Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications

Huang, Xian -Rong; Gog, Thomas; Kim, Jungho; Kasman, Elina; Said, Ayman H.; Casa, Diego M.; Wieczorek, Michael; Honnicke, Marcelo G.; Assoufid, Lahsen

doi:10.1107/S1600576717018155

Title: Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications

Journal Article · 01 February 2018 · Journal of Applied Crystallography (Online)

DOI: https://doi.org/10.1107/S1600576717018155 · OSTI ID:1421955

Huang, Xian -Rong ^[1]; Gog, Thomas ^[1]; Kim, Jungho ^[1]; Kasman, Elina ^[1]; Said, Ayman H. ^[1]; Casa, Diego M. ^[1];

^[1]; Honnicke, Marcelo G. ^[2]; Assoufid, Lahsen ^[1]

Argonne National Lab. (ANL), Argonne, IL (United States)
Univ. Federal da Integracao Latino-Americana, Parana (Brazil)

Quartz has hundreds of strong Bragg reflections that may offer a great number of choices for making fixed-angle X-ray analyzers and polarizers at virtually any hard X-ray energies with selectable resolution. However, quartz crystals, unlike silicon and germanium, are chiral and may thus appear in two different forms of handedness that are mirror images. Furthermore, because of the threefold rotational symmetry along thecaxis, the {h₁h₂h₃L} and {h₂h₁h₃L} Bragg reflections may have quite different Darwin bandwidth, reflectivity and angular acceptance, although they have the same Bragg angle. The design of X-ray optics from quartz crystals therefore requires unambiguous determination of the orientation, handedness and polarity of the crystals. The Laue method and single-axis diffraction technique can provide such information, but the variety of conventions used in the literature to describe quartz structures has caused widespread confusion. The current studies give detailed guidelines for design and fabrication of quartz X-ray optics, with special emphasis on the correct interpretation of Laue patterns in terms of the crystallography and diffraction properties of quartz. Furthermore, the quartz crystals examined were confirmed by X-ray topography to have acceptably low densities of dislocations and other defects, which is the foundation for developing high-resolution quartz-based X-ray optics.

View Accepted Manuscript (DOE)

Cite

Export

Save

Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC02-06CH11357

OSTI ID:: 1421955

Journal Information:: Journal of Applied Crystallography (Online), Vol. 51, Issue 1; ISSN 1600-5767

Publisher:: International Union of CrystallographyCopyright Statement

Country of Publication:: United States

Language:: English

Citation Metrics:

Cited by: 10 works

Citation information provided by
Web of Science

References (24)

Examination of Bragg backscattering from crystalline quartz Sutter, John P.; Baron, Alfred Q. R.; Ishikawa, Tetsuya Journal of Physics and Chemistry of Solids, Vol. 66, Issue 12 https://doi.org/10.1016/j.jpcs.2005.09.044	journal	December 2005
The vicissitudes of the low-quartz crystal setting or the pitfalls of enantiomorphism Donnay, J. D. H.; Le Page, Y. Acta Crystallographica Section A, Vol. 34, Issue 4 https://doi.org/10.1107/s0567739478001242	journal	July 1978
Status of XOP: an x-ray optics software toolkit Sanchez del Rio, Manuel; Dejus, Roger J. Optical Science and Technology, the SPIE 49th Annual Meeting, SPIE Proceedings https://doi.org/10.1117/12.560903	conference	October 2004
Connection between lattice deformation and coloration pattern in synthetic quartz monocrystals Härtwig, J.; Dietrich, B.; Bötger, R. Physica Status Solidi (a), Vol. 43, Issue 2 https://doi.org/10.1002/pssa.2210430248	journal	October 1977
Observation of Inelastic X-Ray Scattering from Phonons Burkel, E.; Peisl, J.; Dorner, B. Europhysics Letters (EPL), Vol. 3, Issue 8 https://doi.org/10.1209/0295-5075/3/8/015	journal	April 1987
Excitonic quasiparticles in a spin–orbit Mott insulator Kim, Jungho; Daghofer, M.; Said, A. H. Nature Communications, Vol. 5, Issue 1 https://doi.org/10.1038/ncomms5453	journal	July 2014
Determination of the Absolute Configuration of α-Quartz De Vries, A. Nature, Vol. 181, Issue 4617 https://doi.org/10.1038/1811193a0	journal	April 1958
On the Right- and Left-Handedness of Quartz and Its Relation to Elastic and Other Properties Van Dyke, K. S. Proceedings of the IRE, Vol. 28, Issue 9 https://doi.org/10.1109/jrproc.1940.229379	journal	September 1940
Parameter variation in low-quartz between 94 and 298K Le Page, Y.; Calvert, L. D.; Gabe, E. J. Journal of Physics and Chemistry of Solids, Vol. 41, Issue 7 https://doi.org/10.1016/0022-3697(80)90078-5	journal	January 1980
Construction of a quartz spherical analyzer: application to high-resolution analysis of the Ni K α emission spectrum Honnicke, Marcelo Goncalves; Bianco, Leonardo M.; Ceppi, Sergio A. Journal of Applied Crystallography, Vol. 49, Issue 5 https://doi.org/10.1107/s1600576716010633	journal	August 2016
Dislocations and Fault Surfaces in Synthetic Quartz Lang, A. R.; Miuscov, V. F. Journal of Applied Physics, Vol. 38, Issue 6 https://doi.org/10.1063/1.1709932	journal	May 1967
High energy-resolution set-up for Ir L3 edge RIXS experiments Moretti Sala, M.; Henriquet, C.; Simonelli, L. Journal of Electron Spectroscopy and Related Phenomena, Vol. 188 https://doi.org/10.1016/j.elspec.2012.08.002	journal	June 2013
Resonant inelastic x-ray scattering studies of elementary excitations Ament, Luuk J. P.; van Veenendaal, Michel; Devereaux, Thomas P. Reviews of Modern Physics, Vol. 83, Issue 2 https://doi.org/10.1103/RevModPhys.83.705	journal	June 2011
Spherical analyzers and monochromators for resonant inelastic hard X-ray scattering: a compilation of crystals and reflections Gog, Thomas; Casa, Diego M.; Said, Ayman H. Journal of Synchrotron Radiation, Vol. 20, Issue 1 https://doi.org/10.1107/S0909049512043154	journal	November 2012
High-quality quartz single crystals for high-energy-resolution inelastic X-ray scattering analyzers Hönnicke, Marcelo Goncalves; Huang, Xianrong; Cusatis, Cesar Journal of Applied Crystallography, Vol. 46, Issue 4 https://doi.org/10.1107/S0021889813004731	journal	June 2013
LauePt , a graphical-user-interface program for simulating and analyzing white-beam X-ray diffraction Laue patterns Huang, X. R. Journal of Applied Crystallography, Vol. 43, Issue 4 https://doi.org/10.1107/S0021889810015013	journal	May 2010
Continuous X-ray multiple-beam diffraction with primary Bragg angle from 0 to 90° Huang, Xian-Rong; Jia, Quanjie; Wieczorek, Michael Journal of Applied Crystallography, Vol. 47, Issue 5 https://doi.org/10.1107/S160057671401930X	journal	September 2014
Inelastic X-ray scattering with 0.75 meV resolution at 25.7 keV using a temperature-gradient analyzer Ishikawa, Daisuke; Ellis, David S.; Uchiyama, Hiroshi Journal of Synchrotron Radiation, Vol. 22, Issue 1 https://doi.org/10.1107/S1600577514021006	journal	January 2015
Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K -edge Ketenoglu, Didem; Harder, Manuel; Klementiev, Konstantin Journal of Synchrotron Radiation, Vol. 22, Issue 4 https://doi.org/10.1107/S1600577515009686	journal	June 2015
Refinement of the crystal structure of low-quartz Le Page, Y.; Donnay, G. Acta Crystallographica Section B Structural Crystallography and Crystal Chemistry, Vol. 32, Issue 8 https://doi.org/10.1107/S0567740876007966	journal	August 1976
An inelastic X-ray spectrometer with 2.2meV energy resolution Sinn, H.; Alp, E. E.; Alatas, A. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 467-468 https://doi.org/10.1016/S0168-9002(01)00755-0	journal	July 2001
Multiple-beam x-ray diffraction near exact backscattering in silicon Sutter, John P.; Alp, E. Ercan; Hu, Michael Y. Physical Review B, Vol. 63, Issue 9 https://doi.org/10.1103/PhysRevB.63.094111	journal	January 2001
Nearly perfect large-area quartz: 4 meV resolution for 10 keV photons over 10 cm ² Sutter, John P.; Baron, Alfred Q. R.; Miwa, Daigo Journal of Synchrotron Radiation, Vol. 13, Issue 3 https://doi.org/10.1107/S0909049506003888	journal	April 2006
Excitonic quasiparticles in a spin-orbit Mott insulator Kim, Jungho; Daghofer, M.; Said, A. H. arXiv https://doi.org/10.48550/arxiv.1408.0804	text	January 2014

Cited By (5)

X-ray back-diffraction: can we further increase the energy resolution by tuning the energy slightly below that of exact backscattering? Hönnicke, Marcelo Goncalves; Cusatis, Cesar; Conley, Raymond Journal of Applied Crystallography, Vol. 52, Issue 6 https://doi.org/10.1107/s1600576719012925	journal	October 2019
Confusion over the description of the quartz structure yet again Glazer, A. M. Journal of Applied Crystallography, Vol. 51, Issue 3 https://doi.org/10.1107/s160057671800434x	journal	April 2018
Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications. Corrigendum Huang, Xian-Rong; Gog, Thomas; Kim, Jungho Journal of Applied Crystallography, Vol. 51, Issue 3 https://doi.org/10.1107/s1600576718004363	journal	April 2018
On evaluating x-ray imaging crystals with synchrotron radiation Pereira, N. R.; Macrander, A. T.; Stoeckl, C. Review of Scientific Instruments, Vol. 89, Issue 10 https://doi.org/10.1063/1.5045569	journal	October 2018
Modeling of energy-dispersive X-ray diffraction for high-symmetry crystal orientation Dragoi, Danut; Dragoi, Alexandru Acta Crystallographica Section A Foundations and Advances, Vol. 75, Issue 1 https://doi.org/10.1107/s2053273318013864	journal	January 2019