Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis
Abstract
The subsurface dislocation content in a Ti-5Al-2.5Sn (wt%) uniaxial tension sample deformed at ambient temperature was characterized by peak streak analysis of micro-Laue diffraction patterns collected non-destructively by differential aperture X-raymicroscopy, and with focused ion beam transmission electron microscopy of material in the same volume. This comparison reveals that micro-Laue diffraction streak analysis based on an edge dislocation assumption can accurately identify the dominant dislocation slip system history (Burgers vector and plane observed by TEM), despite the fact that dislocations have predominantly screw character. As a result, other dislocations identified by TEM were not convincingly discernible from the peak streak analysis.
- Authors:
-
- Michigan State Univ., East Lansing, MI (United States)
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Publication Date:
- Research Org.:
- Argonne National Lab. (ANL), Argonne, IL (United States); Michigan State Univ., East Lansing, MI (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); National Science Foundation (NSF)
- OSTI Identifier:
- 1421953
- Alternate Identifier(s):
- OSTI ID: 1549228; OSTI ID: 1595228
- Grant/Contract Number:
- AC02-06CH11357; FG02-09ER46637; SC0001525
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Scripta Materialia
- Additional Journal Information:
- Journal Volume: 144; Journal Issue: C; Journal ID: ISSN 1359-6462
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; differential aperture X-ray microscopy (DAXM); geometrically necessary dislocations (GNDs)
Citation Formats
Zhang, C., Balachandran, S., Eisenlohr, P., Crimp, M. A., Boehlert, C., Xu, R., and Bieler, T. R. Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis. United States: N. p., 2017.
Web. doi:10.1016/j.scriptamat.2017.09.043.
Zhang, C., Balachandran, S., Eisenlohr, P., Crimp, M. A., Boehlert, C., Xu, R., & Bieler, T. R. Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis. United States. https://doi.org/10.1016/j.scriptamat.2017.09.043
Zhang, C., Balachandran, S., Eisenlohr, P., Crimp, M. A., Boehlert, C., Xu, R., and Bieler, T. R. Wed .
"Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis". United States. https://doi.org/10.1016/j.scriptamat.2017.09.043. https://www.osti.gov/servlets/purl/1421953.
@article{osti_1421953,
title = {Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis},
author = {Zhang, C. and Balachandran, S. and Eisenlohr, P. and Crimp, M. A. and Boehlert, C. and Xu, R. and Bieler, T. R.},
abstractNote = {The subsurface dislocation content in a Ti-5Al-2.5Sn (wt%) uniaxial tension sample deformed at ambient temperature was characterized by peak streak analysis of micro-Laue diffraction patterns collected non-destructively by differential aperture X-raymicroscopy, and with focused ion beam transmission electron microscopy of material in the same volume. This comparison reveals that micro-Laue diffraction streak analysis based on an edge dislocation assumption can accurately identify the dominant dislocation slip system history (Burgers vector and plane observed by TEM), despite the fact that dislocations have predominantly screw character. As a result, other dislocations identified by TEM were not convincingly discernible from the peak streak analysis.},
doi = {10.1016/j.scriptamat.2017.09.043},
journal = {Scripta Materialia},
number = C,
volume = 144,
place = {United States},
year = {2017},
month = {10}
}