Note: Narrow x-ray reflections are easier to locate with sandpaper

Pereira, N. R.; Macrander, A. T.

doi:10.1063/1.5019463

Title: Note: Narrow x-ray reflections are easier to locate with sandpaper

Abstract

Here, synchrotrons can provide almost perfectly unidirectional and monochromatic x-rays. Such x-rays reflect from ideal crystals only over a minute part of the angular range that must be searched for the reflection. Spoiling the incoming x-rays' directionality with sandpaper makes it easier to find the reflection.

Authors:

^[1]; Macrander, A. T. ^[2]

Ecopulse, Inc., Springfield, VA (United States)
Argonne National Lab. (ANL), Argonne, IL (United States)

Publication Date:: Fri Feb 09 00:00:00 EST 2018

Research Org.:: Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division

OSTI Identifier:: 1464634

Alternate Identifier(s):: OSTI ID: 1420019

Grant/Contract Number:: AC02-06CH11357

Resource Type:: Accepted Manuscript

Journal Name:: Review of Scientific Instruments

Additional Journal Information:: Journal Volume: 89; Journal Issue: 2; Journal ID: ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)

Country of Publication:: United States

Language:: English

Subject:: 47 OTHER INSTRUMENTATION

Citation Formats


                    Pereira, N. R., and Macrander, A. T. Note: Narrow x-ray reflections are easier to locate with sandpaper.  United States: N. p., 2018. 
Web.  doi:10.1063/1.5019463.

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                    Pereira, N. R., & Macrander, A. T. Note: Narrow x-ray reflections are easier to locate with sandpaper.  United States.  https://doi.org/10.1063/1.5019463

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                    Pereira, N. R., and Macrander, A. T. Fri .  
"Note: Narrow x-ray reflections are easier to locate with sandpaper".  United States.  https://doi.org/10.1063/1.5019463.  https://www.osti.gov/servlets/purl/1464634.

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@article{osti_1464634,

  title        = {Note: Narrow x-ray reflections are easier to locate with sandpaper},

  author       = {Pereira, N. R. and Macrander, A. T.},

  abstractNote = {Here, synchrotrons can provide almost perfectly unidirectional and monochromatic x-rays. Such x-rays reflect from ideal crystals only over a minute part of the angular range that must be searched for the reflection. Spoiling the incoming x-rays' directionality with sandpaper makes it easier to find the reflection.},

  doi          = {10.1063/1.5019463},

  journal      = {Review of Scientific Instruments},

  number       = 2,

  volume       = 89,

  place        = {United States},

  year         = {Fri Feb 09 00:00:00 EST 2018},

  month        = {Fri Feb 09 00:00:00 EST 2018}

}

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Journal Article:

Free Publicly Available Full Text

Accepted Manuscript (Publisher)

Accepted Manuscript (DOE)

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https://doi.org/10.1063/1.5019463

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Figures / Tables:

FIG. 1. : The reflection of highly unidirectional and monochromatic 10 keV x-rays from (50$\overline{5}$2) quartz, over ≃ 400 $µ$rad of a 1000- step long search. Black dashed line without sandpaper, red solid line with x-rays passed through sandpaper. The blue bar in the middle is the estimated Darwin width.

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Works referenced in this record:

Analysis and implementation of a space resolving spherical crystal spectrometer for x-ray Thomson scattering experiments
journal, April 2015

Harding, E. C.; Ao, T.; Bailey, J. E.
Review of Scientific Instruments, Vol. 86, Issue 4
DOI: 10.1063/1.4918619

Spherical quartz crystals investigated with synchrotron radiation
journal, October 2015

Pereira, N. R.; Macrander, A. T.; Hill, K. W.
Review of Scientific Instruments, Vol. 86, Issue 10
DOI: 10.1063/1.4934197

Advanced in situ metrology for x-ray beam shaping with super precision
journal, January 2015

Wang, Hongchang; Sutter, John; Sawhney, Kawal
Optics Express, Vol. 23, Issue 2
DOI: 10.1364/oe.23.001605

Characterization of spatially resolved high resolution x-ray spectrometers for high energy density physics and light source experiments
journal, November 2014

Hill, K. W.; Bitter, M.; Delgado-Aparacio, L.
Review of Scientific Instruments, Vol. 85, Issue 11
DOI: 10.1063/1.4890260

Figures / Tables found in this record:

FIG. 1. (p. 1)

Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.

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Similar Records

Title: Note: Narrow x-ray reflections are easier to locate with sandpaper

Abstract

Citation Formats

Figures / Tables:

Analysis and implementation of a space resolving spherical crystal spectrometer for x-ray Thomson scattering experiments journal, April 2015

Spherical quartz crystals investigated with synchrotron radiation journal, October 2015

Advanced in situ metrology for x-ray beam shaping with super precision journal, January 2015

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Analysis and implementation of a space resolving spherical crystal spectrometer for x-ray Thomson scattering experiments
journal, April 2015

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journal, October 2015

Advanced in situ metrology for x-ray beam shaping with super precision
journal, January 2015

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journal, November 2014