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Title: Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications

Abstract

Quartz has hundreds of strong Bragg reflections that may offer a great number of choices for making fixed-angle X-ray analyzers and polarizers at virtually any hard X-ray energies with selectable resolution. However, quartz crystals, unlike silicon and germanium, are chiral and may thus appear in two different forms of handedness that are mirror images. Furthermore, because of the threefold rotational symmetry along thecaxis, the {h1h2h3L} and {h2h1h3L} Bragg reflections may have quite different Darwin bandwidth, reflectivity and angular acceptance, although they have the same Bragg angle. The design of X-ray optics from quartz crystals therefore requires unambiguous determination of the orientation, handedness and polarity of the crystals. The Laue method and single-axis diffraction technique can provide such information, but the variety of conventions used in the literature to describe quartz structures has caused widespread confusion. The current studies give detailed guidelines for design and fabrication of quartz X-ray optics, with special emphasis on the correct interpretation of Laue patterns in terms of the crystallography and diffraction properties of quartz. Furthermore, the quartz crystals examined were confirmed by X-ray topography to have acceptably low densities of dislocations and other defects, which is the foundation for developing high-resolution quartz-based X-ray optics.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1]; ORCiD logo [1];  [2];  [1]
  1. Argonne National Lab. (ANL), Argonne, IL (United States)
  2. Univ. Federal da Integracao Latino-Americana, Parana (Brazil)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1421955
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Applied Crystallography (Online)
Additional Journal Information:
Journal Name: Journal of Applied Crystallography (Online); Journal Volume: 51; Journal Issue: 1; Journal ID: ISSN 1600-5767
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; Bragg reflection; Darwin bandwidth; X-ray analyzers; X-ray optics; quartz

Citation Formats

Huang, Xian -Rong, Gog, Thomas, Kim, Jungho, Kasman, Elina, Said, Ayman H., Casa, Diego M., Wieczorek, Michael, Honnicke, Marcelo G., and Assoufid, Lahsen. Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications. United States: N. p., 2018. Web. https://doi.org/10.1107/S1600576717018155.
Huang, Xian -Rong, Gog, Thomas, Kim, Jungho, Kasman, Elina, Said, Ayman H., Casa, Diego M., Wieczorek, Michael, Honnicke, Marcelo G., & Assoufid, Lahsen. Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications. United States. https://doi.org/10.1107/S1600576717018155
Huang, Xian -Rong, Gog, Thomas, Kim, Jungho, Kasman, Elina, Said, Ayman H., Casa, Diego M., Wieczorek, Michael, Honnicke, Marcelo G., and Assoufid, Lahsen. Thu . "Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications". United States. https://doi.org/10.1107/S1600576717018155. https://www.osti.gov/servlets/purl/1421955.
@article{osti_1421955,
title = {Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications},
author = {Huang, Xian -Rong and Gog, Thomas and Kim, Jungho and Kasman, Elina and Said, Ayman H. and Casa, Diego M. and Wieczorek, Michael and Honnicke, Marcelo G. and Assoufid, Lahsen},
abstractNote = {Quartz has hundreds of strong Bragg reflections that may offer a great number of choices for making fixed-angle X-ray analyzers and polarizers at virtually any hard X-ray energies with selectable resolution. However, quartz crystals, unlike silicon and germanium, are chiral and may thus appear in two different forms of handedness that are mirror images. Furthermore, because of the threefold rotational symmetry along thecaxis, the {h1h2h3L} and {h2h1h3L} Bragg reflections may have quite different Darwin bandwidth, reflectivity and angular acceptance, although they have the same Bragg angle. The design of X-ray optics from quartz crystals therefore requires unambiguous determination of the orientation, handedness and polarity of the crystals. The Laue method and single-axis diffraction technique can provide such information, but the variety of conventions used in the literature to describe quartz structures has caused widespread confusion. The current studies give detailed guidelines for design and fabrication of quartz X-ray optics, with special emphasis on the correct interpretation of Laue patterns in terms of the crystallography and diffraction properties of quartz. Furthermore, the quartz crystals examined were confirmed by X-ray topography to have acceptably low densities of dislocations and other defects, which is the foundation for developing high-resolution quartz-based X-ray optics.},
doi = {10.1107/S1600576717018155},
journal = {Journal of Applied Crystallography (Online)},
number = 1,
volume = 51,
place = {United States},
year = {2018},
month = {2}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Citation Metrics:
Cited by: 5 works
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Figures / Tables:

Table 1 Table 1: Equivalent lattice planes of {h1 h2 h3 L} and {h2 h1 h3 L} for α-quartz

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Works referenced in this record:

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Resonant inelastic x-ray scattering studies of elementary excitations
journal, June 2011

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  • Reviews of Modern Physics, Vol. 83, Issue 2
  • DOI: 10.1103/RevModPhys.83.705

The vicissitudes of the low-quartz crystal setting or the pitfalls of enantiomorphism
journal, July 1978


Spherical analyzers and monochromators for resonant inelastic hard X-ray scattering: a compilation of crystals and reflections
journal, November 2012

  • Gog, Thomas; Casa, Diego M.; Said, Ayman H.
  • Journal of Synchrotron Radiation, Vol. 20, Issue 1
  • DOI: 10.1107/S0909049512043154

Construction of a quartz spherical analyzer: application to high-resolution analysis of the Ni K α emission spectrum
journal, August 2016

  • Honnicke, Marcelo Goncalves; Bianco, Leonardo M.; Ceppi, Sergio A.
  • Journal of Applied Crystallography, Vol. 49, Issue 5
  • DOI: 10.1107/S1600576716010633

High-quality quartz single crystals for high-energy-resolution inelastic X-ray scattering analyzers
journal, June 2013

  • Hönnicke, Marcelo Goncalves; Huang, Xianrong; Cusatis, Cesar
  • Journal of Applied Crystallography, Vol. 46, Issue 4
  • DOI: 10.1107/S0021889813004731

Continuous X-ray multiple-beam diffraction with primary Bragg angle from 0 to 90°
journal, September 2014

  • Huang, Xian-Rong; Jia, Quanjie; Wieczorek, Michael
  • Journal of Applied Crystallography, Vol. 47, Issue 5
  • DOI: 10.1107/S160057671401930X

Inelastic X-ray scattering with 0.75 meV resolution at 25.7 keV using a temperature-gradient analyzer
journal, January 2015

  • Ishikawa, Daisuke; Ellis, David S.; Uchiyama, Hiroshi
  • Journal of Synchrotron Radiation, Vol. 22, Issue 1
  • DOI: 10.1107/S1600577514021006

Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K -edge
journal, June 2015

  • Ketenoglu, Didem; Harder, Manuel; Klementiev, Konstantin
  • Journal of Synchrotron Radiation, Vol. 22, Issue 4
  • DOI: 10.1107/S1600577515009686

Refinement of the crystal structure of low-quartz
journal, August 1976

  • Le Page, Y.; Donnay, G.
  • Acta Crystallographica Section B Structural Crystallography and Crystal Chemistry, Vol. 32, Issue 8
  • DOI: 10.1107/S0567740876007966

An inelastic X-ray spectrometer with 2.2meV energy resolution
journal, July 2001

  • Sinn, H.; Alp, E. E.; Alatas, A.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 467-468
  • DOI: 10.1016/S0168-9002(01)00755-0

Multiple-beam x-ray diffraction near exact backscattering in silicon
journal, January 2001


Nearly perfect large-area quartz: 4 meV resolution for 10 keV photons over 10 cm 2
journal, April 2006

  • Sutter, John P.; Baron, Alfred Q. R.; Miwa, Daigo
  • Journal of Synchrotron Radiation, Vol. 13, Issue 3
  • DOI: 10.1107/S0909049506003888

On the Right- and Left-Handedness of Quartz and Its Relation to Elastic and Other Properties
journal, September 1940


    Works referencing / citing this record:

    X-ray back-diffraction: can we further increase the energy resolution by tuning the energy slightly below that of exact backscattering?
    journal, October 2019

    • Hönnicke, Marcelo Goncalves; Cusatis, Cesar; Conley, Raymond
    • Journal of Applied Crystallography, Vol. 52, Issue 6
    • DOI: 10.1107/s1600576719012925

    Confusion over the description of the quartz structure yet again
    journal, April 2018


    Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications. Corrigendum
    journal, April 2018

    • Huang, Xian-Rong; Gog, Thomas; Kim, Jungho
    • Journal of Applied Crystallography, Vol. 51, Issue 3
    • DOI: 10.1107/s1600576718004363

    On evaluating x-ray imaging crystals with synchrotron radiation
    journal, October 2018

    • Pereira, N. R.; Macrander, A. T.; Stoeckl, C.
    • Review of Scientific Instruments, Vol. 89, Issue 10
    • DOI: 10.1063/1.5045569

    Modeling of energy-dispersive X-ray diffraction for high-symmetry crystal orientation
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    • Dragoi, Danut; Dragoi, Alexandru
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    • DOI: 10.1107/s2053273318013864

      Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.