Generalized skewsymmetric interfacial probability distribution in reflectivity and smallangle scattering analysis
Generalized skewsymmetric probability density functions are proposed to model asymmetric interfacial density distributions for the parameterization of any arbitrary density profiles in the `effectivedensity model'. The penetration of the densities into adjacent layers can be selectively controlled and parameterized. A continuous density profile is generated and discretized into many independent slices of very thin thickness with constant density values and sharp interfaces. The discretized profile can be used to calculate reflectivities via Parratt's recursive formula, or smallangle scattering via the concentric onion model that is also developed in this work.
 Authors:

^{[1]};
^{[2]}
 Argonne National Lab. (ANL), Argonne, IL (United States)
 Argonne National Lab. (ANL), Argonne, IL (United States); Univ. of Chicago, IL (United States)
 Publication Date:
 Grant/Contract Number:
 AC0206CH11357
 Type:
 Accepted Manuscript
 Journal Name:
 Journal of Applied Crystallography (Online)
 Additional Journal Information:
 Journal Name: Journal of Applied Crystallography (Online); Journal Volume: 50; Journal Issue: 6; Journal ID: ISSN 16005767
 Publisher:
 International Union of Crystallography
 Research Org:
 Argonne National Lab. (ANL), Argonne, IL (United States)
 Sponsoring Org:
 USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC22). Scientific User Facilities Division
 Country of Publication:
 United States
 Language:
 English
 Subject:
 36 MATERIALS SCIENCE; Asymmetric interface; Form factor; Interface density profile; Reflectivity; Roughness; Smallangle scattering
 OSTI Identifier:
 1426781
Jiang, Zhang, and Chen, Wei. Generalized skewsymmetric interfacial probability distribution in reflectivity and smallangle scattering analysis. United States: N. p.,
Web. doi:10.1107/S1600576717013632.
Jiang, Zhang, & Chen, Wei. Generalized skewsymmetric interfacial probability distribution in reflectivity and smallangle scattering analysis. United States. doi:10.1107/S1600576717013632.
Jiang, Zhang, and Chen, Wei. 2017.
"Generalized skewsymmetric interfacial probability distribution in reflectivity and smallangle scattering analysis". United States.
doi:10.1107/S1600576717013632. https://www.osti.gov/servlets/purl/1426781.
@article{osti_1426781,
title = {Generalized skewsymmetric interfacial probability distribution in reflectivity and smallangle scattering analysis},
author = {Jiang, Zhang and Chen, Wei},
abstractNote = {Generalized skewsymmetric probability density functions are proposed to model asymmetric interfacial density distributions for the parameterization of any arbitrary density profiles in the `effectivedensity model'. The penetration of the densities into adjacent layers can be selectively controlled and parameterized. A continuous density profile is generated and discretized into many independent slices of very thin thickness with constant density values and sharp interfaces. The discretized profile can be used to calculate reflectivities via Parratt's recursive formula, or smallangle scattering via the concentric onion model that is also developed in this work.},
doi = {10.1107/S1600576717013632},
journal = {Journal of Applied Crystallography (Online)},
number = 6,
volume = 50,
place = {United States},
year = {2017},
month = {11}
}