Direct depth distribution measurement of deuterium in bulk tungsten exposed to high-flux plasma
Abstract
Understanding tritium retention and permeation in plasma-facing components is critical for fusion safety and fuel cycle control. Glow discharge optical emission spectroscopy (GD-OES) is shown to be an effective tool to reveal the depth profile of deuterium in tungsten. Results confirm the detection of deuterium. Furthermore, a ~46 µm depth profile revealed that the deuterium content decreased precipitously in the first 7 µm, and detectable amounts were observed to depths in excess of 20 µm. The large probing depth of GD-OES (up to 100s of µm) enables studies not previously accessible to the more conventional techniques for investigating deuterium retention. Of particular applicability is the use of GD-OES to measure the depth profile for experiments where high diffusion is expected: deuterium retention in neutron irradiated materials, and ultra-high deuterium fluences in burning plasma environment.
- Authors:
-
- Fusion Safety Program, Idaho National Laboratory, Idaho Falls, Idaho 83415, USA
- Publication Date:
- Research Org.:
- Idaho National Lab. (INL), Idaho Falls, ID (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Fusion Energy Sciences (FES)
- OSTI Identifier:
- 1372955
- Alternate Identifier(s):
- OSTI ID: 1360916; OSTI ID: 1421267
- Report Number(s):
- INL/JOU-17-41539
Journal ID: ISSN 2158-3226; AAIDBI; 10.1063/1.4983384
- Grant/Contract Number:
- AC07-05ID14517
- Resource Type:
- Published Article
- Journal Name:
- AIP Advances
- Additional Journal Information:
- Journal Name: AIP Advances Journal Volume: 7 Journal Issue: 5; Journal ID: ISSN 2158-3226
- Publisher:
- American Institute of Physics
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; depth profile; deuterium; glow discharge optical emission spectroscopy; tungsten
Citation Formats
Taylor, C. N., and Shimada, M. Direct depth distribution measurement of deuterium in bulk tungsten exposed to high-flux plasma. United States: N. p., 2017.
Web. doi:10.1063/1.4983384.
Taylor, C. N., & Shimada, M. Direct depth distribution measurement of deuterium in bulk tungsten exposed to high-flux plasma. United States. https://doi.org/10.1063/1.4983384
Taylor, C. N., and Shimada, M. Mon .
"Direct depth distribution measurement of deuterium in bulk tungsten exposed to high-flux plasma". United States. https://doi.org/10.1063/1.4983384.
@article{osti_1372955,
title = {Direct depth distribution measurement of deuterium in bulk tungsten exposed to high-flux plasma},
author = {Taylor, C. N. and Shimada, M.},
abstractNote = {Understanding tritium retention and permeation in plasma-facing components is critical for fusion safety and fuel cycle control. Glow discharge optical emission spectroscopy (GD-OES) is shown to be an effective tool to reveal the depth profile of deuterium in tungsten. Results confirm the detection of deuterium. Furthermore, a ~46 µm depth profile revealed that the deuterium content decreased precipitously in the first 7 µm, and detectable amounts were observed to depths in excess of 20 µm. The large probing depth of GD-OES (up to 100s of µm) enables studies not previously accessible to the more conventional techniques for investigating deuterium retention. Of particular applicability is the use of GD-OES to measure the depth profile for experiments where high diffusion is expected: deuterium retention in neutron irradiated materials, and ultra-high deuterium fluences in burning plasma environment.},
doi = {10.1063/1.4983384},
journal = {AIP Advances},
number = 5,
volume = 7,
place = {United States},
year = {Mon May 08 00:00:00 EDT 2017},
month = {Mon May 08 00:00:00 EDT 2017}
}
https://doi.org/10.1063/1.4983384
Web of Science
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Works referencing / citing this record:
Remote in situ laser-induced breakdown spectroscopic approach for diagnosis of the plasma facing components on experimental advanced superconducting tokamak
journal, July 2018
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Novel method for determination of tritium depth profiles in metallic samples
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