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This content will become publicly available on March 20, 2019

Title: Visible-blind and solar-blind detection induced by defects in AlGaN high electron mobility transistors

Authors:
ORCiD logo [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ; ORCiD logo [1] ;  [1]
  1. Sandia National Laboratories, Albuquerque, New Mexico 87185, USA
Publication Date:
Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 123; Journal Issue: 11; Related Information: CHORUS Timestamp: 2018-03-20 12:15:59; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1427323