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Title: High-energy-resolution diced spherical quartz analyzers for resonant inelastic X-ray scattering

Abstract

A novel diced spherical quartz analyzer for use in resonant inelastic X-ray scattering (RIXS) is introduced, achieving an unprecedented energy resolution of 10.53 meV at the IrL3absorption edge (11.215 keV). In this work the fabrication process and the characterization of the analyzer are presented, and an example of a RIXS spectrum of magnetic excitations in a Sr3Ir2O7sample is shown.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]
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  1. Argonne National Lab. (ANL), Argonne, IL (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1427249
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 25; Journal Issue: 2; Journal ID: ISSN 1600-5775
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Said, Ayman H., Gog, Thomas, Wieczorek, Michael, Huang, XianRong, Casa, Diego, Kasman, Elina, Divan, Ralu, and Kim, Jung Ho. High-energy-resolution diced spherical quartz analyzers for resonant inelastic X-ray scattering. United States: N. p., 2018. Web. doi:10.1107/S1600577517018185.
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Said, Ayman H., Gog, Thomas, Wieczorek, Michael, Huang, XianRong, Casa, Diego, Kasman, Elina, Divan, Ralu, & Kim, Jung Ho. High-energy-resolution diced spherical quartz analyzers for resonant inelastic X-ray scattering. United States. https://doi.org/10.1107/S1600577517018185
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Said, Ayman H., Gog, Thomas, Wieczorek, Michael, Huang, XianRong, Casa, Diego, Kasman, Elina, Divan, Ralu, and Kim, Jung Ho. Thu . "High-energy-resolution diced spherical quartz analyzers for resonant inelastic X-ray scattering". United States. https://doi.org/10.1107/S1600577517018185. https://www.osti.gov/servlets/purl/1427249.
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@article{osti_1427249,
title = {High-energy-resolution diced spherical quartz analyzers for resonant inelastic X-ray scattering},
author = {Said, Ayman H. and Gog, Thomas and Wieczorek, Michael and Huang, XianRong and Casa, Diego and Kasman, Elina and Divan, Ralu and Kim, Jung Ho},
abstractNote = {A novel diced spherical quartz analyzer for use in resonant inelastic X-ray scattering (RIXS) is introduced, achieving an unprecedented energy resolution of 10.53 meV at the IrL3absorption edge (11.215 keV). In this work the fabrication process and the characterization of the analyzer are presented, and an example of a RIXS spectrum of magnetic excitations in a Sr3Ir2O7sample is shown.},
doi = {10.1107/S1600577517018185},
journal = {Journal of Synchrotron Radiation (Online)},
number = 2,
volume = 25,
place = {United States},
year = {2018},
month = {2}
}
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Journal Article:
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Publisher's Version of Record
https://doi.org/10.1107/S1600577517018185
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Cited by: 9 works
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Figures / Tables:

Fig. 1. Fig. 1. : Analyzer energy resolution for different crystal analyzer materials at the Ir L3 absorption edge (E=11.215 keV), the length of the dash marker for each reflection represents the relative integrated reflectivity. The analyzer energy resolution shown in the figure is approximated as ∆$E$$a$= $\sqrt{∆E^{2}_{i}$ + ∆E^{2}_{g}}$ , wheremore » ∆$E$$i$ and ∆$E$$g$ are the intrinsic and detector geometrical contributions respectively, the latter calculated for a 2 m diameter Rowland circle and a strip detector pitch of 50 µm. These contributions are described in more detail in earlier work (Gog et al., 2013).« less
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Works referenced in this record:

Resonant inelastic x-ray scattering studies of elementary excitations
journal, June 2011

  • Ament, Luuk J. P.; van Veenendaal, Michel; Devereaux, Thomas P.
  • Reviews of Modern Physics, Vol. 83, Issue 2
  • DOI: 10.1103/RevModPhys.83.705

Spherical analyzers and monochromators for resonant inelastic hard X-ray scattering: a compilation of crystals and reflections
journal, November 2012

  • Gog, Thomas; Casa, Diego M.; Said, Ayman H.
  • Journal of Synchrotron Radiation, Vol. 20, Issue 1
  • DOI: 10.1107/S0909049512043154

High-quality quartz single crystals for high-energy-resolution inelastic X-ray scattering analyzers
journal, June 2013

  • Hönnicke, Marcelo Goncalves; Huang, Xianrong; Cusatis, Cesar
  • Journal of Applied Crystallography, Vol. 46, Issue 4
  • DOI: 10.1107/S0021889813004731

Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K -edge
journal, June 2015

  • Ketenoglu, Didem; Harder, Manuel; Klementiev, Konstantin
  • Journal of Synchrotron Radiation, Vol. 22, Issue 4
  • DOI: 10.1107/S1600577515009686

X-Ray Backscattering on Perfect Crystals (2θ ≈ π)
journal, November 1990

Spherical bent focusing analyzer for high-resolution inelastic x-ray scattering
conference, December 1997

  • Schwoerer-Boehning, Markus; Abbamonte, Peter M.; Macrander, Albert T.
  • Optical Science, Engineering and Instrumentation '97, SPIE Proceedings
  • DOI: 10.1117/12.294487

MERIX—Next generation medium energy resolution inelastic X-ray scattering instrument at the APS
journal, June 2013

  • Shvyd’ko, Yu. V.; Hill, J. P.; Burns, C. A.
  • Journal of Electron Spectroscopy and Related Phenomena, Vol. 188
  • DOI: 10.1016/j.elspec.2012.09.003

Examination of Bragg backscattering from crystalline quartz
journal, December 2005

  • Sutter, John P.; Baron, Alfred Q. R.; Ishikawa, Tetsuya
  • Journal of Physics and Chemistry of Solids, Vol. 66, Issue 12
  • DOI: 10.1016/j.jpcs.2005.09.044

Nearly perfect large-area quartz: 4 meV resolution for 10 keV photons over 10 cm 2
journal, April 2006

  • Sutter, John P.; Baron, Alfred Q. R.; Miwa, Daigo
  • Journal of Synchrotron Radiation, Vol. 13, Issue 3
  • DOI: 10.1107/S0909049506003888

Sapphire analyzers for high-resolution X-ray spectroscopy
journal, November 2007

  • Yavaş, Hasan; Ercan Alp, E.; Sinn, Harald
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 582, Issue 1
  • DOI: 10.1016/j.nima.2007.08.095
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    Works referencing / citing this record:

    X-ray back-diffraction: can we further increase the energy resolution by tuning the energy slightly below that of exact backscattering?
    journal, October 2019

    • Hönnicke, Marcelo Goncalves; Cusatis, Cesar; Conley, Raymond
    • Journal of Applied Crystallography, Vol. 52, Issue 6
    • DOI: 10.1107/s1600576719012925

    Performance of quartz- and sapphire-based double-crystal high-resolution (∼10 meV) RIXS monochromators under varying power loads
    text, January 2018

    • Gog, Thomas; Casa, Diego M.; Knopp, Jonathan
    • Deutsches Elektronen-Synchrotron, DESY, Hamburg
    • DOI: 10.3204/pubdb-2019-00184
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      Figures / Tables found in this record:

      Fig. 1. (p. 4)figure
      Table 1 (p. 6)table
      Fig. 2. (p. 7)figure
      Fig. 3. (p. 8)figure
      Fig. 4. (p. 9)figure
      Fig. 5. (p. 12)figure
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