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Title: The Proposed Doppler Electron Velocimeter and the Need for Nanoscale Dynamics

Abstract

As engineering challenges grow in the ever-shrinking world of nano-design, methods of making dynamic measurements of nano-materials and systems become more important. The Doppler electron velocimeter (DEV) is a new measurement concept motivated by the increasing importance of nano-dynamics. Nano-dynamics is defined in this context as any phenomenon that causes a dynamically changing phase in an electron beam, and includes traditional mechanical motion, as well as additional phenomena including changing magnetic and electric fields. The DEV is only a theoretical device at this point. Lastly, this article highlights the importance of pursuing nano-dynamics and presents a case that the electron microscope and its associated optics are a viable test bed to develop this new measurement tool.

Authors:
 [1]
  1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1426944
Report Number(s):
SAND-2007-2241J
Journal ID: ISSN 1551-9295; 498626
Grant/Contract Number:  
AC04-94AL85000
Resource Type:
Accepted Manuscript
Journal Name:
Microscopy Today
Additional Journal Information:
Journal Volume: 15; Journal Issue: 3; Journal ID: ISSN 1551-9295
Publisher:
Cambridge University Press
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 42 ENGINEERING

Citation Formats

Reu, Phillip L. The Proposed Doppler Electron Velocimeter and the Need for Nanoscale Dynamics. United States: N. p., 2007. Web. doi:10.1017/S1551929500055504.
Reu, Phillip L. The Proposed Doppler Electron Velocimeter and the Need for Nanoscale Dynamics. United States. doi:10.1017/S1551929500055504.
Reu, Phillip L. Tue . "The Proposed Doppler Electron Velocimeter and the Need for Nanoscale Dynamics". United States. doi:10.1017/S1551929500055504. https://www.osti.gov/servlets/purl/1426944.
@article{osti_1426944,
title = {The Proposed Doppler Electron Velocimeter and the Need for Nanoscale Dynamics},
author = {Reu, Phillip L.},
abstractNote = {As engineering challenges grow in the ever-shrinking world of nano-design, methods of making dynamic measurements of nano-materials and systems become more important. The Doppler electron velocimeter (DEV) is a new measurement concept motivated by the increasing importance of nano-dynamics. Nano-dynamics is defined in this context as any phenomenon that causes a dynamically changing phase in an electron beam, and includes traditional mechanical motion, as well as additional phenomena including changing magnetic and electric fields. The DEV is only a theoretical device at this point. Lastly, this article highlights the importance of pursuing nano-dynamics and presents a case that the electron microscope and its associated optics are a viable test bed to develop this new measurement tool.},
doi = {10.1017/S1551929500055504},
journal = {Microscopy Today},
number = 3,
volume = 15,
place = {United States},
year = {2007},
month = {5}
}

Journal Article:
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