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Title: Analysis of TPA Pulsed-Laser-Induced Single-Event Latchup Sensitive-Area

Abstract

Two-photon absorption (TPA) testing is employed to analyze the laser-induced latchup sensitive-volume (SV) of a specially designed test structure. This method takes into account the existence of an onset region in which the probability of triggering latchup transitions from zero to one as the laser pulse energy increases. This variability is attributed to pulse-to-pulse variability, uncertainty in measurement of the pulse energy, and variation in local carrier density and temperature. For each spatial position, the latchup probability associated with a given energy is calculated from multiple pulses. The latchup probability data are well-described by a Weibull distribution. The results show that the area between p-n-p-n cell structures is more sensitive than the p+ and n+ source areas, and locations far from the well contacts are more sensitive than those near the contact region. The transition from low probability of latchup to high probability is more abrupt near the source contacts than it is for the surrounding areas.

Authors:
ORCiD logo [1]; ORCiD logo [1];  [1]; ORCiD logo [1];  [2];  [3]; ORCiD logo [1];  [1]; ORCiD logo [1]
  1. Vanderbilt Univ., Nashville, TN (United States)
  2. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
  3. Jazz Zemiconductor Trusted Foundry, Newport Beach, CA (United States)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1429707
Report Number(s):
SAND-2017-13234J
Journal ID: ISSN 0018-9499; 659386; TRN: US1802743
Grant/Contract Number:  
AC04-94AL85000
Resource Type:
Accepted Manuscript
Journal Name:
IEEE Transactions on Nuclear Science
Additional Journal Information:
Journal Volume: 65; Journal Issue: 1; Journal ID: ISSN 0018-9499
Publisher:
IEEE
Country of Publication:
United States
Language:
English
Subject:
73 NUCLEAR PHYSICS AND RADIATION PHYSICS

Citation Formats

Wang, Peng, Sternberg, Andrew L., Kozub, John A., Zhang, En Xia, Dodds, Nathaniel A., Jordan, Scott L., Fleetwood, Daniel M., Reed, Robert A., and Schrimpf, Ronald D. Analysis of TPA Pulsed-Laser-Induced Single-Event Latchup Sensitive-Area. United States: N. p., 2017. Web. doi:10.1109/TNS.2017.2781199.
Wang, Peng, Sternberg, Andrew L., Kozub, John A., Zhang, En Xia, Dodds, Nathaniel A., Jordan, Scott L., Fleetwood, Daniel M., Reed, Robert A., & Schrimpf, Ronald D. Analysis of TPA Pulsed-Laser-Induced Single-Event Latchup Sensitive-Area. United States. doi:10.1109/TNS.2017.2781199.
Wang, Peng, Sternberg, Andrew L., Kozub, John A., Zhang, En Xia, Dodds, Nathaniel A., Jordan, Scott L., Fleetwood, Daniel M., Reed, Robert A., and Schrimpf, Ronald D. Thu . "Analysis of TPA Pulsed-Laser-Induced Single-Event Latchup Sensitive-Area". United States. doi:10.1109/TNS.2017.2781199. https://www.osti.gov/servlets/purl/1429707.
@article{osti_1429707,
title = {Analysis of TPA Pulsed-Laser-Induced Single-Event Latchup Sensitive-Area},
author = {Wang, Peng and Sternberg, Andrew L. and Kozub, John A. and Zhang, En Xia and Dodds, Nathaniel A. and Jordan, Scott L. and Fleetwood, Daniel M. and Reed, Robert A. and Schrimpf, Ronald D.},
abstractNote = {Two-photon absorption (TPA) testing is employed to analyze the laser-induced latchup sensitive-volume (SV) of a specially designed test structure. This method takes into account the existence of an onset region in which the probability of triggering latchup transitions from zero to one as the laser pulse energy increases. This variability is attributed to pulse-to-pulse variability, uncertainty in measurement of the pulse energy, and variation in local carrier density and temperature. For each spatial position, the latchup probability associated with a given energy is calculated from multiple pulses. The latchup probability data are well-described by a Weibull distribution. The results show that the area between p-n-p-n cell structures is more sensitive than the p+ and n+ source areas, and locations far from the well contacts are more sensitive than those near the contact region. The transition from low probability of latchup to high probability is more abrupt near the source contacts than it is for the surrounding areas.},
doi = {10.1109/TNS.2017.2781199},
journal = {IEEE Transactions on Nuclear Science},
number = 1,
volume = 65,
place = {United States},
year = {2017},
month = {12}
}

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