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This content will become publicly available on February 9, 2019

Title: Note: Narrow x-ray reflections are easier to locate with sandpaper

Authors:
ORCiD logo [1] ;  [2]
  1. Ecopulse, Inc., 7844 Vervain Ct, Springfield, Virginia 22152, USA
  2. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA
Publication Date:
Grant/Contract Number:
AC02- 06CH11357
Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 89; Journal Issue: 2; Related Information: CHORUS Timestamp: 2018-02-09 11:18:58; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1420019