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Title: Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors

Abstract

Plasma spectroscopy requires determination of spectral line intensities and widths. At Sandia National Laboratories Z facility we use elliptical crystal spectrometers equipped with gated microchannel plate detectors to record time and space resolved spectra. We collect a large volume of data typically consisting of five to six snapshots in time and five to ten spectral lines with 30 spatial elements per frame, totaling to more than 900 measurements per experiment. Also, this large volume of data requires efficiency in processing. We have addressed this challenge by using a line fitting routine to automatically fit each spectrum using assumed line profiles and taking into account photoelectron statistics to efficiently extract line intensities and widths with uncertainties. We verified that the random data noise obeys Poisson statistics. Rescale factors for converting film exposure to effective counts required for understanding the photoelectron statistics are presented. An example of the application of these results to the analysis of spectra recorded in Z experiments is presented in this paper.

Authors:
 [1];  [2];  [2];  [2];  [1]
  1. Ktech Corp., Albuquerque, NM (United States)
  2. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1427012
Report Number(s):
SAND2007-0241J
Journal ID: ISSN 0034-6748; 524295
Grant/Contract Number:  
AC04-94AL85000
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 78; Journal Issue: 6; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; x-ray spectra; luminescence; phosphors; photoluminescence; optical imaging; spatial resolution; optical metrology; plasma confinement; plasma devices; electromagnetic radiation detectors

Citation Formats

Dunham, Greg, Bailey, J. E., Rochau, G. A., Lake, P. W., and Nielsen-Weber, L. B. Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors. United States: N. p., 2007. Web. doi:10.1063/1.2748674.
Dunham, Greg, Bailey, J. E., Rochau, G. A., Lake, P. W., & Nielsen-Weber, L. B. Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors. United States. doi:10.1063/1.2748674.
Dunham, Greg, Bailey, J. E., Rochau, G. A., Lake, P. W., and Nielsen-Weber, L. B. Wed . "Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors". United States. doi:10.1063/1.2748674. https://www.osti.gov/servlets/purl/1427012.
@article{osti_1427012,
title = {Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors},
author = {Dunham, Greg and Bailey, J. E. and Rochau, G. A. and Lake, P. W. and Nielsen-Weber, L. B.},
abstractNote = {Plasma spectroscopy requires determination of spectral line intensities and widths. At Sandia National Laboratories Z facility we use elliptical crystal spectrometers equipped with gated microchannel plate detectors to record time and space resolved spectra. We collect a large volume of data typically consisting of five to six snapshots in time and five to ten spectral lines with 30 spatial elements per frame, totaling to more than 900 measurements per experiment. Also, this large volume of data requires efficiency in processing. We have addressed this challenge by using a line fitting routine to automatically fit each spectrum using assumed line profiles and taking into account photoelectron statistics to efficiently extract line intensities and widths with uncertainties. We verified that the random data noise obeys Poisson statistics. Rescale factors for converting film exposure to effective counts required for understanding the photoelectron statistics are presented. An example of the application of these results to the analysis of spectra recorded in Z experiments is presented in this paper.},
doi = {10.1063/1.2748674},
journal = {Review of Scientific Instruments},
number = 6,
volume = 78,
place = {United States},
year = {2007},
month = {6}
}

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Cited by: 5 works
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    Works referencing / citing this record:

    Diagnosis of x-ray heated Mg/Fe opacity research plasmas
    journal, November 2008

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    • Review of Scientific Instruments, Vol. 79, Issue 11
    • DOI: 10.1063/1.3020710