Origin of thickness dependence of structural phase transition temperatures in highly strained BiFeO 3 thin films

Yang, Yongsoo; Beekman, Christianne; Siemons, Wolter; Schlepütz, Christian M.; Senabulya, Nancy; Clarke, Roy; Christen, Hans M.

doi:10.1063/1.4944749

Title: Origin of thickness dependence of structural phase transition temperatures in highly strained BiFeO ₃ thin films

Abstract

Two structural phase transitions are investigated in highly strained BiFeO3 thin films as a function of film thickness and temperature via synchrotron x-ray diffraction. Both transition temperatures (upon heating: monoclinic MC to monoclinic MA to tetragonal) decrease as the film becomes thinner. A film-substrate interface layer, evidenced by half-order peaks, contributes to this behavior, but at larger thicknesses (above a few nanometers), the temperature dependence results from electrostatic considerations akin to size effects in ferroelectric phase transitions, but observed here for structural phase transitions within the ferroelectric phase. For ultra-thin films, the tetragonal structure is stable to low temperatures. C 2016 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).

Authors:: Yang, Yongsoo; Beekman, Christianne; Siemons, Wolter; Schlepütz, Christian M.; Senabulya, Nancy; Clarke, Roy; Christen, Hans M.

Publication Date:: Tue Mar 01 00:00:00 EST 2016

Research Org.:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

OSTI Identifier:: 1244129

Alternate Identifier(s):: OSTI ID: 1247948; OSTI ID: 1339283; OSTI ID: 1420554

Grant/Contract Number:: AC02-06CH11357; FG02-06ER46273; AC05-00OR22725

Resource Type:: Published Article

Journal Name:: APL Materials

Additional Journal Information:: Journal Name: APL Materials Journal Volume: 4 Journal Issue: 3; Journal ID: ISSN 2166-532X

Publisher:: American Institute of Physics

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE; ferroelectric phase transitions; ferroelectric thin films; interface structure; thin film growth; Curie point; Ferroelectric phase transistions

Citation Formats


                    Yang, Yongsoo, Beekman, Christianne, Siemons, Wolter, Schlepütz, Christian M., Senabulya, Nancy, Clarke, Roy, and Christen, Hans M. Origin of thickness dependence of structural phase transition temperatures in highly strained BiFeO 3 thin films.  United States: N. p., 2016. 
Web.  doi:10.1063/1.4944749.

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                    Yang, Yongsoo, Beekman, Christianne, Siemons, Wolter, Schlepütz, Christian M., Senabulya, Nancy, Clarke, Roy, & Christen, Hans M. Origin of thickness dependence of structural phase transition temperatures in highly strained BiFeO 3 thin films.  United States.  https://doi.org/10.1063/1.4944749

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                    Yang, Yongsoo, Beekman, Christianne, Siemons, Wolter, Schlepütz, Christian M., Senabulya, Nancy, Clarke, Roy, and Christen, Hans M. Tue .  
"Origin of thickness dependence of structural phase transition temperatures in highly strained BiFeO 3 thin films".  United States.  https://doi.org/10.1063/1.4944749.

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@article{osti_1244129,

  title        = {Origin of thickness dependence of structural phase transition temperatures in highly strained BiFeO 3 thin films},

  author       = {Yang, Yongsoo and Beekman, Christianne and Siemons, Wolter and Schlepütz, Christian M. and Senabulya, Nancy and Clarke, Roy and Christen, Hans M.},

  abstractNote = {Two structural phase transitions are investigated in highly strained BiFeO3 thin films as a function of film thickness and temperature via synchrotron x-ray diffraction. Both transition temperatures (upon heating: monoclinic MC to monoclinic MA to tetragonal) decrease as the film becomes thinner. A film-substrate interface layer, evidenced by half-order peaks, contributes to this behavior, but at larger thicknesses (above a few nanometers), the temperature dependence results from electrostatic considerations akin to size effects in ferroelectric phase transitions, but observed here for structural phase transitions within the ferroelectric phase. For ultra-thin films, the tetragonal structure is stable to low temperatures. C 2016 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).},

  doi          = {10.1063/1.4944749},

  journal      = {APL Materials},

  number       = 3,

  volume       = 4,

  place        = {United States},

  year         = {Tue Mar 01 00:00:00 EST 2016},

  month        = {Tue Mar 01 00:00:00 EST 2016}

}

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Title: Origin of thickness dependence of structural phase transition temperatures in highly strained BiFeO 3 thin films

Abstract

Citation Formats

Size effects in nanostructured ferroelectrics journal, April 1996

Dimension and Size Effects in Ferroelectrics journal, August 1997

Landau theory of second-order phase transitions in ferroelectric films journal, March 2001

X-Ray Diffraction Measurement of the Effect of Layer Thickness on the Ferroelectric Transition in Epitaxial KTaO 3 / KNbO 3 Multilayers journal, May 1998

Landau theory of phase transitions in thick films journal, February 1984

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Surface effects on phase transitions in ferroelectrics and dipolar magnets journal, August 1979

Nanoferroelectrics: statics and dynamics journal, April 2006

Long-range ferroelectric interactions in KTaO3/KNbO3 superlattice structures journal, May 1998

Landau theory of the size-driven phase transition in ferroelectrics journal, September 1995

Misfit strain and misfit dislocations in lattice mismatched epitaxial layers and other systems journal, June 1997

Strain gradients in epitaxial ferroelectrics journal, July 2005

Thickness-dependent structural phase transition of strained SrRuO 3 ultrathin films: The role of octahedral tilt journal, September 2011

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Untilting BiFeO 3 : The influence of substrate boundary conditions in ultra-thin BiFeO 3 on SrTiO 3 journal, November 2013

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Phase Transitions, Phase Coexistence, and Piezoelectric Switching Behavior in Highly Strained BiFeO 3 Films journal, July 2013

Stress-induced R − M A − M C − T symmetry changes in BiFeO 3 films journal, April 2011

Temperature-Driven Structural Phase Transition in Tetragonal-Like BiFeO$_{3}$ journal, August 2011

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Evidence for Room-Temperature Multiferroicity in a Compound with a Giant Axial Ratio journal, May 2009

Low-Symmetry Monoclinic Phases and Polarization Rotation Path Mediated by Epitaxial Strain in Multiferroic BiFeO3 Thin Films journal, November 2010

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Thickness-dependent evolutions of domain configuration and size in ferroelectric and ferroelectric-ferroelastic films journal, March 2013

Domain Structure of Rochelle Salt and K H 2 P O 4 journal, April 1953

Phase diagram and domain splitting in thin ferroelectric films with incommensurate phase journal, May 2010

Observation of Nanoscale 180 ° Stripe Domains in Ferroelectric P b T i O 3 Thin Films journal, July 2002

Surface and size effects on ferroelectric films with domain structures journal, February 1995

Thickness dependence of in-plane dielectric and ferroelectric properties of Ba0.7Sr0.3TiO3 thin films epitaxially grown on LaAlO3 journal, March 2007

Ferroelectricity in Ultrathin Perovskite Films journal, June 2004

Microscopic Origin of the Giant Ferroelectric Polarization in Tetragonal-like BiFeO 3 journal, September 2011

Control of octahedral connectivity in perovskite oxide heterostructures: An emerging route to multifunctional materials discovery journal, March 2012

Thin Films: Understanding Strain-Induced Phase Transformations in BiFeO 3 Thin Films (Adv. Sci. 8/2015) journal, August 2015

Atomic structure and microstructures of supertetragonal multiferroic BiFeO 3 thin films journal, March 2014

Atomic-Scale Visualization of Polarization Pinning and Relaxation at Coherent BiFeO 3 /LaAlO 3 Interfaces journal, July 2013

Simple ways of determining perovskite structures journal, November 1975

Title: Origin of thickness dependence of structural phase transition temperatures in highly strained BiFeO ₃ thin films

Size effects in nanostructured ferroelectrics
journal, April 1996

Dimension and Size Effects in Ferroelectrics
journal, August 1997

Landau theory of second-order phase transitions in ferroelectric films
journal, March 2001

X-Ray Diffraction Measurement of the Effect of Layer Thickness on the Ferroelectric Transition in Epitaxial ${KTaO}_{3} / {KNbO}_{3}$ Multilayers
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Physics of thin-film ferroelectric oxides
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Surface effects on phase transitions in ferroelectrics and dipolar magnets
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Nanoferroelectrics: statics and dynamics
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Long-range ferroelectric interactions in KTaO3/KNbO3 superlattice structures
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Landau theory of the size-driven phase transition in ferroelectrics
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Misfit strain and misfit dislocations in lattice mismatched epitaxial layers and other systems
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Strain gradients in epitaxial ferroelectrics
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Thickness-dependent structural phase transition of strained SrRuO $_{3}$ ultrathin films: The role of octahedral tilt
journal, September 2011

Control of Octahedral Tilts and Magnetic Properties of Perovskite Oxide Heterostructures by Substrate Symmetry
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Untilting BiFeO ₃ : The influence of substrate boundary conditions in ultra-thin BiFeO ₃ on SrTiO ₃
journal, November 2013

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Strain dependence of transition temperatures and structural symmetry of BiFeO ₃ within the tetragonal-like structure
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A complete strain–temperature phase diagram for BiFeO ₃ films on SrTiO ₃ and LaAlO ₃ (0 0 1) substrates
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Stress-induced $R - M_{A} - M_{C} - T$ symmetry changes in BiFeO $_{3}$ films
journal, April 2011

Temperature-Driven Structural Phase Transition in Tetragonal-Like BiFeO$_{3}$
journal, August 2011

Structural Characterization of BiFeO ₃ Thin Films by Reciprocal Space Mapping
journal, September 2006

Unit cell orientation of tetragonal-like BiFeO ₃ thin films grown on highly miscut LaAlO ₃ substrates
journal, June 2013

Evidence for Room-Temperature Multiferroicity in a Compound with a Giant Axial Ratio
journal, May 2009

Low-Symmetry Monoclinic Phases and Polarization Rotation Path Mediated by Epitaxial Strain in Multiferroic BiFeO3 Thin Films
journal, November 2010

Size effects of static and dynamic polarization in ferroelectric thin film multilayers
journal, January 2001

Thickness-dependent evolutions of domain configuration and size in ferroelectric and ferroelectric-ferroelastic films
journal, March 2013

Domain Structure of Rochelle Salt and K $H_{2}$ P $O_{4}$
journal, April 1953

Phase diagram and domain splitting in thin ferroelectric films with incommensurate phase
journal, May 2010

Observation of Nanoscale $180 °$ Stripe Domains in Ferroelectric ${P b T i O}_{3}$ Thin Films
journal, July 2002

Surface and size effects on ferroelectric films with domain structures
journal, February 1995

Thickness dependence of in-plane dielectric and ferroelectric properties of Ba0.7Sr0.3TiO3 thin films epitaxially grown on LaAlO3
journal, March 2007

Ferroelectricity in Ultrathin Perovskite Films
journal, June 2004

Microscopic Origin of the Giant Ferroelectric Polarization in Tetragonal-like ${BiFeO}_{3}$
journal, September 2011

Control of octahedral connectivity in perovskite oxide heterostructures: An emerging route to multifunctional materials discovery
journal, March 2012

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journal, August 2015

Atomic structure and microstructures of supertetragonal multiferroic ${BiFeO}_{3}$ thin films
journal, March 2014

Atomic-Scale Visualization of Polarization Pinning and Relaxation at Coherent BiFeO ₃ /LaAlO ₃ Interfaces
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