skip to main content
DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Effects of Stopping Ions and LET Fluctuations on Soft Error Rate Prediction.

Abstract

Variability in energy deposition from stopping ions and LET fluctuations is quantified for specific radiation environments. When compared to predictions using average LET via CREME96, LET fluctuations lead to an order-of-magnitude difference in effective flux and a nearly 4x decrease in predicted soft error rate (SER) in an example calculation performed on a commercial 65 nm SRAM. The large LET fluctuations reported here will be even greater for the smaller sensitive volumes that are characteristic of highly scaled technologies. End-of-range effects of stopping ions do not lead to significant inaccuracies in radiation environments with low solar activity unless the sensitivevolume thickness is 100 μm or greater. In contrast, end-of-range effects for stopping ions lead to significant inaccuracies for sensitive- volume thicknesses less than 10 μm in radiation environments with high solar activity.

Authors:
 [1];  [2];  [3];  [4];  [1];  [1];  [1];  [1];  [5];  [1];  [1];  [6]
  1. Vanderbilt Univ., Nashville, TN (United States)
  2. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
  3. Dynetics, Inc., Huntsville, AL (United States)
  4. Intel Corp, Santa Clara, CA (United States)
  5. National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)
  6. Texas Instruments Inc., Dallas, TX (United States)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1427234
Report Number(s):
SAND-2015-0718J
Journal ID: ISSN 0018-9499; 563556; TRN: US1802980
Grant/Contract Number:  
AC04-94AL85000
Resource Type:
Accepted Manuscript
Journal Name:
IEEE Transactions on Nuclear Science
Additional Journal Information:
Journal Volume: 62; Journal Issue: 5; Journal ID: ISSN 0018-9499
Publisher:
IEEE
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING

Citation Formats

Weeden-Wright, S. L., King, Michael Patrick, Hooten, N. C., Bennett, W. G., Sierawski, B. D., Schrimpf, R. D., Weller, R. A., Reed, R. A., Mendenhall, M. H., Fleetwood, D. M., Alles, M. L., and Baumann, R. C. Effects of Stopping Ions and LET Fluctuations on Soft Error Rate Prediction.. United States: N. p., 2015. Web. doi:10.1109/TNS.2015.2472296.
Weeden-Wright, S. L., King, Michael Patrick, Hooten, N. C., Bennett, W. G., Sierawski, B. D., Schrimpf, R. D., Weller, R. A., Reed, R. A., Mendenhall, M. H., Fleetwood, D. M., Alles, M. L., & Baumann, R. C. Effects of Stopping Ions and LET Fluctuations on Soft Error Rate Prediction.. United States. doi:10.1109/TNS.2015.2472296.
Weeden-Wright, S. L., King, Michael Patrick, Hooten, N. C., Bennett, W. G., Sierawski, B. D., Schrimpf, R. D., Weller, R. A., Reed, R. A., Mendenhall, M. H., Fleetwood, D. M., Alles, M. L., and Baumann, R. C. Sun . "Effects of Stopping Ions and LET Fluctuations on Soft Error Rate Prediction.". United States. doi:10.1109/TNS.2015.2472296. https://www.osti.gov/servlets/purl/1427234.
@article{osti_1427234,
title = {Effects of Stopping Ions and LET Fluctuations on Soft Error Rate Prediction.},
author = {Weeden-Wright, S. L. and King, Michael Patrick and Hooten, N. C. and Bennett, W. G. and Sierawski, B. D. and Schrimpf, R. D. and Weller, R. A. and Reed, R. A. and Mendenhall, M. H. and Fleetwood, D. M. and Alles, M. L. and Baumann, R. C.},
abstractNote = {Variability in energy deposition from stopping ions and LET fluctuations is quantified for specific radiation environments. When compared to predictions using average LET via CREME96, LET fluctuations lead to an order-of-magnitude difference in effective flux and a nearly 4x decrease in predicted soft error rate (SER) in an example calculation performed on a commercial 65 nm SRAM. The large LET fluctuations reported here will be even greater for the smaller sensitive volumes that are characteristic of highly scaled technologies. End-of-range effects of stopping ions do not lead to significant inaccuracies in radiation environments with low solar activity unless the sensitivevolume thickness is 100 μm or greater. In contrast, end-of-range effects for stopping ions lead to significant inaccuracies for sensitive- volume thicknesses less than 10 μm in radiation environments with high solar activity.},
doi = {10.1109/TNS.2015.2472296},
journal = {IEEE Transactions on Nuclear Science},
number = 5,
volume = 62,
place = {United States},
year = {2015},
month = {2}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Citation Metrics:
Cited by: 2 works
Citation information provided by
Web of Science

Save / Share: