the TF-MIM, we have visualized the evolution of nanoscale conductance on back-gated MoS2 field effect transistors, and the results are consistent with the transport data. Our work suggests that quantitative analysis of mesoscopic electrical properties can be achieved by near-field microwave imaging with small distance modulation.},
doi = {10.1063/1.5022997},
journal = {Review of Scientific Instruments},
number = 4,
volume = 89,
place = {United States},
year = {2018},
month = {4}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Citation Metrics:
Cited by: 2 works
Citation information provided by
Web of Science

Figures / Tables:

FIG. 1 FIG. 1: Schematic of the TF-based AFM configured for the DAM mode and the microwave electronics (detailed in the text).

Save / Share:

Works referenced in this record:

0.4 μm spatial resolution with 1 GHz (λ=30 cm) evanescent microwave probe
journal, March 1999

  • Tabib-Azar, M.; Su, D. -P.; Pohar, A.
  • Review of Scientific Instruments, Vol. 70, Issue 3
  • DOI: 10.1063/1.1149658

Seeing through Walls at the Nanoscale: Microwave Microscopy of Enclosed Objects and Processes in Liquids
journal, February 2016


Force–distance studies with piezoelectric tuning forks below 4.2 K
journal, April 2000


Quartz tuning fork based microwave impedance microscopy
journal, June 2016

  • Cui, Yong-Tao; Ma, Eric Yue; Shen, Zhi-Xun
  • Review of Scientific Instruments, Vol. 87, Issue 6
  • DOI: 10.1063/1.4954156

Super-resolution Aperture Scanning Microscope
journal, June 1972


Mesoscopic Percolating Resistance Network in a Strained Manganite Thin Film
journal, July 2010


Preparation and characterization of electrochemically etched W tips for STM
journal, January 1999

  • Ekvall, Inger; Wahlström, Erik; Claesson, Dan
  • Measurement Science and Technology, Vol. 10, Issue 1
  • DOI: 10.1088/0957-0233/10/1/006

Near‐field scanning microwave microscope with 100 μm resolution
journal, November 1996

  • Vlahacos, C. P.; Black, R. C.; Anlage, S. M.
  • Applied Physics Letters, Vol. 69, Issue 21
  • DOI: 10.1063/1.118033

Direct Imaging of Nanoscale Conductance Evolution in Ion-Gel-Gated Oxide Transistors
journal, June 2015


Fabrication of tips with controlled geometry for scanning tunnelling microscopy
journal, January 1990


Low-energy structural dynamics of ferroelectric domain walls in hexagonal rare-earth manganites
journal, May 2017


Toward air-stable multilayer phosphorene thin-films and transistors
journal, March 2015

  • Kim, Joon-Seok; Liu, Yingnan; Zhu, Weinan
  • Scientific Reports, Vol. 5, Issue 1
  • DOI: 10.1038/srep08989

Tapping mode microwave impedance microscopy
journal, April 2009

  • Lai, K.; Kundhikanjana, W.; Peng, H.
  • Review of Scientific Instruments, Vol. 80, Issue 4
  • DOI: 10.1063/1.3123406

Unconventional Correlation between Quantum Hall Transport Quantization and Bulk State Filling in Gated Graphene Devices
journal, October 2016


High-frequency near-field microscopy
journal, July 2002

  • Rosner, Björn T.; van der Weide, Daniel W.
  • Review of Scientific Instruments, Vol. 73, Issue 7
  • DOI: 10.1063/1.1482150

High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope
journal, September 1997

  • Gao, Chen; Wei, Tao; Duewer, Fred
  • Applied Physics Letters, Vol. 71, Issue 13
  • DOI: 10.1063/1.120444

Batch-fabricated cantilever probes with electrical shielding for nanoscale dielectric and conductivity imaging
journal, October 2012


Calibrated nanoscale capacitance measurements using a scanning microwave microscope
journal, November 2010

  • Huber, H. P.; Moertelmaier, M.; Wallis, T. M.
  • Review of Scientific Instruments, Vol. 81, Issue 11
  • DOI: 10.1063/1.3491926

Imaging of Coulomb-Driven Quantum Hall Edge States
journal, October 2011


Uncovering edge states and electrical inhomogeneity in MoS 2 field-effect transistors
journal, July 2016

  • Wu, Di; Li, Xiao; Luan, Lan
  • Proceedings of the National Academy of Sciences, Vol. 113, Issue 31
  • DOI: 10.1073/pnas.1605982113

High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork
journal, December 1998

  • Giessibl, Franz J.
  • Applied Physics Letters, Vol. 73, Issue 26
  • DOI: 10.1063/1.122948

Scanning tip microwave near‐field microscope
journal, June 1996

  • Wei, T.; Xiang, X. ‐D.; Wallace‐Freedman, W. G.
  • Applied Physics Letters, Vol. 68, Issue 24
  • DOI: 10.1063/1.115773

Novel millimeter‐wave near‐field resistivity microscope
journal, March 1996

  • Golosovsky, Michael; Davidov, Dan
  • Applied Physics Letters, Vol. 68, Issue 11
  • DOI: 10.1063/1.116685

Nanoscale Electronic Inhomogeneity in In 2 Se 3 Nanoribbons Revealed by Microwave Impedance Microscopy
journal, March 2009

  • Lai, Keji; Peng, Hailin; Kundhikanjana, Worasom
  • Nano Letters, Vol. 9, Issue 3
  • DOI: 10.1021/nl900222j

Nanoscale microwave microscopy using shielded cantilever probes
journal, April 2011


Direct Observation of CdCl 2 Treatment Induced Grain Boundary Carrier Depletion in CdTe Solar Cells Using Scanning Probe Microwave Reflectivity Based Capacitance Measurements
journal, March 2016

  • Tuteja, Mohit; Koirala, Prakash; Palekis, Vasilios
  • The Journal of Physical Chemistry C, Vol. 120, Issue 13
  • DOI: 10.1021/acs.jpcc.6b00874

Modeling and characterization of a cantilever-based near-field scanning microwave impedance microscope
journal, June 2008

  • Lai, K.; Kundhikanjana, W.; Kelly, M.
  • Review of Scientific Instruments, Vol. 79, Issue 6
  • DOI: 10.1063/1.2949109

Electronic and Morphological Inhomogeneities in Pristine and Deteriorated Perovskite Photovoltaic Films
journal, February 2017


Impact of grain boundaries on efficiency and stability of organic-inorganic trihalide perovskites
journal, December 2017


Drive-amplitude-modulation atomic force microscopy: From vacuum to liquids
journal, January 2012

  • Jaafar, Miriam; Martínez-Martín, David; Cuenca, Mariano
  • Beilstein Journal of Nanotechnology, Vol. 3
  • DOI: 10.3762/bjnano.3.38

Quantitative analysis of effective height of probes in microwave impedance microscopy
journal, September 2016

  • Wei, Zhun; Ma, Eric Yue; Cui, Yong-Tao
  • Review of Scientific Instruments, Vol. 87, Issue 9
  • DOI: 10.1063/1.4962242

Calibration of shielded microwave probes using bulk dielectrics
journal, September 2008

  • Lai, K.; Kundhikanjana, W.; Kelly, M. A.
  • Applied Physics Letters, Vol. 93, Issue 12
  • DOI: 10.1063/1.2990638

Mobile metallic domain walls in an all-in-all-out magnetic insulator
journal, October 2015


Nanoscale Electric Permittivity of Single Bacterial Cells at Gigahertz Frequencies by Scanning Microwave Microscopy
journal, December 2015


Unexpected edge conduction in mercury telluride quantum wells under broken time-reversal symmetry
journal, May 2015

  • Ma, Eric Yue; Calvo, M. Reyes; Wang, Jing
  • Nature Communications, Vol. 6, Issue 1
  • DOI: 10.1038/ncomms8252

    Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.