Few‐Layer GeAs Field‐Effect Transistors and Infrared Photodetectors
Abstract
Abstract The family of 2D semiconductors (2DSCs) has grown rapidly since the first isolation of graphene. The emergence of each 2DSC material brings considerable excitement for its unique electrical, optical, and mechanical properties, which are often highly distinct from their 3D counterparts. To date, studies of 2DSC are majorly focused on group IV (e.g., graphene, silicene), group V (e.g., phosphorene), or group VIB compounds (transition metal dichalcogenides, TMD), and have inspired considerable effort in searching for novel 2DSCs. Here, the first electrical characterization of group IV–V compounds is presented by investigating few‐layer GeAs field‐effect transistors. With back‐gate device geometry, p‐type behaviors are observed at room temperature. Importantly, the hole carrier mobility is found to approach 100 cm 2 V −1 s −1 with ON–OFF ratio over 10 5 , comparable well with state‐of‐the‐art TMD devices. With the unique crystal structure the few‐layer GeAs show highly anisotropic optical and electronic properties (anisotropic mobility ratio of 4.8). Furthermore, GeAs based transistor shows prominent and rapid photoresponse to 1.6 µm radiation with a photoresponsivity of 6 A W −1 and a rise and fall time of ≈3 ms. This study of group IV–V 2DSC materials greatly expands the 2D family, and can enablemore »
- Authors:
-
- Department of Materials Science and Engineering University of California Los Angeles CA 90095 USA
- Department of Materials Science and Engineering University of California Los Angeles CA 90095 USA, Department of Chemistry Iowa State University, and Ames Laboratory Ames IA 50011 USA
- Department of Chemistry Iowa State University, and Ames Laboratory Ames IA 50011 USA
- Department of Chemistry and Biochemistry University of California Los Angeles CA 90095 USA
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1431136
- Grant/Contract Number:
- DE‐SC0008931
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Advanced Materials
- Additional Journal Information:
- Journal Name: Advanced Materials Journal Volume: 30 Journal Issue: 21; Journal ID: ISSN 0935-9648
- Publisher:
- Wiley Blackwell (John Wiley & Sons)
- Country of Publication:
- Germany
- Language:
- English
Citation Formats
Guo, Jian, Liu, Yuan, Ma, Yue, Zhu, Enbo, Lee, Shannon, Lu, Zixuan, Zhao, Zipeng, Xu, Changhao, Lee, Sung‐Joon, Wu, Hao, Kovnir, Kirill, Huang, Yu, and Duan, Xiangfeng. Few‐Layer GeAs Field‐Effect Transistors and Infrared Photodetectors. Germany: N. p., 2018.
Web. doi:10.1002/adma.201705934.
Guo, Jian, Liu, Yuan, Ma, Yue, Zhu, Enbo, Lee, Shannon, Lu, Zixuan, Zhao, Zipeng, Xu, Changhao, Lee, Sung‐Joon, Wu, Hao, Kovnir, Kirill, Huang, Yu, & Duan, Xiangfeng. Few‐Layer GeAs Field‐Effect Transistors and Infrared Photodetectors. Germany. https://doi.org/10.1002/adma.201705934
Guo, Jian, Liu, Yuan, Ma, Yue, Zhu, Enbo, Lee, Shannon, Lu, Zixuan, Zhao, Zipeng, Xu, Changhao, Lee, Sung‐Joon, Wu, Hao, Kovnir, Kirill, Huang, Yu, and Duan, Xiangfeng. Mon .
"Few‐Layer GeAs Field‐Effect Transistors and Infrared Photodetectors". Germany. https://doi.org/10.1002/adma.201705934.
@article{osti_1431136,
title = {Few‐Layer GeAs Field‐Effect Transistors and Infrared Photodetectors},
author = {Guo, Jian and Liu, Yuan and Ma, Yue and Zhu, Enbo and Lee, Shannon and Lu, Zixuan and Zhao, Zipeng and Xu, Changhao and Lee, Sung‐Joon and Wu, Hao and Kovnir, Kirill and Huang, Yu and Duan, Xiangfeng},
abstractNote = {Abstract The family of 2D semiconductors (2DSCs) has grown rapidly since the first isolation of graphene. The emergence of each 2DSC material brings considerable excitement for its unique electrical, optical, and mechanical properties, which are often highly distinct from their 3D counterparts. To date, studies of 2DSC are majorly focused on group IV (e.g., graphene, silicene), group V (e.g., phosphorene), or group VIB compounds (transition metal dichalcogenides, TMD), and have inspired considerable effort in searching for novel 2DSCs. Here, the first electrical characterization of group IV–V compounds is presented by investigating few‐layer GeAs field‐effect transistors. With back‐gate device geometry, p‐type behaviors are observed at room temperature. Importantly, the hole carrier mobility is found to approach 100 cm 2 V −1 s −1 with ON–OFF ratio over 10 5 , comparable well with state‐of‐the‐art TMD devices. With the unique crystal structure the few‐layer GeAs show highly anisotropic optical and electronic properties (anisotropic mobility ratio of 4.8). Furthermore, GeAs based transistor shows prominent and rapid photoresponse to 1.6 µm radiation with a photoresponsivity of 6 A W −1 and a rise and fall time of ≈3 ms. This study of group IV–V 2DSC materials greatly expands the 2D family, and can enable new opportunities in functional electronics and optoelectronics based on 2DSCs.},
doi = {10.1002/adma.201705934},
journal = {Advanced Materials},
number = 21,
volume = 30,
place = {Germany},
year = {Mon Apr 02 00:00:00 EDT 2018},
month = {Mon Apr 02 00:00:00 EDT 2018}
}
https://doi.org/10.1002/adma.201705934
Web of Science
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