DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Radiative and interfacial recombination in CdTe heterostructures

Abstract

Double heterostructures (DH) were produced consisting of a CdTe film between two wide band gap barriers of CdMgTe alloy. A combined method was developed to quantify radiative and non-radiative recombination rates by examining the dependence of photoluminescence (PL) on both excitation intensity and time. The measured PL characteristics, and the interface state density extracted by modeling, indicate that the radiative efficiency of CdMgTe/CdTe DHs is comparable to that of AlGaAs/GaAs DHs, with interface state densities in the low 1010 cm−2 and carrier lifetimes as long as 240 ns. The radiative recombination coefficient of CdTe is found to be near 10−10 cm3s−1. CdTe film growth on bulk CdTe substrates resulted in a homoepitaxial interface layer with a high non-radiative recombination rate.

Authors:
; ; ; ; ; ; ; ORCiD logo; ORCiD logo;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1420708
Grant/Contract Number:  
DEAC36-08GO28308
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Name: Applied Physics Letters Journal Volume: 105 Journal Issue: 22; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Swartz, C. H., Edirisooriya, M., LeBlanc, E. G., Noriega, O. C., Jayathilaka, P. A. R. D., Ogedengbe, O. S., Hancock, B. L., Holtz, M., Myers, T. H., and Zaunbrecher, K. N. Radiative and interfacial recombination in CdTe heterostructures. United States: N. p., 2014. Web. doi:10.1063/1.4902926.
Swartz, C. H., Edirisooriya, M., LeBlanc, E. G., Noriega, O. C., Jayathilaka, P. A. R. D., Ogedengbe, O. S., Hancock, B. L., Holtz, M., Myers, T. H., & Zaunbrecher, K. N. Radiative and interfacial recombination in CdTe heterostructures. United States. https://doi.org/10.1063/1.4902926
Swartz, C. H., Edirisooriya, M., LeBlanc, E. G., Noriega, O. C., Jayathilaka, P. A. R. D., Ogedengbe, O. S., Hancock, B. L., Holtz, M., Myers, T. H., and Zaunbrecher, K. N. Tue . "Radiative and interfacial recombination in CdTe heterostructures". United States. https://doi.org/10.1063/1.4902926.
@article{osti_1420708,
title = {Radiative and interfacial recombination in CdTe heterostructures},
author = {Swartz, C. H. and Edirisooriya, M. and LeBlanc, E. G. and Noriega, O. C. and Jayathilaka, P. A. R. D. and Ogedengbe, O. S. and Hancock, B. L. and Holtz, M. and Myers, T. H. and Zaunbrecher, K. N.},
abstractNote = {Double heterostructures (DH) were produced consisting of a CdTe film between two wide band gap barriers of CdMgTe alloy. A combined method was developed to quantify radiative and non-radiative recombination rates by examining the dependence of photoluminescence (PL) on both excitation intensity and time. The measured PL characteristics, and the interface state density extracted by modeling, indicate that the radiative efficiency of CdMgTe/CdTe DHs is comparable to that of AlGaAs/GaAs DHs, with interface state densities in the low 1010 cm−2 and carrier lifetimes as long as 240 ns. The radiative recombination coefficient of CdTe is found to be near 10−10 cm3s−1. CdTe film growth on bulk CdTe substrates resulted in a homoepitaxial interface layer with a high non-radiative recombination rate.},
doi = {10.1063/1.4902926},
journal = {Applied Physics Letters},
number = 22,
volume = 105,
place = {United States},
year = {Tue Dec 02 00:00:00 EST 2014},
month = {Tue Dec 02 00:00:00 EST 2014}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1063/1.4902926

Citation Metrics:
Cited by: 43 works
Citation information provided by
Web of Science

Save / Share:

Works referenced in this record:

Spatial uniformity of minority‐carrier lifetime in polycrystalline CdTe solar cells
journal, May 1994

  • Ahrenkiel, R. K.; Keyes, B. M.; Levi, D. L.
  • Applied Physics Letters, Vol. 64, Issue 21
  • DOI: 10.1063/1.111402

Growth of Lattice-Matched ZnTeSe Alloys on (100) and (211)B GaSb
journal, March 2012


Picosecond photoconductivity of CdSe and CdTe thin films
journal, April 1990


Strategies to increase CdTe solar-cell voltage
journal, May 2007


Computer Analysis of Surface Recombination Process at Si and Compound Semiconductor Surfaces and Behavior of Surface Recombination Velocity
journal, March 1998

  • Adamowicz, Boguslawa; Hasegawa, Hideki
  • Japanese Journal of Applied Physics, Vol. 37, Issue Part 1, No. 3B
  • DOI: 10.1143/JJAP.37.1631

Methodology for Development of High-κ Stacked Gate Dielectrics on III–V Semiconductors
book, January 2005


Recombination velocity at oxide–GaAs interfaces fabricated by in situ molecular beam epitaxy
journal, June 1996

  • Passlack, M.; Hong, M.; Mannaerts, J. P.
  • Applied Physics Letters, Vol. 68, Issue 25
  • DOI: 10.1063/1.116652

Efficiency limitations for wide-band-gap chalcopyrite solar cells
journal, June 2005


Impact of illumination level and oxide parameters on Shockley–Read–Hall recombination at the Si‐SiO 2 interface
journal, May 1992

  • Aberle, Armin G.; Glunz, Stefan; Warta, Wilhelm
  • Journal of Applied Physics, Vol. 71, Issue 9
  • DOI: 10.1063/1.350782

Determination and improvement of spontaneous emission quantum efficiency in GaAs/AlGaAs heterostructures grown by molecular beam epitaxy
journal, August 2007

  • Wang, J. -B.; Ding, D.; Johnson, S. R.
  • physica status solidi (b), Vol. 244, Issue 8
  • DOI: 10.1002/pssb.200675612

Optical measurement system for characterizing compound semiconductor interface and surface states
journal, January 1998

  • Passlack, M.; Legge, R. N.; Convey, D.
  • IEEE Transactions on Instrumentation and Measurement, Vol. 47, Issue 5
  • DOI: 10.1109/19.746611

Photon-Radiative Recombination of Electrons and Holes in Germanium
journal, June 1954


Unusually low surface recombination and long bulk lifetime in n -CdTe single crystals
journal, September 1998

  • Cohen, R.; Lyahovitskaya, V.; Poles, E.
  • Applied Physics Letters, Vol. 73, Issue 10
  • DOI: 10.1063/1.122169

Growth, steady-state, and time-resolved photoluminescence study of CdTe/MgCdTe double heterostructures on InSb substrates using molecular beam epitaxy
journal, November 2013

  • DiNezza, Michael J.; Zhao, Xin-Hao; Liu, Shi
  • Applied Physics Letters, Vol. 103, Issue 19
  • DOI: 10.1063/1.4828984

Electrodeposited CdTe—optical properties
journal, June 1997

  • Rakhshani, A. E.
  • Journal of Applied Physics, Vol. 81, Issue 12
  • DOI: 10.1063/1.365402

Statistics of the Recombinations of Holes and Electrons
journal, September 1952


Calculation of band offsets in Cd1−xXxTe alloys, X=Zn, Mg, Hg and Mn and magnetic effects in CdMnTe
journal, July 2011


Time-resolved and excitation-dependent photoluminescence study of CdTe/MgCdTe double heterostructures grown by molecular beam epitaxy
journal, July 2014

  • Zhao, Xin-Hao; DiNezza, Michael J.; Liu, Shi
  • Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Vol. 32, Issue 4
  • DOI: 10.1116/1.4878317

Relaxation of stresses in CdTe layers grown by molecular beam epitaxy
journal, April 1987

  • Fontaine, C.; Gailliard, J. P.; Magli, S.
  • Applied Physics Letters, Vol. 50, Issue 14
  • DOI: 10.1063/1.98261

Growth of MgTe and Cd1−xMgxTe thin films by molecular beam epitaxy
journal, August 1993


Evaluation of the Concentration of Deep Levels in Semi-Insulating CdTe by Photoconductivity and TEES
journal, August 2009

  • Kubat, Jan; Elhadidy, Hassan; Franc, Jan
  • IEEE Transactions on Nuclear Science, Vol. 56, Issue 4
  • DOI: 10.1109/TNS.2009.2022162

Spectroscopic ellipsometry characterization of HfxSiyOz films using the Cody–Lorentz parameterized model
journal, September 2004

  • Price, J.; Hung, P. Y.; Rhoad, T.
  • Applied Physics Letters, Vol. 85, Issue 10
  • DOI: 10.1063/1.1784889

Probing carrier lifetimes at dislocations in epitaxial CdTe
journal, May 2014

  • Alberi, Kirstin; Fluegel, Brian; DiNezza, Michael J.
  • Applied Physics Express, Vol. 7, Issue 6
  • DOI: 10.7567/APEX.7.065503

The temperature dependence of the optical properties of thin CdTe films
journal, June 1988


Determination of Bulk Lifetime and Surface Recombination Velocity of Silicon Ingots From Dynamic Photoluminescence
journal, October 2013

  • Giesecke, Johannes A.; Sinton, Ronald A.; Schubert, Martin C.
  • IEEE Journal of Photovoltaics, Vol. 3, Issue 4
  • DOI: 10.1109/JPHOTOV.2013.2264622

Improved light extraction from emitters in high refractive index materials using solid immersion lenses
journal, July 2002

  • Zwiller, Valéry; Björk, Gunnar
  • Journal of Applied Physics, Vol. 92, Issue 2
  • DOI: 10.1063/1.1487913

Auger recombination in direct-gap semiconductors: band-structure effects
journal, July 1983


Comment on G.J. Rees “surface recombination velocity—a useful concept?”
journal, November 1986


Lifetime spectroscopy for defect characterization: Systematic analysis of the possibilities and restrictions
journal, February 2002

  • Rein, S.; Rehrl, T.; Warta, W.
  • Journal of Applied Physics, Vol. 91, Issue 4
  • DOI: 10.1063/1.1428095