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Title: Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis

The subsurface dislocation content in a Ti-5Al-2.5Sn (wt%) uniaxial tension sample deformed at ambient temperature was characterized by peak streak analysis of micro-Laue diffraction patterns collected non-destructively by differential aperture X-raymicroscopy, and with focused ion beam transmission electron microscopy of material in the same volume. This comparison reveals that micro-Laue diffraction streak analysis based on an edge dislocation assumption can accurately identify the dominant dislocation slip system history (Burgers vector and plane observed by TEM), despite the fact that dislocations have predominantly screw character. As a result, other dislocations identified by TEM were not convincingly discernible from the peak streak analysis.
Authors:
ORCiD logo [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [2] ;  [1]
  1. Michigan State Univ., East Lansing, MI (United States)
  2. Argonne National Lab. (ANL), Argonne, IL (United States)
Publication Date:
Grant/Contract Number:
AC02-06CH11357
Type:
Accepted Manuscript
Journal Name:
Scripta Materialia
Additional Journal Information:
Journal Volume: 144; Journal Issue: C; Journal ID: ISSN 1359-6462
Publisher:
Elsevier
Research Org:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); National Science Foundation (NSF)
Country of Publication:
United States
Language:
English
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; differential aperture X-ray microscopy (DAXM); geometrically necessary dislocations (GNDs)
OSTI Identifier:
1421953

Zhang, C., Balachandran, S., Eisenlohr, P., Crimp, M. A., Boehlert, C., Xu, R., and Bieler, T. R.. Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis. United States: N. p., Web. doi:10.1016/j.scriptamat.2017.09.043.
Zhang, C., Balachandran, S., Eisenlohr, P., Crimp, M. A., Boehlert, C., Xu, R., & Bieler, T. R.. Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis. United States. doi:10.1016/j.scriptamat.2017.09.043.
Zhang, C., Balachandran, S., Eisenlohr, P., Crimp, M. A., Boehlert, C., Xu, R., and Bieler, T. R.. 2017. "Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis". United States. doi:10.1016/j.scriptamat.2017.09.043. https://www.osti.gov/servlets/purl/1421953.
@article{osti_1421953,
title = {Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis},
author = {Zhang, C. and Balachandran, S. and Eisenlohr, P. and Crimp, M. A. and Boehlert, C. and Xu, R. and Bieler, T. R.},
abstractNote = {The subsurface dislocation content in a Ti-5Al-2.5Sn (wt%) uniaxial tension sample deformed at ambient temperature was characterized by peak streak analysis of micro-Laue diffraction patterns collected non-destructively by differential aperture X-raymicroscopy, and with focused ion beam transmission electron microscopy of material in the same volume. This comparison reveals that micro-Laue diffraction streak analysis based on an edge dislocation assumption can accurately identify the dominant dislocation slip system history (Burgers vector and plane observed by TEM), despite the fact that dislocations have predominantly screw character. As a result, other dislocations identified by TEM were not convincingly discernible from the peak streak analysis.},
doi = {10.1016/j.scriptamat.2017.09.043},
journal = {Scripta Materialia},
number = C,
volume = 144,
place = {United States},
year = {2017},
month = {10}
}