Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis

Journal Article · 04 October 2017 · Scripta Materialia

DOI: https://doi.org/10.1016/j.scriptamat.2017.09.043 · OSTI ID:1421953

Zhang, C.  ^[1]; Balachandran, S. ^[1]; Eisenlohr, P. ^[1]; Crimp, M. A. ^[1]; Boehlert, C. ^[1]; Xu, R. ^[2]; Bieler, T. R. ^[1]

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1. Michigan State Univ., East Lansing, MI (United States)
2. Argonne National Lab. (ANL), Argonne, IL (United States)

The subsurface dislocation content in a Ti-5Al-2.5Sn (wt%) uniaxial tension sample deformed at ambient temperature was characterized by peak streak analysis of micro-Laue diffraction patterns collected non-destructively by differential aperture X-raymicroscopy, and with focused ion beam transmission electron microscopy of material in the same volume. This comparison reveals that micro-Laue diffraction streak analysis based on an edge dislocation assumption can accurately identify the dominant dislocation slip system history (Burgers vector and plane observed by TEM), despite the fact that dislocations have predominantly screw character. As a result, other dislocations identified by TEM were not convincingly discernible from the peak streak analysis.

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL (United States); Michigan State Univ., East Lansing, MI (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES); National Science Foundation (NSF)
• Grant/Contract Number: AC02-06CH11357; FG02-09ER46637; SC0001525
• OSTI ID: 1421953
• Alternate ID(s): OSTI ID: 1549228; OSTI ID: 1595228
• Journal Information: Scripta Materialia, Vol. 144, Issue C; ISSN 1359-6462
• Publisher: ElsevierCopyright Statement
• Country of Publication: United States
• Language: English