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Title: Thermal x-ray diffraction and near-field phase contrast imaging

Abstract

Using higher-order coherence of thermal light sources, the resolution power of standard x-ray imaging techniques can be enhanced. Here in this work, we applied the higher-order measurement to far-field x-ray diffraction and near-field phase contrast imaging (PCI), in order to achieve superresolution in x-ray diffraction and obtain enhanced intensity contrast in PCI. The cost of implementing such schemes is minimal compared to the methods that achieve similar effects by using entangled x-ray photon pairs.

Authors:
 [1];  [2];  [3];  [4];  [5];  [6];  [7]
  1. SLAC National Accelerator Lab., Menlo Park, CA (United States); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany). Center for Free-Electron Laser Science; Max Planck Inst. for the Structure and Dynamics of Matter, Hamburg (Germany)
  2. Univ. Erlangen-Nurnberg, Erlangen (Germany). Inst. fur Optik, Information und Photonik, and Erlangen Graduate School in Advanced Optical Technologies (SAOT)
  3. Texas A & M Univ., College Station, TX (United States). Inst. for Quantum Science and Engineering
  4. Academy of Sciences of the Czech Republic (ASCR), Prague (Czech Republic). Inst. of Physics and Inst. of Plasma Physics
  5. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany). Center for Free-Electron Laser Science
  6. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany). Center for Free-Electron Laser Science; Univ. of Hamburg (Germany). Dept. of Physics; Hamburg Centre for Ultrafast Imaging, Hamburg (Germany)
  7. Univ. of Maryland, Baltimore, MD (United States). Dept. of Physics
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE; Volkswagen Foundation; Czech Ministry of Education
OSTI Identifier:
1425347
Grant/Contract Number:  
AC02-76SF00515; LG15013; LM2015083
Resource Type:
Accepted Manuscript
Journal Name:
Europhysics Letters
Additional Journal Information:
Journal Volume: 120; Journal Issue: 1; Journal ID: ISSN 0295-5075
Publisher:
IOP Publishing
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 47 OTHER INSTRUMENTATION

Citation Formats

Li, Zheng, Classen, Anton, Peng, Tao, Medvedev, Nikita, Wang, Fenglin, Chapman, Henry N., and Shih, Yanhua. Thermal x-ray diffraction and near-field phase contrast imaging. United States: N. p., 2017. Web. doi:10.1209/0295-5075/120/16003.
Li, Zheng, Classen, Anton, Peng, Tao, Medvedev, Nikita, Wang, Fenglin, Chapman, Henry N., & Shih, Yanhua. Thermal x-ray diffraction and near-field phase contrast imaging. United States. doi:10.1209/0295-5075/120/16003.
Li, Zheng, Classen, Anton, Peng, Tao, Medvedev, Nikita, Wang, Fenglin, Chapman, Henry N., and Shih, Yanhua. Wed . "Thermal x-ray diffraction and near-field phase contrast imaging". United States. doi:10.1209/0295-5075/120/16003. https://www.osti.gov/servlets/purl/1425347.
@article{osti_1425347,
title = {Thermal x-ray diffraction and near-field phase contrast imaging},
author = {Li, Zheng and Classen, Anton and Peng, Tao and Medvedev, Nikita and Wang, Fenglin and Chapman, Henry N. and Shih, Yanhua},
abstractNote = {Using higher-order coherence of thermal light sources, the resolution power of standard x-ray imaging techniques can be enhanced. Here in this work, we applied the higher-order measurement to far-field x-ray diffraction and near-field phase contrast imaging (PCI), in order to achieve superresolution in x-ray diffraction and obtain enhanced intensity contrast in PCI. The cost of implementing such schemes is minimal compared to the methods that achieve similar effects by using entangled x-ray photon pairs.},
doi = {10.1209/0295-5075/120/16003},
journal = {Europhysics Letters},
number = 1,
volume = 120,
place = {United States},
year = {2017},
month = {12}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Figures / Tables:

Figure 1 Figure 1: Schematic description of the proposed setup for xray diffraction using two-photon interference. Photons from a thermal light source reflect from a crystal. The reflected light is divided by a beam splitter (BS) and detected jointly by two pixel detectors DA and DB . $z_a$ is the distance betweenmore » the source and lattice plane, θ is the reflection angle. LA and LB are distances from the lattice plane to the planes of pixel detectors DA and DB. $\vec{\rho}_s$ is a vector on the source plane, $\vec{\rho}_a$ is a vector on the lattice plane, $\vec{\rho}_A$ and $\vec{\rho}_B$ are vectors on the detector planes.« less

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Works referencing / citing this record:

Thermal x-ray diffraction and near-field phase contrast imaging
text, January 2017


    Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.