CONTIN XPCS: software for inverse transform analysis of X-ray photon correlation spectroscopy dynamics

Journal Article · 01 February 2018 · Journal of Applied Crystallography (Online)

DOI: https://doi.org/10.1107/S1600576717017113 · OSTI ID:1429091

Andrews, Ross N. ^[1]; Narayanan, Suresh ^[1]; Zhang, Fan ^[2]; Kuzmenko, Ivan ^[1]; Ilavsky, Jan ^[1]

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1. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
2. National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States). Materials Measurement Science Division

X-ray photon correlation spectroscopy (XPCS) and dynamic light scattering (DLS) reveal materials dynamics using coherent scattering, with XPCS permitting the investigation of dynamics in a more diverse array of materials than DLS. Heterogeneous dynamics occur in many material systems. The authors' recent work has shown how classic tools employed in the DLS analysis of heterogeneous dynamics can be extended to XPCS, revealing additional information that conventional Kohlrausch exponential fitting obscures. The present work describes the software implementation of inverse transform analysis of XPCS data. This software, calledCONTIN XPCS, is an extension of traditionalCONTINanalysis and accommodates the various dynamics encountered in equilibrium XPCS measurements.

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL (United States)
• Sponsoring Organization: USDOE Office of Energy Efficiency and Renewable Energy (EERE), Vehicle Technologies Office (EE-3V); USDOE Office of Science (SC)
• Grant/Contract Number: AC02-06CH11357
• OSTI ID: 1429091
• Journal Information: Journal of Applied Crystallography (Online), Journal Name: Journal of Applied Crystallography (Online) Journal Issue: 1 Vol. 51; ISSN 1600-5767; ISSN JACGAR
• Publisher: International Union of CrystallographyCopyright Statement
• Country of Publication: United States
• Language: English