# Plasma Parameters From Reentry Signal Attenuation

## Abstract

This study presents the application of a theoretically developed method that provides plasma parameter solution space information from measured RF attenuation that occurs during reentry. The purpose is to provide reentry plasma parameter information from the communication signal attenuation. The theoretical development centers around the attenuation and the complex index of refraction. The methodology uses an imaginary index of the refraction matching algorithm with a tolerance to find suitable solutions that satisfy the theory. The imaginary matching terms are then used to determine the real index of refraction resulting in the complex index of refraction. Then a filter is used to reject nonphysical solutions. Signal attenuation-based plasma parameter properties investigated include the complex index of refraction, plasma frequency, electron density, collision frequency, propagation constant, attenuation constant, phase constant, complex plasma conductivity, and electron mobility. RF plasma thickness attenuation is investigated and compared to the literature. Finally, similar plasma thickness for a specific signal attenuation can have different plasma properties.

- Authors:

- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

- Publication Date:

- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)

- OSTI Identifier:
- 1429753

- Report Number(s):
- SAND2017-3118J

Journal ID: ISSN 0093-3813; 651984

- Grant/Contract Number:
- AC04-94AL85000; NA0003525

- Resource Type:
- Accepted Manuscript

- Journal Name:
- IEEE Transactions on Plasma Science

- Additional Journal Information:
- Journal Volume: 46; Journal Issue: 3; Journal ID: ISSN 0093-3813

- Publisher:
- IEEE

- Country of Publication:
- United States

- Language:
- English

- Subject:
- 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; attenuation; electromagnetic propagation in plasma media; plasma properties; refraction

### Citation Formats

```
Statom, T. K. Plasma Parameters From Reentry Signal Attenuation. United States: N. p., 2018.
Web. doi:10.1109/TPS.2018.2801721.
```

```
Statom, T. K. Plasma Parameters From Reentry Signal Attenuation. United States. doi:10.1109/TPS.2018.2801721.
```

```
Statom, T. K. Tue .
"Plasma Parameters From Reentry Signal Attenuation". United States. doi:10.1109/TPS.2018.2801721. https://www.osti.gov/servlets/purl/1429753.
```

```
@article{osti_1429753,
```

title = {Plasma Parameters From Reentry Signal Attenuation},

author = {Statom, T. K.},

abstractNote = {This study presents the application of a theoretically developed method that provides plasma parameter solution space information from measured RF attenuation that occurs during reentry. The purpose is to provide reentry plasma parameter information from the communication signal attenuation. The theoretical development centers around the attenuation and the complex index of refraction. The methodology uses an imaginary index of the refraction matching algorithm with a tolerance to find suitable solutions that satisfy the theory. The imaginary matching terms are then used to determine the real index of refraction resulting in the complex index of refraction. Then a filter is used to reject nonphysical solutions. Signal attenuation-based plasma parameter properties investigated include the complex index of refraction, plasma frequency, electron density, collision frequency, propagation constant, attenuation constant, phase constant, complex plasma conductivity, and electron mobility. RF plasma thickness attenuation is investigated and compared to the literature. Finally, similar plasma thickness for a specific signal attenuation can have different plasma properties.},

doi = {10.1109/TPS.2018.2801721},

journal = {IEEE Transactions on Plasma Science},

number = 3,

volume = 46,

place = {United States},

year = {2018},

month = {2}

}

#### Figures / Tables:

*Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.*